IEEE HomeSearch IEEE ShopWeb Account Contact IEEE IEEE
IEEE-SA IEEE-SA Member Area Search our standards database for Abstract, Sponsor, Status, Contact,Ordering and Historical information. IEEE-SA Standards Association
   Text Size: Small Text Normal Text Larger Text

P1620.1TM
 Scope/Purpose Go to this link.

Overview of the IEEE Process Go to this link.

IEEE Call for Patents Go to this link.

Call for Volunteers Go to this link.
Join us now Go to this link.

Meeting Dates Go to this link.

Members Only Go to this link.

Status Report Go to this link.

 

IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor Based Ring Oscillators

Scope

This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.

Purpose

The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data.

Contact Information

Chairman Daniel Gamota
Motorola
1301 East Algonquin Road
Schaumburg, IL 60196
Phone: 1-847-576-5084
Email: gamota@motorola.com

Related Links
 IEEE Printed Electronics Standards Go to this link.

Purchase IEEE Std 1620TM-2004 Go to this link.

Other Printed Electronics Working Groups
1620 Go to this link.
P1620.2 Go to this link.
spacer
Copyright ©2007 IEEE-SA
(kentsui@motorola.com)
URL: http://grouper.ieee.org/groups/1620/1/index.html
(Modified: 03/09/2007)		 spacer