P1159.1 /D1
08/31/02
Draft
Guide For Recorder and Data Acquisition Requirements For Characterization of
Power Quality Events
Sponsored by the Power Quality Committee of the IEEE PES Society
Copyright © 2002 by the Institute of Electrical and
Electronics Engineers, Inc.
345 East 47th Street
New York, NY 10017, USA
All rights reserved.
This is an unapproved draft
of a proposed IEEE Standard, subject to change. Permission is hereby granted
for IEEE Standards Committee
participants to reproduce this document for purposes of IEEE standardization
activities. If this document is to be submitted to ISO or IEC, notification
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IEEE Standards Department
Copyright
and Permissions
445
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At the time this
standard was completed, the working group had the following membership:
|
Charles Perry, Chair |
|
|
|
|
|
|
|
Richard
Bingham |
Greg Olson |
|
|
Math Bollen |
Scott Peele |
|
|
Randy Collins |
Dan Sabin |
|
|
Andrew
Dettloff |
Georges Simard |
|
|
Erich Gunther |
Timothy Unruh |
|
|
Mark Kempker |
David Vannoy |
|
|
David Kreiss |
Marek
Waclawiak |
|
|
Christopher
Melhorn |
James Wikston |
|
|
R. Larry
Morgan |
|
|
The following
persons were on the balloting committee: (To be provided by IEEE editor at time
of publication.)
__________________________________________________________________________________
Contents
2.3 Classes of measurement performance
3 Organisation of the
measurements
3.3 Electrical values to be measured
3.4 Measurement aggregation over time intervals
3.4.1 Measurement aggregation
algorithm
4 Supply voltage sag
(dip)s and swells
4.2.1 Detection and
evaluation of a voltage sag (dip)
4.2.2 Detection and evaluation
of a voltage swell
4.2.3 Calculation of a
sliding reference voltage
4.2.5 Duration measurement
uncertainty
5.2 Characteristics Duplicated Above
5.3 Waveform Envelope Based Duration
5.3.1 Overview of Envelope
Based
5.3.2 Calculation of Envelope
Based Duration
5.3.3 Reported Data of the
Waveforms based on Envelope Technique.
5.4.1 Overview of Phase Angle
Shift
5.4.2 Calculation of Zero
Crossing Method
5.4.3 Calculation of
Fundamental Phase Angle
5.4.4 Reported data of the
waveforms from Phase Shift Technique
5.5.1 Overview of Missing
Voltage
5.5.2 Calculation of Missing Voltage
and its analyses
5.5.3 Reported Data using
Missing Voltage technique
5.6.2 Calculation of
Unbalance
5.6.3 Data Reported from
Unbalance technique
5.7.1 Overview of Harmonic
RMS
5.7.2 Calculations of
Harmonic RMS
5.7.3 Data Reported from
Harmonic RMS Technique
Guide For Recorder and Data
Acquisition Requirements For Characterization of Power Quality Events
This guide establishes the
data acquisition attributes necessary to characterize the electromagnetic
phenomena.
The objective of this guide
is to describe the technical measurement requirements for each type of
disturbance defined in 24 categories of typical characteristics of power system
electromagnetic phenomena. Each
category is discussed in several standards in terms of emission limits,
severity levels, planning levels or immunity levels. The initial publication of this document covers the category of
RMS voltage variations referred to as sags or sag (dip)s.
Basically, when the signal
to measure is supplied from a perfectly stable wave-form generator, results
displayed by one instrument are very close to those obtained by others. However, when connected to the power system,
several phenomena can affect the assessment in such a way that some instruments
can measure disturbance levels which do not exist and several errors can be
added to the remaining harmonics assessed.
Some definitions given in
this section have not been fully harmonized with definitions made in other IEEE
standards and IEC documents.. Where
several definitions for the same terms exist, they are both included. Before
scheduling the power quality measurement, the user must select the instrument
which meets his needs. This section
addresses the language and the assessment specification which need to be
understood to communicate with the instrumentation manufacturer. Also, the user needs to define his need
clearly.
