Larry Conrad opened the meeting by briefly previewing the agenda. Erich suggested that the new IEC test protocol be added to the agenda. The minutes of the Winter 2000 meeting held at the IEEE Distribution Subcommittee were approved. The TF was reminded that the minutes, as well as other TF documents, could be found on the TF web-site, grouper.ieee.org/groups/1453. Some documents on the web-site are protected, requiring an ID (wg1453) and password (flictage).

The 31 attendees made introductions.

Larry presented two items listed on the coordinating report. The IEC has two tests for consumer goods. The first, IEC 61000-3-3, describes the voltage drop an appliance may produce, and the test protocol for compliance. This standard covers appliances up to 16 amps and is required to obtain a CE stamp. Larry reminded the TF that the IEEE approach has been to not make product standards. The IEC standards cover appliances of all sizes. In order to relax limitations on appliances, a new document, IEC 61000-3-11, has been presented in case IEC 61000-3-3 can’t be met. As required by this standard, a label can be put on the product stating service limitations and/or a statement included in the instruction manual giving the system requirements from the utility.

The question was then asked why the IEC standard could not be accepted as is. Larry gave an example of the expected voltage drop from a 100A service and a discussion ensued. The following was presented as an aid to discussion:

Zref=0.4+J0.25 Ohm at 230V yields 40V drop from 100A service.

Larry reviewed the differences in the US and European distribution systems for those new to the TF. Within the time frame of our PAR, we will address the differences between these approaches. The CD went out to committee in February and then it will go out as a CDV (Committee Draft for Vote). The timing for this, however, may pass the limit of our PAR. Larry is considering holding an IEC meeting to discuss 61000-4-15.

Larry is waiting on putting together a balloting committee to make sure coordinating groups receive minutes of our meetings.

The TF’ Voltage Flicker tutorial, per Mark, is set for the 01Winter and 01Summer Power meetings. The tutorial is essentially put together and Mark is waiting to hear from the IEEE for exact dates for the tutorial. The question was asked if the TF would like to review the tutorial material by placing the information on our web-site. Mark will prepare the information for placement on the web-site. Larry asked if there were those that had interesting experiences, pertaining to the use of the IEC flicker method, that would be beneficial to others. Stephen Middelkauff, Duke, related a case where a Pst=1.04 created objectionable flicker to customers. Larry proposed an agenda item for next TF meeting to allow several 10-min. cases where there were flicker issues. Steven, Erich, Afroz, Ken, Mike, James, and Tom each volunteered to make a presentation. Issues like the use of different size light bulbs, different lamp technologies, cases above and below Pst=1.0 that didn’t or did cause problems, etc are good candidates. The next meeting will concentrate on problem issues with meters during the first hour of presentations followed by a second hour to discuss possible solutions. Mark asked if some of the above mentioned presentations could be included in the tutorial. This would require submission within about one month for inclusion within tutorial. Larry requested that a one-page description be sent to Mark, Larry and Reuben.

Set up TF tutorial information on the web.

Receiving case studies of examples of good and bad experiences with the IEC flicker method.

The development of a PAR for accessing flicker will be postponed until the Winter 2001 meeting.

Draft 1 to be rewritten as Draft 2 by Larry within a month.

Roger covers the shape factor reference paper prepared by James in his tutorial material so that action item has been done.

Paper on the transition from old GE curve to IEC method.

Erich – Testing flicker meters and discrepancies between those tested by PEAC. From that document, a test protocol is being developed by CIGRE/UIE as a guide. This will take several years to complete. PEAC’s test showed several areas that led to differences in meter readings due to interpretation of the protocol. One area was high Pst readings due to the presence of interharmonics. Others presented aliasing due to lack of appropriate filters. Still others showed problems due to inadequate bandwidth. Improper implementation of the classifier resolution range caused other problems. Input AGC time constant is specified yet is not handled properly by some manufacturers. The group is taking the procedure Tom put together and rearranging some of them to present a more orderly test method. Erich will forward some notes to Reuben for posting on the web site. There are several different classes of meters presented in 61000-4-30. One other subject covered will be a standard digital reference implementation based on work from Mambaurer. Sampling jitter and PLL synchronization were other issues. The purpose is to insure consistent readings between different implementations.

Discussion of IEC assessment method. – This covers the three stages of acceptance as well as setting planning levels. Stage 1 is a Go/No go to connect a load. Stage 3 is accepted at some level of risk. This represents the two extremes. Stage 2 uses an allocation of resource calculation that is somewhat complex. This is described in 61000-3-7. These topics will be the purpose of the next PAR. The existing PAR pertains to metering so this topic will be placed on hold until such time as that PAR is in place. This subject, however, is Mark’s topic in the tutorial session.

The next meeting of the TF will be at the 2001 Winter PES meeting in Columbus, OH.