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IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor Based Ring Oscillators (P1620.1TM)

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IEEE Working Group P1620.1TM - Organic Electronics

The organic semiconductor space has received greater attention during the past few years, in part due to significant advances in materials performance and processing techniques. This activity has led to an increasing number of companies to commit to participating in this space, while many others have been conducting in-depth studies to determine the size of the opportunity for a variety of applications, e.g., ePaper, SmartPackaging, etc. One potential impediment to the introduction of this technology is the lack of a defined standard for characterizing organic transistor based ring oscillators. Also, methods for reporting performance and other data have not been established; each scientist or engineer has independently developed measurement procedures that may or may not be definitively comparable with the results of others. Without openly defined standard test methods the acceptance and diffusion of organic semiconductor technology will be severely impeded.

The IEEE Standards Association recently approved the creation of a new Working Group (WG), IEEE P1620.1TM, tasked with the development of a "Draft Standard for Test Methods for the Characterization of Organic Transistor Based Ring Oscillators". The WG will develop standard methods for the characterization of organic transistor based ring oscillators. These methods will be independent of processing routes used to fabricate the transistors and will be usable for all organic transistor based ring oscillators independent of materials systems.

The WG is now seeking technical expert volunteers to join the group with expertise in the following areas:

  • Organic transistor device electrical characterization
  • Organic circuit design and layout
  • Organic circuit electrical and reliability performance
  • High volume transistor manufacturing and in-line testing

The volunteers will help create testing standards that will be used by R&D, pilot scale, and high volume manufacturing as the technology is prepared for market introduction. Moreover, the standards will provide the necessary framework to ensure rigid procedures are followed for confirmation of data created at different locations. The IEEE P1620.1TM standard will provide the structure that will allow uniformity and enhance the value of data to provide for growth and technology diffusion. Users of this standard may include those who develop and supply materials and processing & testing equipment platforms, design and build products, subsystems, and networks. Volunteers with expertise in the areas detailed above are invited to join this WG.

Interested participants may join the Kickoff Working Group Meeting via teleconference (Detail in member area).

IEEE P1620.1TM Kick0ff Working Group Meeting
3 August 2004, Time 10:00 AM EDT (New York, U.S. Time)

If you are interested in joining the P1620.1TM Working Group or would like more information, please contact: Dan Gamota, Chairman at (847-576-5084). General information concerning the working group is available at the following URL:

The Institute Electrical Electronic Engineers (IEEE) is a non-profit, technical professional association of more than 350,000 individual members in 150 countries.

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Related Links
IEEE Printed Electronics Standards Go to this link.

Purchase IEEE Std 1620TM-2004 Go to this link.

Other Printed Electronics Working Groups
1620 Go to this link.
P1620.2 Go to this link.

Copyright ©2007 IEEE-SA
(Modified: 03/09/2007)