PROGRAM at a GLANCE

The TECS 2000 Program Committee has selected topics of current interests and relevance:

	Wednesday, May 3, 2000
	2:00pm	-	6:00pm	Registration
	4:00pm	-	4:15pm	Opening Session
	4:15pm	-	6:45pm	Session 1: Current Practices in System-on-Chip Test
	6:45pm	-	8:00pm	Evening Reception
	8:00pm	-	9:30pm	Panel Session: The Role for Academic Research in SOC Test
	Thursday, May 4, 2000
	7:00am	-	8:00am	Continental Breakfast
	8:00am	-	10:00am	Session 2: New Approaches in Testing Embedded Cores
	10:00am	-	10:30am	Coffee Break
	10:30am	-	12:30pm	Session 3: Experiences in Testing Embedded Core-based Systems
	12:30pm	-	2:00pm	Lunch
	2:00pm	-	4:30pm	Session 4: Advanced Solutions for SOC Test and Verification

Paper Sessions: All four sessions at TECS 2000 are comprised of paper presentations followed by dedicated discussion panels to conclude the sessions with recommendations and roadmaps.

Keynote: Keynote: TECS 2000 starts with a keynote address that presents the trends, challenges, and key role of test technology in the SOC industry.

Panel Session: Panel Session: TECS 2000 features a full length panel on "The Role of Academic Research in SOC Test". The panelists represent commercial SOC test engineers, EDA tool vendors, and researchers. This panel is co-organized with IEEE Design & Test of Computers.

IEEE P1500 (Embedded Core Test Standard): The P1500 Working Group will hold its periodic meeting in conjunction with TECS 2000. The P1500 Working Group meeting will be held on May 5th, 8:00am-3:00pm. No registration is required to attend IEEE P1500 Working Group meeting.