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  Working Groups
       - Automatic Test Mark-up Language          (ATML)
       - Diagnostic Maintenance and Control          (DMC)
       - Hardware Interfaces (HI)
       - