PROGRAM at a GLANCE
PROGRAM at a GLANCE
 | Wednesday, April 28 | |||
| 2:00pm | - | 7:00pm | Registration | |
| 4:00pm | - | 4:45pm | Opening Session | |
| 4:45pm | - | 6:45pm | Session 1: Current Practices in System-on-Chip Test | |
| 6:45pm | - | 8:00pm | Evening Reception | |
| 8:00pm | - | 9:30pm | Panel Session: CAD Tools for Core Test | |
| Thursday, April 29 | |||
| 7:00am | - | 8:00am | Continental Breakfast | |
| 8:00am | - | 10:00am | Session 2: New Approaches in Testing Embedded Cores | |
| 10:00am | - | 10:30am | Coffee Break + Poster Session | |
| 10:30am | - | 12:30pm | Session 3: Experiences in Testing Embedded Core-based Systems | |
| 12:30pm | - | 1:30pm | Lunch | |
| 1:30pm | - | 2:30pm | Invited Session: The Prospects of Core Test: VSIA Manufacturing Test DWG | |
| 2:30pm | - | 4:30pm | Session 4: Advanced Solutions for SOC Testing | |
Paper Sessions: All four sessions at TECS'99 are comprised of paper presentations followed by dedicated discussion panels to conclude the sessions with recommendations and roadmaps.
Keynote: TECS'99 starts with a keynote address by Rene Segers, Philips Semiconductors, entitled: "Philips' Experiences in Core-based Design and Test of System ICs"
Panel Session: TECS'99 for the first time features a full length panel on "CAD Tools for Core Test". The panelists represent commercial EDA tool vendors, internal tool providers and users. This panel is co-organized with IEEE Design & Test of Computers.
IEEE P1500 (Embedded Core Test Standard): The P1500 Working Group will hold its periodic meeting in conjunction with TECS'99 immediately following the workshop. The P1500 Working Group meeting schedule is held in two parts:
