From: Carl Barnhart
Sent: Friday, January 15, 2010 4:53 PM
Subject: RE: 1149.1 INIT Meeting Notes,
15 Jan 2010
We resumed the discussion of TLR and transition between test
sections and mission mode.
- Carol stressed that, after Power-up, the chip can be in
any state including any test or mission mode, and there must be a simple
method for getting the chip to a safe state. Discussion revealed
that everyone essentially agree with this, and that Ken’s proposals meet
- Ken explained his “Mode” state diagrams in detail (Ken
has distributed a new version annotated with today’s results.)
- Carol presented a few slides detailing her
issues. Continued discussions brought out that it would be simple to
retain the INIT_SETUP TDR values, and possibly even the results of
INIT_RUN, but if the TLR state is used between test sections, then the
mission mode circuitry again generates the data being driven off chip.
It is also not clear how to then return to a mode that can then be
used to initialize mission mode.
- Ken wants to ensure that the board cannot be put into
an unsafe state between test sections, and to not have to re-run INIT_* at
the beginning of every test section.
Members of the group remain concerned that the additional “1149.1
test ready” state is a major change to 1149.1 architecture. We will
continue the discussion in email and next week.
"The secret is to ask the right question. Then the
answer takes care of itself."
Carl F. Barnhart
Senior DFT Architect / SiliconAid Solutions
Office: 512-535-1543 / Cell: 512-608-3280