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IEEE Draft Standard Methods for the Characterization of Printed and Organic Diode Bridge Structures for RF Devices
Scope
This standard describes standard methods for the characterization of printed and organic diode bridges for RF devices. The methods are independent of processing routes used to fabricate the electronic devices.
Purpose
The purpose of this standard is to provide and suggest procedures for characterization and reporting of data. These methods are described for use as a uniform reporting standard that is intended to be applicable for characterizing and reporting both research results and manufacturing data, with its primary use expected to shift as printed electronics technology matures. The standard recommends the necessary tools and procedures for validation.
Contact Information
ChairmanPaul Brazis
Motorola
1301 East Algonquin Road
Schaumburg, IL 60196
Phone: 1-847-576-1561
Email: paul.brazis@motorola.com
Sponsor Nanotechnology Council Standards Committee Sponsor Chair: Daniel Gamota
Phone: 1-847-576-5084
Fax: 1-847-576-2111
Email: gamota@motorola.com
Sponsor Microprocessor Standards Committee Sponsor Chair: Bob Davis
Phone: 1-408-353-2706
Fax: 1-408-353-8116
