P1159.1 /D1.46
1002/2115/03
Draft
Recommended PracticeGuide
For Recorder and Data Acquisition Requirements For Characterization of Power
Quality Events
Sponsored by the Power Quality Committee of the IEEE
PES Society
{NOTE CHECK IF TITLE MATCHES PAR}
Copyright © 2003 by the Institute of Electrical and
Electronics Engineers, Inc.
345 East 47th Street
New York, NY 10017, USA
All rights reserved.
This is an unapproved draft
of a proposed IEEE Standard, subject to change. Permission is hereby granted
for IEEE Standards Committee
participants to reproduce this document for purposes of IEEE standardization
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IEEE Standards Department
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and Permissions
445
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At the time this
standard was completed, the working group had the following membership:
|
Charles Perry, Chair |
|
|
|
|
|
|
|
Richard
Bingham |
Greg Olson |
|
|
Math Bollen |
Scott Peele |
|
|
Randy Collins |
Dan Sabin |
|
|
Andrew
Dettloff |
Georges Simard |
|
|
Erich Gunther |
Timothy Unruh |
|
|
Mark Kempker |
David Vannoy |
|
|
Christopher
Melhorn |
Marek
Waclawiak |
|
|
R. Larry
Morgan |
James Wikston |
|
|
Alex McEachern |
|
|
The following persons were
on the balloting committee: (To be provided by IEEE editor at time of
publication.)
__________________________________________________________________________________
Contents
2.3 Classes of measurement performance
3 Organization of the
measurements
3.3 Electrical values to be measured
3.4 Measurement aggregation over time intervals
3.4.1 Measurement aggregation
algorithm
4 Supply voltage sag
(dip)s and swells
4.2.1 Detection and
evaluation of a voltage sag (dip)
4.2.2 Detection and
evaluation of a voltage swell
4.2.3 Calculation of a
sliding reference voltage
4.2.5 Duration measurement
uncertainty
5 Range of influence
quantities and implementation verification
5.1 Range of influence quantities
6.2 Characteristics Duplicated Above
6.3 Waveform Envelope Based Duration
6.3.1 Overview of Envelope
Based
6.3.2 Calculation of Envelope
Based Duration
6.3.3 Reported Data of the
Waveforms based on Envelope Technique.
6.4.1 Overview of Phase Angle
Shift
6.4.2 Calculation of Zero
Crossing Method
6.4.3 Calculation of
Fundamental Phase Angle
6.4.4 Reported data of the
waveforms from Phase Shift Technique
6.5.1 Overview of Missing
Voltage
6.5.2 Calculation of Missing
Voltage and its analyses
6.5.3 Reported Data using
Missing Voltage technique
6.6.2 Calculation of
Unbalance
6.6.3 Data Reported from
Unbalance technique
6.7.1 Overview of Harmonic
RMS
6.7.2 Calculations of
Harmonic RMS
6.7.3 Data Reported from
Harmonic RMS Technique
6.8.1 Overview of
Point-on-Wave
6.8.2 Calculation of Duration
using Point-on-Wave
6.8.3 Data Reported from
Point-on-Wave
6.9 DC EQUIVALENT VOLTAGE FROM AC VIA DIODE FUNCTION
6.9.1 Overview of DC
Equivalent Voltage
6.9.2 Calculations for DC
Equivalent Voltage
6.9.3 Data Reported from DC
Equivalent Voltage
Recommended
Practice for Power Quality Measurements in AC Power Supply Systems
Guide For Recorder and
Data Acquisition Requirements For Characterization of Power Quality Events
This recommended
practiceguide establishes the data acquisition
attributes necessary to characterize the power
quality electromagnetic phenomena.
[TAKE APPROVED SCOPE]
The objective of this recommended
practiceguide is to describe the technical
measurement requirements for each type of disturbance defined in 24 categories
of typical characteristics of power system electromagnetic phenomena found in
Table 2 of IEEE Std 1159-1995 (R2001). The intent of this document is that the
measurements of the same signal for any parameter defined herein can be carried
out with two different instruments that will produce matching results within
the specified uncertainty.
The initial publication of
this document covers the category of RMS voltage variations referred to as sags
(or dips) and swells. Subsequent
revisions will address the remaining parameters. In particular, harmonics will be addressed in a manner similar to
IEC 61000-4-7 Testing and Measurement
Techniques on Harmonics and Interharmonics Measurements and Instrumentation,
for Power Supply Systems and Equipment Connected. Transients (surges) will include the works of IEC, UIE,
and other references included in the Bibliography. {NOTE: Remove (dip) in remainder of
document.
