The Working Group uses a reflector at STDS-1450@LISTSERV.IEEE.ORG. You may join the group and stay current on STIL topics by sending an email to STDS-1450@LISTSERV.IEEE.ORG, and in the body of the email state: subscribe stds-1450.
The original STIL effort (now known as IEEE Std. 1450.0-1999) was purposefully scoped to expand. There are currently seven additional standards projects in the STIL effort. The Individual Activities below identifies these projects.
Quick Links: Current Status/Overview Individual Activities Calendar Minutes of Overview Meetings
A summary of the intent, purpose, and current directions of the activities associated with IEEE 1450.
IEEE Std 1450-1999 is available from the IEEE Standards Association. The standard can be found under the Test Technology Standards reference. In addition, a Representative BNF for IEEE Std 1450-1999 (PDF format) is available here. This BNF was generated with the goal of providing a simplified introduction to STIL. As such, it is an incomplete representation of the language, and the Standard Document must be used to completely specify the language. Still, this serves to orient newcomers to the constructs of STIL. Also, the Clarifications for IEEE Std 1450-1999 (PDF format) is available here. This document is maintained by the STIL Working Group and is updated on an as-needed basis.
A series of dotted extension projects have been created to address issues identified to be outside the scope of the initial project. See the table below for information about each effort effort.
|1450.0-1999||Standard Test Interface Language (STIL) for Digital Test Vectors||
Partial BNF (pdf);
|Greg Maston||Published August 1999|
|1450.1-2005||Extensions to STIL for Semiconductor Design Environments||
extension request (doc)
|Tony Taylor||Published - June 2005|
|1450.2-2002||Extensions to STIL for DC Level Specification||PAR (pdf)||Greg Maston||Published - December 2002|
|P1450.3||Extensions to STIL for Tester Target Specification||
extension 1 (to dec 12, 2005)
extension 2 (to dec 12, 2006)
|Tony Taylor||Approved: Published - September 2007||P1450.4
||Extensions to STIL for Test Flow Specification
O'Reilly||in Working Group
||Extensions to STIL for Semiconductor Test Method Specification
dropped, will be re-started after completion of P1450.4||1450.6-2005||Extensions to STIL for Core Test Language (CTL) Support
|| Rohit Kapur||
Approved - 2005
Extensions to STIL for Analog and Mixed Signal||
PAR being created
Extensions to STIL for Design Information - path delay, physical layoute, more
Proposal by Al Crouch