1 // General Notes for example for UseCase#2: 2 // This example is using syntax from the Draft14-02May05 document. 3 // Even though the syntax document sited has definitions for variables 4 // of "stil_block_type" and "real_var_type" and "var_type" representitives 5 // of these are not shown in this version of this example but will be 6 // added at a later time. 7 // ============================================================================= 8 9 TestMethodDefs { 10 // Test { // Integral TestMethod and need not be show here - shown for clarity 11 // InOut SoftBin DefaultFailBin = NoBin; // Default (STIL.4 defined parameters can not be replaced, only added to) 12 // Out Bool Failed; // Fail flag 13 // Out Integer Status; // For integer or bit-wise arithmetic 14 // Out NrwUnits Result; // Scalar (1 to N dimensioned array not covered) 15 // PreActions {} // STIL.4 defined actions can be replaced 16 // PostActions {} 17 // Fail OnCondition .Fail { 18 // BinAndStop; // Uses DefaultFailBin, set by derived Method (NoBin = no action) 19 // } 20 // Pass {} // No Condition (necessary|permitted) 21 // } 22 23 FuncTest { 24 Inherit Method Test; 25 In PatternExec; 26 In SignalGroup; 27 In Timing; 28 In DcSequence; 29 In DcLevels; 30 In PatBurst; 31 In DefaultFailBin; 32 Out Failed; // dkd-EW discussion: should have removed this line or change val 33 } 34 35 EZFuncTest { // when instantiated then a copy is made 36 Inherit Method FuncTest; 37 In PatternExec = "BasicFuncPatExec"; 38 In SignalGroup = "AllPins"; 39 In Timing = "BasicTiming"; 40 In DcSequence = "EZLevelsSeq"; 41 In DcLevels = "EZLevels"; 42 In PatBurst = "BasicBurst"; 43 In DefaultFailBin = "EZFuncTestFail"; 44 Out Failed; // dkd-EW discussion: should have removed this line or change val 45 } 46 } 47 48 TestObjectDefs { 49 FuncTest AtSpeedFuncTest { // Single entity, no copies 50 PatternExec = "BasicFuncPatExec"; // set pattern exec not declare 51 SignalGroup = "AllPins"; // set signalgroup 52 Timing = "AtSpeedTiming"; 53 DcSequence = "VddMinLevelsSeq"; 54 DcLevels = "VddMinLevels"; 55 PatBurst = "BasicBurst"; 56 DefaultFailBin = "AtSpeedFuncTestFail"; 57 } 58 Flow BasicFuncTests { 59 FlowNode EZFunc { // FlowNode Name not required 60 Execute SetCategory EZ_ACSpec; // Integral Method 61 Execute SetSelector Typ; // Integral Method 62 Execute Method EZFuncTest; 63 } 64 FlowNode AtSpeedFunc { // FlowNode Name not required 65 Execute SetCategory AtSpeed_ACSpec; // Integral Method 66 Execute SetSelector Typ; // Integral Method 67 Execute TestObject AtSpeedFuncTest; 68 } 69 } 70 } 71 72 Program SingleTest { 73 EntryPoint { 74 OnLoad Execute Object NoOp; 75 OnPatternLoad Execute Object NoOp; 76 OnStart Execute Object BasicFuncTests; 77 OnReset Execute Object NoOp; 78 OnPowerDown Execute Object NoOp; 79 OnFinish Execute Object Finish; 80 OnLotStart Execute Object NoOp; 81 OnLotEnd Execute Object NoOp; 82 OnWaferStart Execute Object NoOp; 83 OnWaferEnd Execute Object NoOp; 84 OnSiteStart Execute Object NoOp; 85 OnSiteEnd Execute Object NoOp; 86 OnMultiSiteEnable Execute Object NoOp; 87 OnMultiSiteDisable Execute Object NoOp; 88 } 89 } 90