Updated 19 March 2010
private area –password required
The
Subcommittee on Probe Standards (SCOPS) works under the Instrumentation and
Measurement Society Technical Committee TC-10, Waveform Measurement and
Analysis. The goal of SCOPS is to develop standards for characterizing the
performance of electrical circuit probes and probe systems, where these systems
may include waveform acquisition hardware and software and signal/waveform
analysis software, and the probe will include the mechanism by which the
circuit is contacted.
SCOPS is currently in the process of developing a standard for test methods and transfer (artifact) standards that will be used to characterize individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test. The scope of this standard, as stated in the Project Authorization Request is:
ÒThis standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance greater than the impedance of the circuit under test.Ó
The present work is only considering voltage probes, including high-voltage probes. Current and field probes are not being considered at this time by may be the topic of future standards. This work also includes the analog portion of logic probes.
More
information on the purpose and need for this work is described in the Project
Authorization Request (PAR) form (see link below) for this project, P-1696 -
Standard for Terminology and Test Methods for Circuit Probes. Upon completion of this activity and
approval by the IEEE, a standard will be published.
The
present activity includes identifying relevant performance metrics and
developing associated test methods for probing systems. Details of our work done thus far can
be found in the Òprivate area,Ó which requires membership to enter (see link
below).
SCOPS
is actively seeking new members.
Anyone who wishes to contribute to the development of the standard, such
as by contributing to the identification of performance metrics, drafting
descriptions of test methods, suggesting designs for artifact standards,
reviewing text and suggesting improvements, providing doughnuts at the
meetings, should contact the chairman at the link below.
Contact
the Chairman, Travis Ellis, at Travis.Ellis@samtec.com or the
Secretary, Jerry Blair, at j.blair@ieee.org
Review
the approved Project Authorization Request form at: PAR P1696
Information
on the IEEE standards development process, other working groups, etc. can be
found at: http://standards.ieee.org/stdsdev/index.html,
or links contained therein.
The
membership process is described in this document: SCOPS Membership Process. Membership forms and associated
instructions can be found here: TC-10
Home Page.
Seethe
Next Meeting section
of the TC-10 home page