Without the assessment
specification of the instrument, or with an inappropriate specification, users
are unable to assess the severity level of the disturbance on equipment; this can lead to incorrect conclusions and
costly decisions. Users should ask
manufacturers for the complete measurement-instrument specification, this may include the following information:
·
sampling rate,
·
bandwidth
amplitude/frequency
·
accuracy (the
instrument should stay within the
limits 100% of the time)
·
precision (the
instrument should stay within the limits 68.27% of the time)
·
resolution
(signal-to-noise ratio or effective bits)
·
differential mode
argument and amplitude accuracy,
·
common mode rejection
·
anti-aliasing filter
(cut-off frequency, filter order, filter type)
·
window width, (interval
of the sampled signal used for each analysis)
·
number of windows analysed per second,
·
type of weighted window
used (rectangular, triangular, Blackman, Vincent, …)
·
synchronisation device used
(electronic phase lock loop or digital synchronisation),
·
accuracy of the synchronised device,
·
the common mode ratio
rejection,
·
flag when the phase
lock loop is not synchronized
·
flag when hardware or
software error occurs,
·
flag when some
frequency components present in the signal are not recorded,
·
immunity of the
instrument to disturbances in the
supply voltage (transient, voltage sag (dip)s, voltage distortion etc…),
·
operating
environment (temperature, vibration,
humidity)
Term
|
Definition |
Source |
Accuracy
|
IEC
dictionary and IEEE 100 |
|
|
|
Accuracy
is the degree of agreement between measured values and the true values (i.e.
closeness to the reality). |
|
|
Aliasing |
The
distortion caused by sampling a signal at an inappropriate rate and which
results in the overlapping of the sidebands around the harmonics of the
sampling frequency in the spectrum of the sample signal. Note.:
A high frequency which exceeds the operating range of the instrument affects
the frequency component in the frequency range of the analysis. IEC has requested use of an anti-aliasing
filter which should attenuate to below 50 dB all frequencies above the operating
range of the instrument. Observation
windows may be flagged during the presence of frequency components which
exceed the operating range of the instrument. If these high frequency components occur too often, the user
may need a wider bandwidth instrument. |
IEC
dictionary |
|
Analogue
signal |
A
signal in which the characteristic quantity representing information may, at
any instant, assume any value within a continuous interval. Note.
For example, an analogue signal may follow continuously the values of another
physical quantity representing information |
IEC
dictionary |
|
Anti-aliasing |
correction
intended to reduce the aliasing. |
IEC
dictionary |
|
Bandwidth |
The
width of a frequency band over which a given characteristic of an equipment
or transmission channel does not differ from a reference value by more than a
specified amount or ratio. Note.: the given characteristic may, for example,
be the amplitude/frequency, the phase/frequency or the delay/frequency
characteristic. The
quantitative difference between the limiting frequencies of a frequency
band. For most power quality users
should specify the bandwidth as the frequency for which the maximum
sinusoidal input signal has decreased below the accuracy specified |
|
|
Channel |
individual measurement path through an instrument Note: “Channel” and “phase” are not the
same. A voltage channel is by
definition the difference in potential between two conductors. Phase refers
to a single conductor. A channel may be between two phases on a poly-phase
system, or between a phase and neutral, or between a phase and earth. |
IEC
1000-4-30 |
|
declared
input voltage, Udin |
value obtained from the declared supply
voltage by a transducer ratio |
IEC
1000-4-30 |
|
declared
supply voltage |
value of a voltage different from the nominal
voltage obtained by agreement between the electricity supplier and a consumer |
IEC
1000-4-30 |
|
Dynamic
accuracy |
Accuracy
determined for a time-varying output |
IEEE
100 |
|
Dynamic
range |
The
ratio, usually expressed in decibels, of the maximum to the minimum signal
input amplitude over which an amplifier can operate within some specified
range of performance. |
IEEE
100 |
|
flagged
data |
for
any measurement time interval in which interruptions, sag (dip)s or swells
occur, the measurement results of all other parameters made during this time
interval are flagged |
IEC
1000-4-30 |
|
flicker |
impression of unsteadiness of visual
sensation induced by a light stimulus whose luminance or spectral
distribution fluctuates with time |
(IEV
161-08-13) |
|
Frequency
bins |
The
