STIL (IEEE Std. 1450-1999) Extensions Projects

For submittal to the New Standards Committee of the IEEE Standards Board.
Attached are copies of 5 PAR documents. All are associated with extensions to the IEEE Std. 1450-1999. The base 1450 standard has a limited scope in order to satisfy the most critical need for a standard test pattern language. There has been continued interest in expanding this standard to encompass other areas related to semiconductor test program definition. Several face to face meetings and phone conferences have resulted in the proposed project set.
Five separate projects have been established for two reasons. First, the areas encompassed by each area are quite separable in terms of the problem and scope that they are addressing. Secondly, the demand and anticipated time frame for completion is different. It was therefore thought best to set these projects up with the intent of having separate ballots and release dates for each one.
The projects are to be managed by one working group which is a carry over from the IEEE Std. 1450-1999 working group with 5 sub-groups, each  focused on one of the 5 specific areas. Bringing all projects together at the working group level will keep all 5 efforts consistent with each other, and consistent with the original base standard.

P1450.1: Extensions to STIL (IEEE Std. 1450-1999) for Semiconductor Design Environments

Estimated completion date: Q1/2000

Interest Level: The level of interest in this work is extremely high. Companies interested in pursuing this standard are the EDA tool companies, and the users of EDA tools. Also, the P1500 working group is depending on extensions to STIL to support test patterns for embedded cores.

P1450.2: Extensions to STIL (IEEE Std. 1450-1999) for DC Level Specification

Estimated completion date: Q1/2000

Interest Level: The level of interest in this work is high as it provides a missing piece of data needed to migrate test patterns onto ATE equipment. Companies interested in this standard are the ATE companies and the users of ATE equipment.

P1450.3: Extensions to STIL (IEEE Std. 1450-1999) for Tester Target Specification

Estimated completion date: Q3/2000

Interest Level: The interest in this extension is mainly with the ATE companies, and the large users of ATE equipment who need to be able to specify precisely how a test program is to be loaded and executed on an ATE system.

P1450.4: Extensions to STIL (IEEE Std. 1450-1999) for Test Flow Specification

Estimated completion date: Q3/2000

Interest Level: This extension has received much interest by the ATE users and ATE tool vendors who create test programs. This extension allows them to define a fully functional test program.

P1450.5: Extensions to STIL (IEEE Std. 1450-1999) for Semiconductor Test Method Specification

Estimated completion date: Q2/2001

Interest Level: This extension addresses the need to specify how the components of a test are to be executed on the ATE equipment. The interest level for this is mainly in the ATE companies and ATE equipment users who are responsible for the application of test programs. The later completion date reflects the need to get the involvement of ATE companies in this effort.