P1450.1: Extensions to STIL (IEEE Std. 1450-1999) for Semiconductor Design Environments
Estimated completion date: Q1/2000
Interest Level: The level of interest in this work is extremely high. Companies interested in pursuing this standard are the EDA tool companies, and the users of EDA tools. Also, the P1500 working group is depending on extensions to STIL to support test patterns for embedded cores.
P1450.2: Extensions to STIL (IEEE Std. 1450-1999) for DC Level Specification
Estimated completion date: Q1/2000
Interest Level: The level of interest in this work is high as it provides a missing piece of data needed to migrate test patterns onto ATE equipment. Companies interested in this standard are the ATE companies and the users of ATE equipment.
P1450.3: Extensions to STIL (IEEE Std. 1450-1999) for Tester Target Specification
Estimated completion date: Q3/2000
Interest Level: The interest in this extension is mainly with the ATE companies, and the large users of ATE equipment who need to be able to specify precisely how a test program is to be loaded and executed on an ATE system.
P1450.4: Extensions to STIL (IEEE Std. 1450-1999) for Test Flow Specification
Estimated completion date: Q3/2000
Interest Level: This extension has received much interest by the ATE users and ATE tool vendors who create test programs. This extension allows them to define a fully functional test program.
P1450.5: Extensions to STIL (IEEE Std. 1450-1999) for Semiconductor Test Method Specification
Estimated completion date: Q2/2001
Interest Level: This extension addresses the need to specify how the components of a test are to be executed on the ATE equipment. The interest level for this is mainly in the ATE companies and ATE equipment users who are responsible for the application of test programs. The later completion date reflects the need to get the involvement of ATE companies in this effort.