minimum bandwidth at which two signals close in frequency can still be analysed. |
|
|
fundamental component |
component
whose frequency is the fundamental frequency |
(IEV
101-14-49 modified) |
|
fundamental
frequency |
frequency in the spectrum obtained from a Fourier
transform of a time function, to which all the frequencies of the spectrum
are referred NOTE
- In case of any remaining risk of ambiguity, the power supply frequency
should be referred to the polarity and speed of rotation of the synchronous
generator(s) feeding the system. |
(IEV
101-14-50 modified) |
|
harmonic
component |
any of the components having a harmonic frequency NOTE Its value is normally expressed as an r.m.s. value. For brevity,
such component may be referred to simply as a harmonic |
(IEC 61000-2-2,
definition 3.2.4). |
|
harmonic
frequency |
frequency which is an integer multiple of the
fundamental frequency NOTE - The ratio of the harmonic
frequency to the fundamental frequency is the harmonic order |
(IEC 61000‑2-2, definition
3.2.3). |
|
hysteresis |
phenomenon represented by a characteristic curve
which has a branch, called ascending branch, for increasing values of the
input variable, and a different branch, called descending branch, for
decreasing values of the input variable. NOTE
– Sometimes a dead band effect can be superposed on a hysteresis phenomenon. |
(IEV
351-14-22) |
|
influence quantity |
any quantity which may affect the working
performance of a measuring equipment NOTE - this
quantity is generally external to the measurement equipment |
(IEV
311-06-01 modified). |
|
interharmonic component |
component having an interharmonic frequency NOTE - Its value is normally expressed as an r.m.s. value. For brevity,
such a component may be referred to simply as an interharmonic |
(IEC 61000-2-2,
definition 3.2.6). |
|
interharmonic
frequency |
any frequency which is not an integer multiple of
the fundamental frequency NOTE 1 By extension from harmonic
order, the interharmonic order is
the ratio of an interharmonic frequency to the fundamental frequency. This
ratio is not an integer (Recommended notation m). NOTE 2 In the case where m
< 1 the term subharmonic frequency may
be used. |
(IEC 61000-2-2,
definition 3.2.5) |
|
interruption |
reduction of the voltage at a point in the
electrical system below a threshold |
IEC
1000-4-30 |
|
interruption
threshold |
voltage magnitude specified for the purpose
of detecting the start and the end of a voltage interruption |
IEC
1000-4-30 |
|
Mean
( |
The
mean of a number of measurements performed during a period or an interval of
a given quantity is defined by |
|
|
measurement
uncertainty |
maximum
expected deviation of a measured value from its actual value |
IEC
1000-4-30 |
|
nominal
voltage, UN |
voltage by which a system is designated or
identified |
IEC
1000-4-30 |
|
overdeviation |
difference
between the measured value and the nominal value of a parameter, only when
the measured value of the parameter is greater than the nominal value |
IEC
1000-4-30 |
|
power
quality |
characteristics of the electricity at a given
point on an electrical system, evaluated against a set of reference technical
parameters. NOTE
These parameters might, in some cases, relate to the compatibility between
electricity supplied on a network and the loads connected to that network. |
IEC
1000-4-30 |
|
Observation
Window |
Sampled
signal which occurs during a predefined period. |
IEC
1000-4-30 |
|
Precision |
The
quantity of coherence or repeatability of measurement data, customarily
expressed in terms of the standard deviation of the extended set of
measurement results from a well-defined (adequately specified) measurement
process in a state of statistical control.
The standard deviation of the conceptual population is approximated by
the standard deviation of an extended set of actual measurements. |
|
|
|
Precision
is an indication of the likelihood that a measurement will differ from the
same measurement at a different, but not correlated, time. The assessment interval specification is
also needed to assess precision values. For example, the precision could be
assessed using measurements every 3-s interval. |
|
|
Resolution |
The
smallest change in the measured or supplied quantity to which a numerical
value can be assigned without interpolation. Note.:
the resolution of most digital instruments is specified in terms of the number
of bits that the analogue to digital converter can provide. Manufacturers have invented several wordings such as
effective bits. |
IEC
dictionary |
|
rms
( |
The
rms |
|
|
|
square root of the arithmetic mean of the squares
of the instantaneous values of a quantity taken over a specified time
interval and a specified bandwidth |
(IEV
101-14-16 modified). |
|
r.m.s.
