IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor Based Ring Oscillators
This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.
The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data.
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