Some definitions given in
this section have not been fully harmonized with definitions made in other IEEE
standards and IEC documents. Where
several definitions for the same terms exist, they are both included. Before
scheduling the power quality measurement, the user must select the instrument
which meets their needs. This section
addresses the language and the assessment specification which needs to be
understood to communicate with the instrumentation supplier manufacturer. Also, the user shouldneeds
to define their needs clearly. {GLOBAL CHANGE on
SUPPLIER}
Without the assessment
specification of the instrument, or with an inappropriate specification, users
are unable to assess the severity level of the disturbance on equipment; this
can lead to incorrect conclusions and costly decisions. Users should ask suppliersmanufacturers
for the complete measurement-instrument specification, thiswhich
may include the following information:
·
sampling rate,
·
bandwidth
amplitude/frequency
·
accuracy (the
instrument should stay within the
limits 100% of the time) NOTE SAME
·
precision (the
instrument should stay within the limits 68% of the time)
·
resolution
(signal-to-noise ratio or effective bits)
·
differential mode
argument and amplitude accuracy,
·
common mode rejection
·
anti-aliasing filter
(cut-off frequency, filter order, filter type)
·
window width, (interval
of the sampled signal used for each analysis)
·
number of windows
analysed per second,
·
type of weighted window
used (rectangular, triangular, Blackman, Vincent, …)
·
waveform synchronizsation
device used (electronic phase locked
loop or digital synchronizsation),
·
accuracy of the
synchronizsed
device,
·
global
time synchronization method used and its accuracy
·
the common mode ratio
rejection ratio,
·
flag when the phase
locked loop is not synchronized
·
flag when hardware or
software error occurs,
·
flag when some
frequency components present in the signal are not recorded,
·
immunity of the
instrument to disturbances in the
supply voltage (transient, voltage sag (dip)s, voltage distortion etc…),
·
operating environment (temperature, vibration, humidity)
Term
|
Definition |
Source |
Accuracy
|
IEC dictionary and
IEEE 100 |
|
|
|
Accuracy
is the degree of agreement between measured values and the true values (i.e.
closeness to the reality). |
|
|
Aliasing |
The
distortion caused by sampling a signal at an inappropriate rate and which
results in the overlapping of the sidebands around the harmonics of the
sampling frequency in the spectrum of the sample signal. Note.:
A high frequency which exceeds the operating range of the instrument affects
the frequency component in the frequency range of the analysis. IEC has requested use of an anti-aliasing
filter which should attenuate to below 50 dB all frequencies above the
operating range of the instrument.
Observation windows may be flagged during the presence of frequency components
which exceed the operating range of the instrument. If these high frequency components occur too often, the user
may need a wider bandwidth instrument. |
IEC dictionary |
|
Analog |
A
signal in which the characteristic quantity representing information may, at
any instant, assume any value within a continuous interval. Note.
For example, an analog |
IEC dictionary |
|
Anti-aliasing |
C |
IEC dictionary |
|
Bandwidth |
The
The
quantitative difference between the limiting frequencies of a frequency
band. For most power quality users
should specify the bandwidth as the frequency for which the maximum
sinusoidal input signal has decreased below the accuracy specified |
|
|
Channel |
I Note: “Channel” and “phase” are not the
same. A voltage channel is by definition
the difference in potential between two conductors. Phase refers to a single
conductor. A channel may be between two phases on a poly-phase system, or
between a phase and neutral, or between a phase and earth. |
IEC 61000-4-30
Definition 3.1 |
|
declared input voltage, Udin |
value obtained from the
declared supply voltage by a transducer ratio |
IEC 61000-4-30
Definition 3.2 |
|
declared supply voltage |
value of a voltage different
from the nominal voltage obtained by agreement between the electricity supplier
and a consumer |
IEC 61000-4-30
Definition 3.3 |
|
dip |
See
Sag. |
|
|
Dynamic accuracy |
Accuracy
determined for a time-varying output |
IEEE 100 |
|
Dynamic range |
The
ratio, usually expressed in decibels, of the maximum to the minimum signal
input amplitude over which an amplifier can operate within some specified
range of performance. |
IEEE 100 |
|
flagged data |
for
any measurement time interval in which interruptions, sag (dip)s or swells
occur, the measurement results of all other parameters made during this time
interval are flagged |
IEC 61000-4-30
Definition 3.5 |
|
flicker |
impression of unsteadiness of
visual sensation induced by a light stimulus whose luminance or spectral
distribution fluctuates with time |
(IEV 161-08-13) IEC 61000-4-30
Definition 3.6 |
|
Frequency bins |
The
inherent frequency resolution of the discrete
Fourier transform function |
|
|
fundamental
component |
component
whose frequency is the fundamental frequency |
(IEV 101-14-49 modified) IEC 61000-4-30 Definition 3.7 |
|
fundamental frequency |
frequency in the spectrum obtained from a
Fourier transform of a time function, to which all the frequencies of the
spectrum are referred NOTE
- In case of any remaining risk of ambiguity, the power supply frequency
should be referred to the polarity and speed of rotation of the synchronous
generator(s) feeding the system. |
(IEV 101-14-50 modified) IEC 61000-4-30
Definition 3.8 |
|
harmonic component |
any of the components having a harmonic frequency
NOTE Its value is normally expressed as an r.m.s.