voltage refreshed each half cycle, Urms(1/2) |
value
of the r.m.s. voltage measured over one cycle, commencing at a fundamental
zero-crossing, and refreshed each half cycle NOTE1: This technique is independent for each channel, and will produce
r.m.s. values at successive times on different channels for polyphase
systems. NOTE2: This value is used only
for voltage sag (dip), voltage swell, and interruption detection |
IEC
1000-4-30 |
|
Range
of influence quantities |
range of values of a single influence quantity |
IEC
1000-4-30 |
|
reference
channel |
one
of the voltage measurement channels designated as the reference channel for
poly-phase measurements |
IEC
1000-4-30 |
|
retained
voltage, Uret |
minimum value of Urms(1/2) recorded during a voltage sag (dip) or
interruption. NOTE
The retained voltage is expressed as a value in volts, or as a percentage or
per unit value of the declared input voltage. |
IEC
1000-4-30 |
|
sliding
reference voltage, Usr |
voltage magnitude averaged over a specified time
interval, representing the voltage preceding a voltage sag (dip) or swell NOTE
- The sliding reference voltage is used to determine the voltage change
during a sag (dip) or a swell |
IEC
1000-4-30 |
|
sag
(dip) threshold |
voltage
magnitude specified for the purpose of detecting the start and the end of a
voltage sag (dip) |
IEC
1000-4-30 |
|
Sampled
signal |
Signal
representing a variable which is only intermittently observed and
represented. The sequence of values of a signal taken at discrete instants. |
|
|
Sideband |
The
spectral components resulting from the modulation of a sinusoidal carrier and
lying above or below the carrier frequency.
Note:
Sideband designates a frequency band lying above or below a sinusoidal
carrier frequency and containing spectral components of significance produced
by modulation. Flicker originated
from a lamp is produced by the modulation of the power-system voltage
operated at the fundamental
frequency. Thus, the fundamental
frequency is the carrier frequency and the modulation produces the sidebands. |
IEC
dictionary |
|
signal
|
A
measurable variable, one or more parameters of which carry information about
one or more variables which the signal represents |
|
|
swell
threshold |
voltage
magnitude specified for the purpose of detecting the start and the end of a
swell |
IEC
1000-4-30 |
|
time
aggregation |
combination of several sequential values of
a given parameter (each determined over identical time intervals) to provide
a value for a longer time interval Note
Aggregation in this document always refers to time aggregation. |
IEC
1000-4-30 |
|
Traceability |
Traceability
is an attribute of some measurements.
Measurements have traceability to the designated standards if an only
if scientifically rigorous evidence is produced on a continuing basis to show
that the measurement process is producing measurement results (data) for
which the total measurement uncertainty, relative to national or other
designated standards is quantified |
|
|
underdeviation |
absolute
value of the difference between the measured value and the nominal value of a
parameter, only when the value of the parameter is lower than the nominal
value |
|
|
Voltage
sag (dip) |
temporary reduction of the voltage at a point in
the electrical system below a threshold NOTE - 1: Interruptions are a special case of sag (dip). Post-processing may be used to distinguish
between sag (dip)s and interruptions. NOTE - 2; In some areas of the
world a voltage sag (dip) is referred to as sag. The two terms are considered
interchangeable, however this standard will only use the term voltage sag
(dip). |
|
|
voltage
swell |
temporary
increase of the voltage at a point in the electrical system above a threshold |
|
|
voltage
unbalance |
condition in a poly-phase system in which the
r.m.s. values of the line voltages (fundamental component), or the phase
angles between consecutive line voltages, are not all equal NOTE - 1: The degree of the inequality is usually expressed as the
ratios of the negative and zero sequence components to the positive sequence
component NOTE - 2: In this standard
voltage unbalance is considered in relation to three-phase systems. |
(VEI
161-08-09 modified) |
For each
parameter measured, two classes of measurement performance are defined:
·
Class A performance
·
This
class of performance is used where precise measurements are necessary, e.g. for
contractual applications, verifying compliance with standards, resolving
disputes, etc. Any measurements of a parameter carried out with two different
instruments complying with the requirements of class A, when measuring the same
signals, will produce matching results within the specified uncertainty.
To ensure
that matching results are produced, class A performance instrument requires a
bandwidth characteristic and a sampling rate sufficient for the specified
uncertainty of each parameter.
·
Class B performance
This class of performance may
be used for statistical surveys, troubleshooting applications, and other
applications where low uncertainty is not required.
For each performance class the range of influencing factors that shall
be complied with is specified in Clause 6. Users shall select the class of
measurement performance taking account of the situation of each application
case.
NOTE - 1: A measurement instrument may have different performance
classes for different parameters.
NOTE - 2: The instrument manufacturer shall declare influence
quantities which are not expressely given and which may degrade performance of
the instrument.
The whole measurement chain
is shown in Figure 1.

An "instrument" usually includes the whole measurement chain
(see Figure 1). In this standard, the normative part does not consider the
measurement transducers including uncertainty, but the Annex A.2 gives
guidance.
