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IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor Based Ring Oscillators


This is a full-use standard that specifies methods for the characterization of organic transistor-based ring oscillators. The methods are applicable to all ring oscillators fabricated from organic semiconductor materials and are independent of the fabrication process.


The purpose of this project is to develop a standard methodology to characterize organic transistor based-ring oscillators and to allow reporting of their performance and associated data.

Contact Information

Chairman Daniel Gamota
1301 East Algonquin Road
Schaumburg, IL 60196
Phone: 1-847-576-5084

Related Links
IEEE Printed Electronics Standards Go to this link.

Purchase IEEE Std 1620TM-2004 Go to this link.

Other Printed Electronics Working Groups
1620 Go to this link.
P1620.2 Go to this link.

Copyright ©2007 IEEE-SA
(Modified: 03/09/2007)