value. For brevity, such component may be referred to simply as a harmonic |
IEC 61000-2-2, definition 3.2.4. |
|
harmonic frequency |
frequency which is an integer multiple of
the fundamental frequency NOTE - The ratio of the harmonic
frequency to the fundamental frequency is the harmonic order |
IEC 61000‑2-2, definition 3.2.3 |
|
hysteresis |
phenomenon represented by a characteristic
curve which has a branch, called ascending branch, for increasing values of
the input variable, and a different branch, called descending branch, for
decreasing values of the input variable. NOTE
– Sometimes a dead band effect can be superposed on a hysteresis phenomenon. |
(IEV 351-14-22) IEC 61000-4-30
Definition 3.11 |
|
influence
quantity |
any quantity which may affect the working
performance of a measuring equipment NOTE - this quantity is generally external to the measurement equipment |
(IEV 311-06-01 modified). IEC 61000-4-30
Definition 3.12 |
|
interharmonic
component |
component having an interharmonic frequency NOTE - Its value is normally expressed as an
r.m.s. value. For brevity, such a component may be referred to simply as an interharmonic |
IEC 61000-2-2, definition 3.2.6 |
|
interharmonic frequency |
any frequency which is not an integer
multiple of the fundamental frequency NOTE 1 By extension from harmonic order, the interharmonic
order is the ratio of an interharmonic frequency to the fundamental
frequency. This ratio is not an integer (Recommended notation m). NOTE 2 In the case where m < 1 the term subharmonic
frequency may be used. |
IEC 61000-2-2, definition 3.2.5 |
|
interruption |
reduction of the voltage at a
point in the electrical system below a threshold |
IEC 61000-4-30
Definition 3.15 |
|
interruption threshold |
voltage magnitude specified for
the purpose of detecting the start and the end of a voltage interruption |
IEC 61000-4-30
Definition 3.16 |
|
Mean ( |
where N
is total number
of samples, xi
is the ith
sample |
|
|
measurement uncertainty |
maximum
expected deviation of a measured value from its actual value |
IEC 61000-4-30
Definition 3.17 |
|
Missing voltage |
The voltage waveform that would
need to be generated and summed into a sag or swell waveform to restore it to
the original (pre-fault) waveshape. |
|
|
nominal voltage, UN |
voltage by which a system is designated or
identified |
IEC 61000-4-30
Definition 3.18 |
|
overdeviation |
difference
between the measured value and the nominal value of a parameter, only when
the measured value of the parameter is greater than the nominal value |
IEC 61000-4-30
Definition 3.19 |
|
power quality |
The
concept of powering and grounding sensitive equipment in a manner that is
suitable to the operation of that equipment.
NOTE—Within
the industry, alternate definitions or interpretations of power quality have
been used, reflecting different points of view. Therefore, this definition might not be exclusive, pending development
of a broader consensus. |
Heydt, G.T. 1991.
Electric power quality. West LaFayette, Indiana: Stars in a Circle
Publications. |
|
|
characteristics of the electricity at a
given point on an electrical system, evaluated against a set of reference
technical parameters. NOTE
These parameters might, in some cases, relate to the compatibility between
electricity supplied on a network and the loads connected to that network. |
IEC 61000-4-30 Definition 3.20 |
|
Observation Window |
Sampled
signal which occurs during a predefined period. |
IEC 1000-4-30 |
|
Precision |
The
quantity of coherence or repeatability of measurement data, customarily
expressed in terms of the standard deviation of the extended set of
measurement results from a well-defined (adequately specified) measurement
process in a state of statistical control.
The standard deviation of the conceptual population is approximated by
the standard deviation of an extended set of actual measurements. |
|
|
|
Precision
is an indication of the likelihood that a measurement will differ from the
same measurement at a different, but not correlated, time. The assessment interval specification is
also needed to assess precision values. For example, the precision could be assessed
using measurements every 3-s interval. |
|
|
Resolution |
The
smallest change in the measured or supplied quantity to which a numerical
value can be assigned without interpolation. Note.:
the resolution of most digital instruments is specified in terms of the
number of bits that the analogue to digital converter can provide. Manufacturers have invented several wordings such as
effective bits. |
IEC dictionary |
|
r.m.s.
