|Thread Links||Date Links|
|Thread Prev||Thread Next||Thread Index||Date Prev||Date Next||Date Index|
Hi Jeff, all,
The diode data were provided by me.
They come from production data, so they consider the spread among different lots of production.
I also derived the linearized model, which is not coming from a measurement, but the linearization of the worst case operating points at 0.5A
This is the relevant slide of beia_1_0514.pdf.
Please let me know if you have any question
Sorry for my typo. My lab data showed only a 0.030V Vt mismatch, not a 0.30V mismatch…
The diode mismatch parameters I your presentation show a wide variation of threshold (.39V vs .53V) and a zero difference in resistance (0.25 ohms vs 0.25 ohms).
I have included my previous lab data on just six diodes which shows just the opposite: a threshold that is very close (Varying by only 0.30V) and a resistance that is wide (0.28 ohms vs 0.40 ohms).
Given that in the short channel case, the threshold offset is the major contributor to offset currents, I think we should change the values for the diode mismatch.