IEEE STANDARDS PAR FORM (1/96) Fill in the answers to the questions in the bracket provided. A Hard Copy of this document must be printed, signed with the appropriate signatures and mailed or faxed to the Standards Department for submission to NesCom. 1. Sponsor Date of Request 19 April 1996 2. Assigned Project Number (confer with staff) P1450 3. PAR Approval Date (leave blank) ________________________ 4. Project Title, Copyright Agreement and Working Group Chair for This Project I will write/revise a Standards Publication with the following TITLE (Spell out all acronyms) [X] Standard [for] (Document stressing the verb "SHALL."), or [ ] Recommended Practice for (Document stressing the verb "SHOULD.") or [ ] Guide for (Document stressing the verb "MAY.") TITLE: Standard Test Interface Language (STIL) for Digital Test Vector Data I hereby acknowledge my appointment as Official Reporter (usually the W.G. Chair) to the (Name of Working Group) STIL Working Group In consideration of my appointment and the publication of the Standards Publication identifying me, at my option, as an Official Reporter, I agree to avoid knowingly incorporating in the Standards Publication any copyrighted or proprietary material of another without such other's consent and acknowledge that the Standards Publication shall constitute a "work made for hire" as defined by the Copyright Act, and, that as to any work defined, I agree to and do hereby transfer any right or interest I may have in the copyright to said Standards Publication to IEEE. Signature of Official Reporter ______________________________________________ Name Gregory A. Maston Date 19 April 1996 Company Motorola, Inc. Address 1300 N Alma School Rd, CH290 City Chandler State AZ Zip 85224 Telephone 602-814-4596 Fax 602-814-4963 E-Mail maston@chdasic.sps.mot.com 5. Describe this project: (Choose ONE from each group below) a. [ ] Update an existing PAR [ ]Yes or [ X]No If YES, project number/approval date)_______________________ Is this in ballot now? [ ]Yes or [X]No b. [X] New Standard [X]Yes or [ ]No [ ] Revision of an existing standard. [ ]Yes standard number/year______________________ or [ ]No [ ] Supplement to an existing standard [ ]Yes standard number/year______________________ or [ ]No c. [ X] Full Use (5-year life cycle) [ ] Trial Use (2-year life cycle) d. Fill in target completion date for submittal to IEEE Standards Review Committee (RevCom). October 1996 6. Scope of Proposed Project (What is being done including the technical boundaries of the project?) This project is to define a standard language that: a) Facilitates the transfer of large volumes of digital test information from Computer-Aided Engineering (CAE) environments to Automated Test Equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of test vectors to a Device Under Test (DUT); c) Supports the large volume of test information generated from structured test such as scan/Automatic Test Pattern Generation (ATPG), integral test techniques such as Built-In Self Test (BIST), and functional test specification for Integrated Circuit designs and their Assemblies, in a format optimized for transportation and application in Automated Test Equipment (ATE) environments. 7. Purpose of Proposed Project [Why is it being done, including the intended user(s) and benefits to that user(s)] Existing CAE tools have unique and differing software output interfaces which are not portable into the unique and proprietary IC ATE input interfaces. Third party support environments have not kept pace with the test requirements of VLSIC device and test data generated from structured test (such as ATPG) or integral test techniques such as BIST. Definition of a standard to support representation of this data in an efficient optimal format is beneficial to three parties: the CAE vendors who must create this data, the IC vendors who must support and manipulate this data, and the ATE vendors who must accept this data. With a common standard between CAE and IC ATE environments, the generation, movement, and processing of this test data is greatly facilitated. This standard also allows for immediate access to test equipment supporting this standard, which benefits both ATE vendors and IC vendors reviewing this equipment. This standard will finally serve as a catalyst for the development of a set of standard third party interface tools to both test and design aspects of IC device generation. 8. Sponsor (Give full name; spell out all acronyms) Society/Committee: Computer Society/Test Technology Standards Committee 9(a.1) [ No] Are you aware of any patents relevant to this project? (If YES, attach explanation, or No) 9(a.2) [YES] Are you aware of any copyrights relevant to this project? (If YES, attach explanation, or No) Current work has relied on Intellectual Property in regards with: UTIC from Motorola, TDL from Texas Instruments, WGL from Summit Design, and EnVision from LTX Corp. All parties have preliminary release forms under review as part of a Study Group on this standard. 9(a.3) [YES] Are you aware of any trademarks relevant to this project? (If YES, attach explanation, or No) See Above (9(a.2)). Some names referenced in 9(a.2) are trademarked; the proposed standard will not use those names but clearances are still being pursued for content. 9b. [ YES]Are you aware of any other standards or projects with a similar scope? (If YES, attach explanation, or No) ATLAS from the IEEE addressess test with very general capabilities. EDIF-Test and WAVES are two additional standards under development, but neither have sufficiently narrow scope to address the particular problems being supported by this standard. DTIF, supported by SCC20, does not address the commercial marketplace. 9c. [Do Not Know ]Is this standard intended to form the basis of an international standard? (Yes, or if NO, attach explanation, or Do Not Know) 9d. [ No]Is this project intended to focus on health, safety or environmental issues? (If YES, attach explanation, or No, or Do Not Know) 10. Proposed Coordination/Recommended Method of Coordination (Coordination is accomplished in any of the following three ways: Circulation of Drafts or Liaison Membership or Common Membership.) 10a. Mandatory Coordination SCC 10 (IEEE Dictionary) Circulation of Drafts IEEE Staff Editorial Review Circulation of Drafts SCC 14 (Quantities, Units, and Letter Symbols) Circulation of Drafts 10b. IEEE Coordination requested by Sponsor: (Use additional page if necessary). If you believe your project will require a Registration Authority, please list IEEE RAC (refer to Working Guide). Sematech/ATE PTAB Common Membership EIA/EDIF/Test Technical Subcommittee Circulation of Drafts SCC 20 Circulation of Drafts If coordination is not required, please attach an explanation. 10c. Additional Coordination Requested by Others. (Leave blank. This will be completed by the Standards Staff). 11. Submitted by: (This MUST be the Sponsor Chair or the Sponsor's Liaison Representative to the IEEE Standards Board) Signature of Submitter___________________________________________ Name Pat McHugh