WELCOME to the Printed and Organic Electronics Working Group. The purpose of this site is to facilitate development of standards and to establish a knowledge management asset site for standards related activities in the organic, inorganic, and molecular electronics space.
IEEE Standard P1620TM - 2004
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.