( |
The
root mean square, |
|
|
|
square root of the arithmetic mean of the
squares of the instantaneous values of a quantity taken over a specified time
interval and a specified bandwidth |
(IEV 101-14-16 modified). IEC 61000-4-30
Definition 3.21 |
|
r.m.s. voltage refreshed each half cycle, Urms(1/2) |
value
of the r.m.s. voltage measured over one cycle, commencing at a fundamental
zero-crossing, and refreshed each half cycle NOTE1: This technique is independent for each
channel, and will produce r.m.s. values at successive times on different
channels for polyphase systems. NOTE2: This value is used only
for voltage sag (dip), voltage swell, and interruption detection |
IEC 61000-4-30
Definition 3.22 |
|
Range of influence quantities |
range of values of a single influence
quantity |
IEC 61000-4-30
Definition 3.23 |
|
reference channel |
one
of the voltage measurement channels designated as the reference channel for
poly-phase measurements |
IEC 61000-4-30
Definition 3.24 |
|
retained voltage, Uret |
minimum value of Urms(1/2)
recorded during a voltage sag (dip) or interruption. NOTE
The retained voltage is expressed as a value in volts, or as a percentage or
per unit value of the declared input voltage. |
IEC 61000-4-30
Definition 3.25 |
|
|
[need
corresponding term for SWELL similar to retained voltage] |
|
|
sliding reference voltage, Usr |
voltage magnitude averaged over a specified
time interval, representing the voltage preceding a voltage sag (dip) or
swell NOTE
- The sliding reference voltage is used to determine the voltage change
during a sag (dip) or a swell |
IEC 1000-4-30 Definition 3.26 |
|
sag (dip) threshold |
voltage
magnitude specified for the purpose of detecting the start and the end of a
voltage sag. The use
of the term |
IEC 1000-4-30 Definition 3.27 |
|
Sampled signal |
Signal
representing a variable which is only intermittently observed and
represented. The sequence of values of a signal taken at discrete instants. |
|
|
Sideband |
The
spectral components resulting from the modulation of a sinusoidal carrier and
lying above or below the carrier frequency.
Note:
Sideband designates a frequency band lying above or below a sinusoidal
carrier frequency and containing spectral components of significance produced
by modulation. Flicker originated
from a lamp is produced by the modulation of the power-system voltage
operated at the fundamental
frequency. Thus, the fundamental
frequency is the carrier frequency and the modulation produces the sidebands. |
IEC dictionary |
|
signal |
A
measurable variable, one or more parameters of which carry information about
one or more variables which the signal represents |
|
|
swell threshold |
voltage
magnitude specified for the purpose of detecting the start and the end of a
swell |
IEC 61000-4-30
Definition 3.27 |
|
time aggregation |
combination
of several sequential values of a given parameter (each determined over
identical time intervals) to provide a value for a longer time interval Note Aggregation in this document always refers
to time aggregation. |
IEC 61000-4-30
Definition 3.28 |
|
Traceability |
Traceability
is an attribute of some measurements.
Measurements have traceability to the designated standards if an only
if scientifically rigorous evidence is produced on a continuing basis to show
that the measurement process is producing measurement results (data) for
which the total measurement uncertainty, relative to national or other
designated standards is quantified |
|
|
underdeviation |
absolute
value of the difference between the measured value and the nominal value of a
parameter, only when the value of the parameter is lower than the nominal
value |
|
|
Voltage sag (dip) |
temporary reduction of the voltage at a
point in the electrical system below a threshold NOTE - 1: Interruptions are a special case of sag
(dip). Post-processing may be used to
distinguish between sag (dip)s and interruptions. NOTE - 2; In some areas of the
world a voltage sag (dip) is referred to as sag. The two terms are considered
interchangeable, however this standard will only use the term voltage sag
(dip). |
|
|
voltage swell |
temporary
increase of the voltage at a point in the electrical system above a threshold |
|
|
voltage unbalance |
condition in a poly-phase system in which
the r.m.s. values of the line voltages (fundamental component), or the phase
angles between consecutive line voltages, are not all equal NOTE - 1: The degree of the inequality is usually
expressed as the ratios of the negative and zero sequence components to the
positive sequence component NOTE - 2: In this standard
voltage unbalance is considered in relation to three-phase systems. |
(VEI 161-08-09 modified) IEC 61000-4-30
Definition 3.31 |
For each parameter measured, two classes of measurement performance are
defined:
·
Class A performance
·
This class of performance is used where precise measurements are
necessary, e.g. for contractual applications, verifying compliance with
standards, resolving disputes, etc. Any measurements of a parameter carried out
with two different instruments complying with the requirements of class A, when
measuring the same signals, will produce matching results within the specified
uncertainty.
To
ensure that matching results are produced, class A performance instrument
requires a bandwidth characteristic and a sampling rate sufficient for the
specified uncertainty of each parameter.
·
Class B performance
This class
of performance may be used for statistical surveys, troubleshooting
applications, and other applications where low uncertainty is not required.
For each performance class the range of
influencing factors that shall be complied with is specified in Section 5.
Users shall select the class of measurement performance taking account of the
situation of each application case.
NOTE - 1: A measurement instrument may have different
performance classes for different parameters.
NOTE - 2: The instrument manufacturer shall
declare influence quantities which are not expressly given and which may
degrade performance of the instrument.
The whole measurement chain
is shown in Figure 1.

