From: owner-stds-1450-4@majordomo.ieee.org on behalf of Don Organ
[don.organ@inovys.com]
Sent: Friday, July 26, 2002 12:04
PM
To: STIL. 4
Subject: stds-1450.4: STIL.4 meeting minutes
7/26/2002
July 26, 2002 10am
PDT
Dave
Dowding
Tom
Micek
Jim
O'Reilly
Don
Organ
Ernie
Wahl
Jim
Mosley
Previous Action
Items:
---------------------------------
- Jim is continuing
on bin strategy - will send to Dave by next week and posted on the web page soon
thereafter.
Agenda
Issues
----------------------
- Multisite status
review
- Continuation of
the issues list.
Ernie has a concern
as to whether multisite should be a phase I issue.
Dave has found that
about 80% of customers he surveyed are doing some form of multisite, so he feels
this is important. Tom concurs that it is very important within
Motorola.
Ernie's test program
generator deals with multisite, but feels the phase I priority should be to
focus on the flow issues without be delayed with multisite
considerations.
(Ernie sees phase I
as being capable of driving a translator to target various existing tester
languages, while phase II would be capable of driving a tester
directly.)
Dave announced that
this teleconference has been extended for two more months:
(866) 293-4896,
passcode=6928 Every other Friday from 10am-11am PDT.
Regarding looping:
Ernie has seen it in speed binning. Teradyne supports looping via a statement
that allows execution on a site-by-site basis, but that doesn't support gotos
(and so doesn't support looping). Looping has also been used as a "quick-fix" to
allow a simple form of retesting. Tom has seen looping for characterization
(such as a 1D shmoo plot).
Regarding
disabling/re-enabling: Why would a device need to be powered down and then later
powered back up? Dave: Field-programmable devices - you don't want to program
the device if it first fails a high speed test, then it shouldn't be subjected
to subsequent high-speed tests, before testing is continued with a lower speed
test.
Regarding isolation:
Jim may need to specify whether all pins are isolated, or clocks or power
supplies. Don - the language could provide an intent based way the device
engineer can indicate that this device requires power-supply isolation during
disabling (or clock isolation, or input signal isolation, or ...) and the ATE
specific tester targetting can determine how to implement for the particular
tester.
Next meeting we will
vote on each of these line items as to whether people consider it "essential"
for inclusion in a multisite standard.
-----------------------------------------------------------------
Don
Organ
Inovys Corporation
(925) 924-9110
x122
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