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WELCOME to the Printed and Organic Electronics Working Group. The purpose of this site is to facilitate development of standards and to establish a knowledge management asset site for standards related activities in the organic, inorganic, and molecular electronics space.

IEEE Standard P1620TM - 2004

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials


This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.


The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Purchase IEEE Std 1620TM-2004

Contact Information

Daniel Gamota
1301 East Algonquin Road
Schaumburg, IL 60196
Phone: 1-847-576-5084

Vice Chairman
Paul Brazis, Jr.
1301 East Algonquin Road
Schaumburg, IL 60196
Phone: 1-847-576-1561

Related Links
IEEE Printed Electronics Standards Go to this link.

Other Printed Electronics Working Groups
P1620.1 Go to this link.
P1620.2 Go to this link.

Copyright ©2007 IEEE-SA
(Modified: 03/09/2007)