Measurements can be performed on single-phase or poly-phase supply
systems. Depending on the context, it may be necessary to measure voltages
between phase conductors and neutral (line-to-neutral) or between phase
conductors (line-to-line) or between neutral and earth. It is not the purpose
of this standard to impose the choice of the electrical values to be measured.
Moreover, except for the measurement of voltage unbalance, which is
intrinsically poly-phase, the measurement methods specified in this document
are such that independent results can be produced on each measurement channel.
Current measurements can be performed on each conductor of supply
systems, including the neutral conductor and the protective earth conductor.
NOTE: It is often useful to measure current simultaneously with voltage,
and to associate the current measurements in one conductor with voltage
measurements between that conductor and a reference conductor, such as an earth
conductor or a neutral conductor.
·
For class A performance
A
measurement time interval of magnitudes (supply voltage, harmonics,
interharmonics and unbalance) shall be over a 10-cycle time interval for
50 Hz power system or 12-cycle time interval for 60 Hz power system.
NOTE The uncertainty of this measurement is
included in the uncertainty measurement protocol of each parameter.
Measurement
time intervals are aggregated over three different time intervals. Clauses A.6
and A.7 discuss some applications of these aggregation time intervals. The
aggregation time intervals are:
– 3-s
interval (150 cycles for 50 Hz nominal or 180 cycles for 60 Hz
nominal),
– 10-min
interval,
– 2-h
interval.
·
For class B performance
The manufacturer shall
indicate the method, number and duration of aggregation time intervals.
Aggregations are performed using the square root of the arithmetic mean
of the squared input values.
NOTE: For flicker measurements, the aggregation algorithm is different
(see IEC 61000‑4-15).
Three categories of aggregation are necessary:
– Cycle aggregation
The data for the
150/180-cycle time interval shall be aggregated from fifteen 10/12-cycle time
intervals.
NOTE: This time interval is not a "time clock" interval; it is
based on the frequency characteristic.
– From cycle to time clock
aggregation
The
10-minute value shall be tagged with the absolute time (e.g. 01H10.00). The
time tag is that at the end of the 10-minute aggregation. If the last 10/12 cycle value in a 10-minute
aggregation period overlaps in time with the absolute 10-minute clock boundary,
that 10/12 cycle value is included in the aggregation for this 10-minute
interval.
On
commencement of the measurement, the 10/12 cycle measurement shall be started
at the boundary of the absolute 10-minute clock, and shall be re-synchronised
at every subsequent 10-minute boundary.
Note: This technique implies that a very small
amount of data may overlap and appear in two adjacent 10-minute aggregations.
– Time clock aggregation
The data for the “2-h interval” shall be
aggregated from twelve 10-min intervals.
The time clock uncertainty is:
·
For class A performance
± 20 ms for
50 Hz or ± 16,7 ms for 60 Hz.
NOTE - 1: This performance can be achieved, for example, through a
synchronisation procedure applied periodically during a measurement campaign,
or through a GPS receiver, or through reception of transmitted radio timing
signals.
NOTE - 2: When synchronisation by an external signal becomes
unavailable, the time tagging tolerance must be better than 1 s/24 h.
NOTE - 3: This performance is necessary to ensure that two class A
instruments produce the same 10-min aggregation results when connected to the
same signal.
NOTE 4: When a threshold is crossed, it may be useful to record the date
and time.
·
For class B performance
The
manufacturer shall specify the method to determine 10-min intervals.
The
basic measurement of a voltage sag (dip) and swell shall be the Urms(1/2) on each measurement channel.
NOTE - 1:
For class A, the cycle duration for Urms(1/2)
depends on the frequency. The frequency might be determined by the last
non-flagged power frequency measurement (see 4.7 and 5.1), or by any other
method that yields the uncertainty requirements of Clause 6.
NOTE - 2:
The Urms(1/2)
value
includes, by definition, harmonics, interharmonics, ripple control signals,
etc.
The sag
(dip) threshold is a percentage of either Udin or
the sliding voltage reference Usr (see
5.4.4). The user shall declare the reference voltage in use.
NOTE:
Sliding voltage reference Usr
is generally not used in LV systems. See 61000-2-8 for further information and
advice.
– On single-phase system a voltage sag (dip)
begins when the Urms(1/2) voltage
falls below the sag (dip) threshold, and ends when the Urms(1/2) voltage is equal to or above the sag (dip)
threshold plus the hysteresis voltage.
– On poly-phase system a sag (dip) begins when
the Urms(1/2)
voltage of one
channel, at least, is below the sag (dip) threshold and ends when the Urms(1/2)
voltage on all
measured channels is equal to or above the sag (dip) threshold plus the
hysteresis voltage.
The sag
(dip) threshold and the hysteresis voltage are both set by the user according
to the use.
A
voltage sag (dip) is characterised by a pair of data, either retained voltage (uret) or depth and duration.
–
The
retained voltage is the smallest Urms(1/2)
value measured on any channel during the sag (dip).
–
The
depth is the difference between the reference voltage (either Udin
or Usr) and the retained voltage. It is generally expressed in % of
the reference voltage.
– The
duration of a voltage sag (dip) is the time difference between the beginning
and the end of the voltage sag (dip).
NOTE - 1:
The sag (dip) duration measurement can be started on one channel and terminated
on a different channel.
NOTE - 2:
Voltage sag (dip) envelopes are not necessarily rectangular. As a consequence,
for a given voltage sag (dip), the measured duration is dependent on the
selected sag (dip) threshold value. The shape of the envelope may be assessed
using several sag (dip) thresholds set within the range of voltage sag (dip)
and voltage interruption thresholds detection.
NOTE - 3:
Typically, the hysteresis is equal to 2 % of Udin.
NOTE - 4:
Sag (dip) thresholds are e. g. in the range 85 % to 90 % of the fixed
voltage reference for troubleshooting or statistical applications, and
70 % for contractual applications.
NOTE - 5:
Retained voltage is often useful to end-users, and may be preferred because it
is referenced to zero volts. In
contrast, depth is often useful to electric suppliers, especially on HV systems
or in cases when a sliding reference voltage is used.
NOTE - 6:
Phase shift may occur during voltage sag (dip)s. See A9.4.
NOTE - 7:
When a threshold is crossed, it may be useful to record the date and time.
The
swell detection threshold is a percentage of either Udin. or the sliding voltage reference Usr
(see 5.4.4).
The user shall declare the reference voltage in use.
NOTE Sliding voltage reference Usr is generally not used in
LV systems. See 61000-2-8 for further information and advice.
– On single-phase system a swell begins when
the Urms(1/2) voltage is above the swell
threshold, and ends when the Urms(1/2)
voltage is equal to or below the swell threshold minus the hysteresis voltage.
– On poly-phase system a swell begins when the
Urms(1/2) voltage of one channel, at
least, is above the swell threshold and ends when the Urms(1/2) voltage on all measured channels is equal
to or below the swell threshold minus the hysteresis voltage.
The
swell threshold and the hysteresis voltage are both set by the user according
to the use.
A
voltage swell is characterised by a pair of data, maximum swell voltage
magnitude and duration.
– The maximum swell magnitude voltage is the
largest Urms(1/2)
value measured on any channel during the swell.
– The
duration of a voltage swell is the time difference between the beginning and
the end of the swell.
NOTE - 1:
The swell duration measurement can be started on one channel and terminated on
a different channel.
NOTE - 2:
Swell envelopes may not be rectangular. As a consequence, for a given swell,
the measured duration is dependent on the swell threshold value.
NOTE - 3
Typically, the hysteresis is equal to 2 % of Udin.
NOTE - 4:
Typically, the swell threshold is greater than 110 % of Udin
NOTE - 5:
Phase shift may also occur during voltage swells.
NOTE - 6:
When a threshold is crossed, it may be useful to record the date and time.
If a sliding reference is chosen
for voltage sag (dip) or swell detection, this shall be calculated using a
first-order filter with a 1-min time constant. This filter is given by:
Usr(n) = 0,9967 x Usr(n–1) + 0,0033 x U(10/12)rms
where
Usr(n) is the present value of the sliding reference voltage,
Usr(n–1) is the previous value of the sliding reference voltage, and
U(10/12)rms is the most recent 10/12-cycle r.m.s. value.
When the measurement is started,
the initial value of the sliding reference voltage is set to the declared input
voltage. The sliding reference voltage is updated every 10/12-cycles. If a
10/12-cycle value is flagged, the sliding reference voltage is not updated and
the previous value is used.
·
For class A performance
The uncertainty shall be DU = ±0,2 % of Udin.
·
For class B performance
The
manufacturer shall specify the uncertainty. In all cases the uncertainty DU shall be ±1,0 % of Udin.