An "instrument" usually includes the
whole measurement chain (see Figure 1). In this standard, the normative part
does not consider the measurement transducers including uncertainty, but the
Annex A.2 gives guidance.
Measurements can be performed on single-phase or
poly-phase supply systems. Depending on the context, it may be necessary to
measure voltages between phase conductors and neutral (line-to-neutral) or
between phase conductors (line-to-line) or between neutral and earth. It is not
the purpose of this standard to impose the choice of the electrical values to
be measured. Moreover, except for the measurement of voltage unbalance, which
is intrinsically poly-phase, the measurement methods specified in this document
are such that independent results can be produced on each measurement channel.
Current measurements can be performed on each
conductor of supply systems, including the neutral conductor and the protective
earth conductor.
NOTE: It is often useful to measure current
simultaneously with voltage, and to associate the current measurements in one
conductor with voltage measurements between that conductor and a reference
conductor, such as an earth conductor or a neutral conductor.
·
For class A
performance
A measurement time interval of magnitudes
(supply voltage, harmonics, interharmonics and unbalance) shall be over a 10-cycle
time interval for 50 Hz power system or 12-cycle time interval for
60 Hz power system.
NOTE The uncertainty of this measurement is
included in the uncertainty measurement protocol of each parameter.
Measurement time intervals are aggregated
over three different time intervals. The aggregation time intervals are:
– 3-s interval (150 cycles for 50 Hz
nominal or 180 cycles for 60 Hz nominal),
– 10-min interval,
– 2-h interval.
·
For class B
performance
The
manufacturer shall indicate the method, number and duration of aggregation time
intervals.
Aggregations are performed using the square root
of the arithmetic mean of the squared input values.
NOTE: For flicker measurements, the aggregation
algorithm is different (see IEC 61000‑4-15).
Three categories of aggregation are necessary:
– Cycle
aggregation
The data
for the 150/180-cycle time interval shall be aggregated from fifteen
10/12-cycle time intervals.
NOTE: This time interval is not a "time
clock" interval; it is based on the frequency characteristic.
– From cycle
to time clock aggregation
The
10-minute value shall be tagged with the absolute time (e.g. 01H10.00). The
time tag is that at the end of the 10-minute aggregation. If the last 10/12 cycle value in a 10-minute
aggregation period overlaps in time with the absolute 10-minute clock boundary,
that 10/12 cycle value is included in the aggregation for this 10-minute
interval.
On
commencement of the measurement, the 10/12 cycle measurement shall be started
at the boundary of the absolute 10-minute clock, and shall be re-synchronised
at every subsequent 10-minute boundary.
Note: This technique implies that a very small amount
of data may overlap and appear in two adjacent 10-minute aggregations.
– Time clock
aggregation
The data for the
“2-h interval” shall be aggregated from twelve 10-min intervals.
The time clock uncertainty is:
·
For class A
performance
± 20 ms
for 50 Hz or ± 16,7 ms for 60 Hz.
NOTE - 1: This performance can be achieved, for
example, through a synchroniszation
procedure applied periodically during a measurement campaign, or through a GPS
receiver, or through reception of transmitted radio timing signals. The recalibration rate should be at a rate
necessary to maintain the required time accuracy.
NOTE - 2: When synchronisation by an external signal
becomes unavailable, the time tagging tolerance must be better than 1 s/24 h.
NOTE - 3: This performance is necessary to ensure that
two class A instruments produce the same 10-min aggregation results when
connected to the same signal.
NOTE 4: When a threshold is crossed, it may be useful
to record the date and time.
·
For class B
performance
The
manufacturer shall specify the method to determine 10-min intervals.
The basic measurement of a voltage sag (dip) and swell shall be the Urms(1/2) on each measurement
channel.
NOTE
- 1: For class A, the cycle duration for Urms(1/2) depends on the
frequency. The frequency might be determined by the last non-flagged power
frequency measurement, or by any other method that yields the uncertainty
requirements of Section 5.
NOTE
- 2: The Urms(1/2)
value includes, by definition, harmonics, interharmonics, ripple control
signals, etc.
The sag (dip) threshold is a percentage of either Udin or the sliding
voltage reference Usr
(see 5.4.4). The user shall declare the reference voltage in use.
NOTE:
Sliding voltage reference Usr
is generally not used in LV systems. See IEC 61000-2-8
for further information and advice.
–
On single-phase system, a voltage sag (dip) begins when
–
the Urms(1/2)
voltage falls below the sag (dip) threshold, and ends when the Urms(1/2)
voltage is equal to or above the sag (dip) threshold plus the hysteresis
voltage. This method is only resolvable to +/- ½ cycle, or,.
–
When the DC equivalent voltage drops (see Section 6.9)
below athe missing voltage
threshold and ends when the DC equivalent voltage is equal to or above the
missing voltage the
threshold plus the hysteresis voltage.
