Scope
This standard defines a high speed test access port for delivery of test data, a packet format for describing the test payload and a distribution architecture for converting the test data to/from on-chip test structures.
The standard re-uses existing High Speed I/O (HSIO) known in the industry for the High-Speed Test Access Port. The HSIO connects to an on-chip distribution architecture through a common interface. The scope includes the distribution architecture test logic and packet decoder logic. The objective of the distribution architecture and packet decoder is that it can be readily re-used with different Integrated Circuits (ICs) that host different HSIO technology such that the standard addresses as large a part of the industry as possible.
The scope includes IEEE 1149.1 Boundary Scan Description Language (BSDL) and Procedural Description Language (PDL) documentation
which can be used for configuring a mission mode HSIO to a test mode compatible with the High Speed Test Access Port (HSTAP). The same BSDL and PDL can then be used to deliver high-speed data to the on-chip test structures.
Need
Test time has always been an important metric for SoCs. The original 1149.1 test access port is fine for simple board interconnect but as on-chip operations via the 1149.1 TAP have increased it becomes inefficient for board test and on-board FPGA configuration. The 1149.1 TAP has always been too slow for production SoC test. Wide TAMs ( Test Access Mechanisms) are used to increase test throughput during production at the cost of requiring more tester resources. Wide TAMs are also not useful for test re-use at board/system. A High-Speed Test Access Port and distribution matrix is needed by the industry to standardize a faster test data delivery mechanism which also can be re-used at the board level. This mechanism can transfer data for SoC test or FPGA configuration. |
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Benefits
- High-Bandwidth test data to/from IC or 3DSIC
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- Shorter test and configuration times
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- LPCT - Low Pin Count interface
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- Potential for lower scan clock rate
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- Potential for lower compressison factors
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- Simpler ATE pin electronics
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Technical Proposals and Discussion
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restricted access |
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Feb 22, 2015 |
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June 15th, 2015 |
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May 4th, 2015 |
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Feb 23th, 2015 |
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Feb 23th, 2015 |
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March 17th, 2014 |
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March 10th, 2014 |
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February 24, 2014 |
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January 27th, 2014 |
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January 13th, 2014 |
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November 25th, 2013 |
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November 11th, 2013 |
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October 14th, 2013 |
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October 7th, 2013 |
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September 23rd, 2013 |
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August 19th, 2013 |
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WG records
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High-Speed JTAG - IEEE P1149.10 Meeting Minutes
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- January 9th 2017
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- January 11th 2016
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- December 21st 2015
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- March 30th 2015
- March 9th 2015
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- December 15th 2014
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- November 3rd 2014
- October 13th 2014
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- September 22th 2014
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- September 8th 2014
- September 1st 2014 - Canceled
- August 25th 2014 - Canceled
- August 18th 2014
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- April 7th, 2014
- March 31st, 2014
- March 17th, 2014
- March 10th, 2014
- March 3rd, 2014
- February 24th, 2014
- February 17th, 2014
- February 10th, 2014
- February 3rd, 2014
- January 27th, 2014
- January 20th, 2014
- January 13th, 2014
- January 6th, 2014
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- December 16th, 2013
- December 2nd, 2013
- November 25th, 2013
- November 18th, 2013
- November 11th, 2013
- November 4th, 2013
- October 28th, 2013
- October 21st, 2013
- October 14th, 2013
- October 7th, 2013
- September 23, 2013
- September 16, 2013
- August 26, 2013
- August 19, 2013
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