·
For class A and class B
performances
The uncertainty of a sag (dip) or swell duration is equal to the sag
(dip) or swell commencement uncertainty (half a cycle) plus the sag (dip) or
swell conclusion uncertainty (half a cycle).
Annex A (informative)
The difference between the start and end times.
The highest RMS value of the waveform during the sample set.
The lowest RMS value of the waveform during the sample set.
The average of the RMS value between the sag start and end times.
A trained human observer could look at a disturbance and tell when it began and ends by inspection. Unfortunately, the rms method does not determine these values properly. As mentioned previously, the total duration of an rms sag could be as much as a cycle in error (too long) due to the averaging of the moving window. The rms moving window cannot give accurate point in wave of sag initiation or recovery either.
These algorithms attempt to replicate the human observer and determine when the actual waveform deviates from the ideal waveform and when it recovers. We will call these values the “apparent” values. This technique uses two envelopes which surround the pre-event (ideal) voltage waveform by ± 5% and ± 10%. The algorithm proceeds as follows:
When the disturbance waveform deviates from the ideal by 10% (i.e., falls outside of the 10% envelope), the event is “detected.”
The algorithm “backs-up” to see where the waveform fell outside of the 5% envelope for the last time, and that is used as the beginning (start) of the event. (This helps pick-up on the initiation of the event more accurately, without having false reporting of minor variations in voltages that were not of significance.)
·
The start of the sag is
the point where the last excursion outside of the ±5% band began.
·
When the disturbed
waveform returns inside the 10% band for at least 1/2 cycle, the sag is deemed
recovered.
·
The initial point at
which the 1/2 cycle of recovery occurs is the point of recovery. (The 10% band was chosen since most sags do
not recover to within 5% in the data set intervals.
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Apparent Sag
Start: The point at which the voltage
falls outside of the 5% envelope as described previously.
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Apparent Sag End: The point at which the voltage returns to
the 10% envelope as described previously.
·
Point-of-initiation: The angle at which the “apparent sag start”
occurs using the last positive-going zero crossing as the reference angle.
·
Point-of-recovery: The angle at which the “apparent sag end”
occurs using the last positive-going zero crossing as the reference angle.
·
Apparent Sag
Duration: The difference of Apparent
Sag End and Apparent Sag Start.
·
Difference in Duration:
The difference in the sag duration
given by the apparent method and the rms method (in seconds).
If the voltage sag were purely
sinusoidal in waveshape, then this computation would be straightforward. Unfortunately, the waveforms are often
distorted and the computation of a phase angle is not easy since the harmonic
components will have phase angles as well.
Two acceptable methods:
·
The Zero Crossing
Method
·
The Fundamental Phase
Angle
Ideally, a sinusoid crosses the zero axis twice per
cycle, 180 degrees apart. Thus, if the
phase angle of the waveform shifts and the basic waveshape does not change, the
phase shift could be detected by examining the zero crossings. Of course, any noise or distortion which
causes the zero crossings to occur multiple times per half cycle, or severe
waveform distortion will render this technique of limited value. To miminize the effect of noise, an averaging
technique is employed which uses a ¼ cycle moving window. The zero crossing is said to take place when
half the samples in the window are greater than zero and half are less than
zero.
The zero crossings of the actual waveform are
compared to those of the reference waveform.
The difference in time (phase angle) of the two waveforms are then
reported as the phase shift. The phase
shift is inherently “jumpy” when observed on a continuous time graph since the
phase can only be computed two times per cycle (at the zero crossings). The phase angles are then connected with
straight lines.
The Discrete Fourier Transform (using an FFT) is used
to compute the dc, fundamental (60 Hz component), and harmonics of the waveform
using a one-cycle window. The fundamental
component is the 60 Hz component which is normally desired. Many electronic devices incorporate filters
which strip away all unwanted (non-60Hz) components. Therefore, the phase angle reported by the DFT will be similar to
the one seen by many types of equipment.
Since the DFT needs a periodic signal, a one-cycle
window is used. This “averages” a
signal which is varying in much the same way the rms calculations will.
The DFT returns the real and imaginary parts of the
waveform at each frequency component, A+jB. The magnitude and phase angle is computed
from these. The phase angle is a single
value, so it is outputted at the center of the window.