–
On poly-phase system a sag (dip) begins
o
when the Urms(1/2)
voltage of one channel, at least, is below the sag (dip) threshold and
ends when the Urms(1/2)
voltage on all measured channels is equal to or above the sag (dip)
threshold plus the hysteresis voltage.
This method is only resolvable to +/- ½ cycle.
o
When the DC equivalent voltage drops below athe
missing voltage threshold and ends when the
DC equivalent voltage is equal to or above the missing voltage
threshold plus the hysteresis voltage.
–
The sag (dip) threshold and the hysteresis voltage are both set by the
user according to the use.
A voltage sag (dip) is characterizsed
by a pair of data, either retained voltage (uret) or depth and
duration.
–
The retained voltage is the smallest Urms(1/2) value measured on
any channel during the sag (dip).
–
The depth is the difference between the reference voltage (either Udin
or Usr) and the retained voltage. It is generally expressed in % of
the reference voltage.
–
The duration of a voltage sag (dip) is the time difference between the
beginning and the end of the voltage sag (dip).
–
Missing voltage (see Annex 6.5) can provide a different precision on the
beginning and ending on the DC equivalent voltage to what:
–
an ASD experiences for
over/undervoltage measurements.
–
Contactors respond to. [RANDY]
–
Sliding window can provide an interpretative beginning and ending on the
DC equivalent voltage for utility benchmark methods.
NOTE
- 1: The sag (dip) duration measurement can be started on one channel and
terminated on a different channel.
NOTE
- 2: Voltage sag (dip) envelopes are not necessarily rectangular. As a
consequence, for a given voltage sag (dip), the measured duration is dependent
on the selected sag (dip) threshold value. The shape of the envelope may be
assessed using several sag (dip) thresholds set within the range of voltage sag
(dip) and voltage interruption thresholds detection.
NOTE
- 3: Typically, the hysteresis is equal to 21
to 2 % of Udin.
NOTE
- 4: Sag (dip) thresholds are typicallye.
g. in the range 85 % to 90 %
of the fixed voltage reference for
troubleshooting or statistical applications, and 70 % for contractual
applications.
NOTE
- 5: Retained voltage is often useful to end-users, and may be preferred
because it is referenced to zero volts.
In contrast, depth is often useful to electric suppliers, especially on
HV systems or in cases when a sliding reference voltage is used.
NOTE
- 6: Phase shift may occur during voltage sag (dip)s. See Section 6.4.
NOTE
- 7: When a threshold is crossed, it may be useful to record the date and time.
The swell detection threshold is a percentage of either Udin. or the sliding
voltage reference Usr
(see 5.4.4). The user shall declare the reference voltage in use.
NOTE Sliding voltage reference Usr is generally not used in
LV systems. See 61000-2-8 for further information and advice.
– On single-phase system a swell
begins when the Urms(1/2) voltage is above
the swell threshold, and ends when the Urms(1/2) voltage is equal to
or below the swell threshold minus the hysteresis voltage.
–
– On
poly-phase system a swell begins when the Urms(1/2) voltage of one
channel, at least, is above the swell threshold and ends when the Urms(1/2) voltage on all
measured channels is equal to or below the swell threshold minus the hysteresis
voltage.
–
DC Equivalent wording supplemented by R,A,E.
The swell threshold and the hysteresis voltage are both set by the user
according to the use.
A voltage swell is characterised by a pair of data, maximum swell
voltage magnitude and duration.
– The maximum swell magnitude
voltage is the largest Urms(1/2) value measured on
any channel during the swell.
– The
duration of a voltage swell is the time difference between the beginning and
the end of the swell.
NOTE
- 1: The swell duration measurement can be started on one channel and
terminated on a different channel.
NOTE
- 2: Swell envelopes may not be rectangular. As a consequence, for a given
swell, the measured duration is dependent on the swell threshold value.
NOTE
- 3 Typically, the hysteresis is equal to 1- to 2 % of Udin.
NOTE
- 4: Typically, the swell threshold is typically
greater than 105 to 110 % of Udin
NOTE
- 5: Phase shift may also occur during voltage swells.
NOTE
- 6: When a threshold is crossed, it may be useful to record the date and time.
If a sliding
reference is chosen for voltage sag (dip) or swell detection, this shall be
calculated using a first-order filter with a 1-min time constant. This filter
is given by:
Usr(n) = 0,9967 x Usr(n–1) + 0,0033 x U(10/12)rms
where
Usr(n)
is the present value of the sliding reference voltage,
Usr(n–1)
is the previous value of the sliding reference
voltage, and
U(10/12)rms
is the most recent 10/12-cycle r.m.s. value.
When the measurement
is started, the initial value of the sliding reference voltage is set to the
declared input voltage. The sliding reference voltage is updated every
10/12-cycles. If a 10/12-cycle value is flagged, the sliding reference voltage
is not updated and the previous value is used.
