IEEE P1500
Standard for Embedded Core Test (SECT)



Welcome to the home page of the IEEE P1500 Working Group on a Standard for Embedded Core Test (SECT).



General Information


History

IEEE P1500 SECT started in 1995 as a TAC of the TTTC (Test Technology Technical Council) of the IEEE Computer Society. In June 1997, the IEEE Standards Activities Board has approved our Project Authorization Request, hence since then we are formally considered a standardization Working Group. IEEE P1500 currently targets a draft standard for non-merged digital logic and memory cores to be ready for ballot in 2001. Future extensions will include mergeable cores and analog and mixed-analog/digital cores.

Mission Statement

The following is taken from the Project Authorization Request to the IEEE.

Activities

People


IEEE P1500 SECT Task Forces


The main technical work of P1500 is done in the following Task Forces.
Task Forces have regular meetings, either face-to-face or via conference calls. If you are interested in contributing to the technical work done by the Task Forces, please contact their respective chair persons.


IEEE P1500 SECT Meetings


P1500 Working Group meetings open to everyone. The meetings are mostly scheduled around major conference in the domain of IC design and test. The Task Forces present progress updates, and often there are other interesting presentations and/or discussions on the agenda.

Upcoming IEEE P1500 SECT Meetings

The following P1500 Working Group meetings are planned for the remainder of 2003.

Past IEEE P1500 SECT Meetings

Clicking on the meeting dates brings you to meeting minutes and presentation material (if available).

P1500 Meeting Attendance Record

Attendance at three of the past five consecutive official P1500 meetings is required to maintain voting privileges at P1500 meetings. For active members of the various P1500 Task Force meetings, one of the past five consecutive official P1500 meetings is required to maintain voting privileges. In addition, voting is limited to at most two votes per company or institute. The following table shows the P1500 meeting attendance record.


IEEE Workshop on Testing Embedded Core-based Systems


The 6th IEEE International Workshop on Testing Embedded Core-based Systems
(TECS'02) will be held in Monterey, California at the start of May 2002. The workshop will be immediately after the VLSI Test Symposium (VTS'02).


Useful Links



IEEE P1500 Working Group on Standard for Embedded Core Test (SECT)
<coretest@computer.org>

Alan Hales, Texas Instruments (alanh@ti.com)
Erik Jan Marinissen, Philips Research (Erik . Jan . Marinissen @ philips . com - e-mail address mangled to prevent spamming)
Last modified: June 24, 2003