The phase angle needs to be a continuous
function. Since the phase angle is
computed as the difference in the phase angle of the fundamental component of
the disturbed waveform and the phase angle of the ideal waveform, angular
difference can exceed ±360o. The arctangent function, from which the
phase angle is computed, will only report an angle between –180o and
+180o. Therefore, as the
phase angles are subtracted from each other over a discontinuity, a
discontinuity in the phase angle plot will occur. While not incorrect (e.g., 180o = 540o),
the phase angle plot will be difficult to interpret. An alternative method to determine the phase angle without
resulting in a discontinuity was developed where the functions are subtracted
from each other before the arctangent is taken.
If the fundamental component has a rectangular form
of A+jB and the ideal fundamental
component is C+jD, then the phase
shift is computed from:
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·
Phase Shift: The phase angle between the ideal waveform
and the disturbed waveform using either the zero crossing technique or the DFT
fundamental method.
·
Phase Shift at Sag
Start (Df): This is computed in two
different ways. One is using zero
crossings and the other is using the DFT values. When using zero crossings, the phase shift computed at the first
zero crossing after the “disturbed sag start.” When using the DFT method, the
value is computed ½ cycle after the sag start.
·
Maximum Phase
Shift: The maximum phase angle recorded
between the “apparent sag start” and “actual sag end” times.
·
Minimum Phase Shift:
The minimum phase angle recorded between the “apparent sag start” and “actual
sag end” times.
·
Average Phase Shift:
The average phase angle recorded between the “apparent sag start” and “apparent
sag end” times.
·
Maximum ± df/dt (rate of change or “slew rate” of phase angle): This is the rate of change of the phase
angle during the interval. The initial
change at the “sag start” and then final change at the recovery is not included
in this calculation since the sharp discontinuity which usually accompanies the
beginning and end of the event will cause a very high and meaningless value.
· The actual waveform is subtracted from the nominal waveform.
· The result is rectified to give all positive numbers.
· The voltage is subdivided into 5% bands.
· The missing voltage is reported as the peak value that falls into one of the bands at a specific instant of time.
·
The amount of time
(total number of sample points) that the missing voltage falls into a
particular band (e.g., 30% to 35%) is tabulated onto a bar graph.
·
The cumulative time
that the missing voltage is greater than or equal to a particular value (i.e., ³ 30%) is shown on the same bar graph. This report will be particularly useful in
determining how a series voltage compensation device will perform.
Many disturbances only affect one or two phases, or affect individual phases in different ways. A balanced sag is one in which all three phases sags to the same depth at the same time. The unbalance a measure of the difference in voltage among the phases. The residual value (sum of all three phases) can be of some value in determining the balance on an instantaneous basis. However, since this value oscillates with the voltage waveforms, the residual does not yield meaningful information. The unbalance ratio can be used to help give a meaningful value to the unbalance.
The unbalance ratio is defined as the difference in the rms values between the highest and lowest phases, divided by the average of the rms values of the three phases.
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This ratio is plotted on a
continuous time basis using a moving window.
The maximum unbalance during the interval is reported.
Most voltage disturbances are not sinusoidal. Instead, the event will often have a
significant amount of distortion. A
good method of gauging the distortion iss needed. Distortion is often measured using a value called the total harmonic distortion (THD). The THD reports the percent of the harmonic
components relative to the fundamental.
In most systems that use THD, the fundamental component is fixed in amplitude. Our waveforms do not have this
property. For example, the fundamental
component of the voltage will drop nearly to zero during a very deep voltage
sag. As a result, scaling the harmonics
relative to the fundamental is not meaningful.
The harmonic rms value (hrms)
is defined as the square root of the sum of the squares of all harmonic
components at or above the second component.
Thus it provides the same information as the THD without scaling it by
the fundamental.
Two methods can be used to calculate the hrms
value. The most direct way is to
determine the value of each harmonic component at or above the second
component, sum the squares of each component’s magnitude and then take the
square root. However, a more computationally
efficient method is to first find the total rms value (which is being
calculated anyway), square it, subtract off the squares of the fundamental and
dc components, and take the square root.
This method is equivalent to the direct method since the total rms
values is equal to the square root of the sum of the squares of the Fourier
coefficients. The formula for hrms is
given below:
![]()
HRMS
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IEEE Std 100-1996,
The IEEE Standard Dictionary of Electrical and Electronics Terms.
IEEE Std
1159-2001R, IEEE Recommended Practice for Power Quality Monitoring
IEC 1000-4-30, Testing and Measurement Techniques - Power Quality
Measurement Methods
IEEE P1159.2
Draft December 1998
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