·
For class A
performance
The
uncertainty shall be DU = ±0,2 % of Udin.
·
For class B
performance
The manufacturer shall specify the
uncertainty. In all cases the uncertainty DU shall be
±1,0 % of Udin.
·
For class A and
class B performances
The uncertainty of a sag (dip) or swell duration is
equal to the sag (dip) or swell commencement uncertainty (half a cycle) plus
the sag (dip) or swell conclusion uncertainty (half a cycle).
The
measurement of a specific characteristic can be adversely affected by the
application of a disturbing influence (influence quantity) on the electrical
input signal; e.g. the measurement of supply voltage unbalance can be adversely
affected if the voltage waveform is at the same time subject to a harmonic
disturbance.
The
result of a parameter measurement shall be within the specified uncertainty given
in this section when all other parameters are within their range of variation,
given in the Tables 5-1 and 5-2.
Table 5-1 – Range of influence quantities (of the input
signals) for class A performance
|
Influence
quantities |
Range
of variation |
|
Frequency |
42,5 Hz
– 57,5 Hz for 50 Hz systems 51 Hz
– 69 Hz for 60 Hz systems |
|
Voltage
magnitude (steady state) |
0 %
– 200 % of Udin |
|
Flicker
(Pst) |
0 –
20 |
|
Unbalance |
0 %
– 5 % |
|
Harmonics
(THD) |
Twice the values in IEC 61000‑2-4,
class 3 |
|
Interharmonics
(at any frequency) |
Twice
the values in IEC 61000‑2-4, class 3 |
|
Mains
signalling voltage |
0 –
9 % of Udin |
|
Transient
voltages according to IEC 61180 |
6 kV
peak |
|
Fast
transients |
4 kV
peak |
NOTE: Pst shall be
produced by periodic modulation.
Table 5-2 – Range of influence quantities (of the input
signals) for class B performance
|
Influence
quantities |
Range
of variation |
|
Frequency |
42,5 Hz
– 57,5 Hz for 50 Hz systems 51 Hz – 69 Hz for 60 Hz systems |
|
Voltage
magnitude (steady state) |
0 %
– 150 % of Udin |
|
Unbalance |
0 %
– 5 % |
|
Harmonics
(THD) |
Twice
the values in IEC 61000‑2-4, class 3 |
|
Interharmonics
(at any frequency) |
Twice
the values in IEC 61000‑2-4, class 3 |
|
Mains
signalling voltage |
0 –
9 % of Udin |
Annex A (informative)
This section contains a series of characteristics that can be derived from the waveshapes and RMS calculations recorded during a sag (dip) or swell. Depending on the monitoring requirements and the loads that are potentially affected by the RMS variations, different characteristics may be more useful than others to the user. This standard does not require that any or all of these characteristics be included in either Class A or B instruments, though it is recommended to include such either with in the instrument or within software used to post-process the captured data.
The difference between the start and end times.
The highest RMS value of the waveform during the sample set.
The lowest RMS value of the waveform during the sample set.
The average of the RMS value between the sag start and end times.
A trained human observer could look at a disturbance and tell when it began and ends by inspection. Unfortunately, the rms method does not determine these values properly. As mentioned previously, the total duration of an rms sag could be as much as a cycle in error (too long) due to the averaging of the moving window. The rms moving window cannot give accurate point in wave of sag initiation or recovery either.

Figure 1. A clean sinusoidal sag and the rms value using a one-cycle moving window. The depth is 0.5 pu and the duration is 5 cycles.
These algorithms attempt to replicate the human observer and determine when the actual waveform deviates from the ideal waveform and when it recovers. We will call these values the “apparent” values. This technique uses two envelopes which surround the pre-event (ideal) voltage waveform by ± 5% and ± 10%. The algorithm proceeds as follows:
When the disturbance waveform deviates from the ideal by 10% (i.e., falls outside of the 10% envelope), the event is “detected.”
The algorithm “backs-up” to see where the waveform fell outside of the 5% envelope for the last time, and that is used as the beginning (start) of the event. (This helps pick-up on the initiation of the event more accurately, without having false reporting of minor variations in voltages that were not of significance.)
·
The start of the sag is
the point where the last excursion outside of the ±5% band began.
·
When the disturbed
waveform returns inside the 10% band for at least 1/2 cycle, the sag is deemed
recovered.
·
The initial point at
which the 1/2 cycle of recovery occurs is the point of recovery. (The 10% band was chosen since most sags do
not recover to within 5% in the data set intervals.

·
Apparent Sag
Start: The point at which the voltage
falls outside of the 5% envelope as described previously.
·
Apparent Sag End: The point at which the voltage returns to
the 10% envelope as described previously.

·
Point-of-initiation: The angle at which the “apparent sag start”
occurs using the last positive-going zero crossing as the reference angle.


·
Point-of-recovery: The angle at which the “apparent sag end”
occurs using the last positive-going zero crossing as the reference angle.

