IEEE Standards Coordinating Committee 20 on
Test and Diagnosis for Electronic Systems

Sponsored by
IEEE Aerospace Electronic Systems Society
IEEE Computer Society
IEEE Instrumentation and Measurement Society

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Become a member of SCC20 (Bluesheet Form)

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Meeting Notice!

We plan on holding the meeting in conjunction with (and immediately before) AutoTestCon

September 6-8 (Saturday – Monday)

Click [Here] for Details on Meeting Location and Times (Top-Level Agenda)

Click [Here] for AutoTestCon Information

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Committees/Organization of SCC20

• SCC20 2008 Organization Diagram (GIF)
• Administrative Subcommittee
• Diagnostics & Maintenance Control Subcommittee (DMC)
• Hardware Interfaces Subcommittee (HI)
• Test and ATS Description Subcommittee (TAD)
• Test Information Integration (TII)
• Officer Nominations (Self-nomination) Forms

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Past SCC20 Meeting Minutes

• Check Logged Documents for Recent Minutes

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Administrative Papers of SCC20

• The Secretary’s Notebook
• Strategic Planning Working Group (SPWG) Report [ Word97 ], [ PostScript ], [ PDF ]
• Email Reflector Traffic for stds-scc20-steering@ieee.org
• Logged Documents

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In case you are relatively new to the IEEE, you may wish to visit the IEEE Home Page or the IEEE Standards Homepage .

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Again, thanks for visiting the IEEE SCC20 Homepage. We hope to hear from you again soon.

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This page was last modified on 12 August 2008 by Dave Droste

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