·
Apparent Sag Duration: The difference of Apparent Sag End and
Apparent Sag Start.
·
Difference in
Duration: The difference in the sag
duration given by the apparent method and the rms method (in seconds).
If the voltage sag were purely
sinusoidal in waveshape, then this computation would be straightforward. Unfortunately, the waveforms are often
distorted and the computation of a phase angle is not easy since the harmonic
components will have phase angles as well.
Two acceptable methods:
·
The Zero Crossing
Method
·
The Fundamental Phase
Angle

Figure
x. A single-phase 75% sag on Phase B
without phase shift resulting in a phase shift and sag for voltages Vab and Vbc but no change for Vca.

Figure
4. A 75%, 50° phase-shifted voltage sag on phase B
resulting in a swell and phase shift on voltage Vab and
a sag and phase shift on voltage Vbc.
Ideally, a sinusoid crosses the zero axis twice per
cycle, 180 degrees apart. Thus, if the
phase angle of the waveform shifts and the basic waveshape does not change, the
phase shift could be detected by examining the zero crossings. Of course, any noise or distortion which
causes the zero crossings to occur multiple times per half cycle, or where
there is severe waveform distortion, will render this technique of limited
value. To minimize the effect of noise,
an averaging technique is employed which uses a ¼ cycle moving window. The zero crossing is said to take place when
half the samples in the window are greater than zero and half are less than
zero.
The zero crossings of the actual waveform are
compared to those of the reference waveform.
The difference in time (phase angle) of the two waveforms is then
reported as the phase shift. The phase
shift is inherently “jumpy” when observed on a continuous time graph since the
phase can only be computed two times per cycle (at the zero crossings). The phase angles are then connected with
straight lines.
The Discrete Fourier Transform (using an FFT) is used
to compute the dc, fundamental (60 Hz component), and harmonics of the waveform
using a one-cycle window. The
fundamental component is the 60 Hz component which is normally desired. Many electronic devices incorporate filters
which strip away all unwanted (non-60Hz) components. Therefore, the phase angle reported by the DFT will be similar to
the one seen by many types of equipment.
Since the DFT needs a periodic signal, a one-cycle
window is used. This “averages” a
signal which is varying in much the same way the rms calculations will.
The DFT returns the real and imaginary parts of the
waveform at each frequency component, A+jB. The magnitude and phase angle is computed
from these. The phase angle is a single
value, so it is outputted at the center of the window.
The phase angle needs to be a continuous
function. Since the phase angle is
computed as the difference in the phase angle of the fundamental component of
the disturbed waveform and the phase angle of the ideal waveform, angular
difference can exceed ±360o. The arctangent function, from which the
phase angle is computed, will only report an angle between –180o and
+180o. Therefore, as the
phase angles are subtracted from each other over a discontinuity, a
discontinuity in the phase angle plot will occur. While not incorrect (e.g., 180o = 540o),
the phase angle plot will be difficult to interpret. An alternative method to determine the phase angle without
resulting in a discontinuity was developed where the functions are subtracted
from each other before the arctangent is taken.
If the fundamental component has a rectangular form
of A+jB and the ideal fundamental
component is C+jD, then the phase
shift is computed from:
![]()
·
Phase Shift: The phase angle between the ideal waveform
and the disturbed waveform using either the zero crossing technique or the DFT
fundamental method.
·
Phase Shift at Sag
Start (Df): This is computed in two
different ways. One is using zero
crossings and the other is using the DFT values. When using zero crossings, the phase shift computed at the first
zero crossing after the “disturbed sag start.” When using the DFT method, the
value is computed ½ cycle after the sag start.
·
Maximum Phase
Shift: The maximum phase angle recorded
between the “apparent sag start” and “actual sag end” times.
·
Minimum Phase Shift:
The minimum phase angle recorded between the “apparent sag start” and “actual
sag end” times.
·
Average Phase Shift:
The average phase angle recorded between the “apparent sag start” and “apparent
sag end” times.
·
Maximum ± df/dt (rate of change or “slew rate” of phase angle): This is the rate of change of the phase
angle during the interval. The initial
change at the “sag start” and then final change at the recovery is not included
in this calculation since the sharp discontinuity which usually accompanies the
beginning and end of the event will cause a very high and meaningless value.


·
The actual
waveform is subtracted from the nominal waveform.
·
The result is
rectified to give all positive numbers.
·
The voltage is
subdivided into 5% bands.
·
The missing
voltage is reported as the peak value that falls into one of the bands at a
specific instant of time.
·
Another method is
to use one similar to the rectangular method for sag depth, calculating the
largest RMS value of the missing voltage waveform.
·
The amount of time
(total number of sample points) that the missing voltage falls into a
particular band (e.g., 30% to 35%) is tabulated onto a bar graph.
· The cumulative time that the missing voltage is greater than or equal to a particular value (i.e.,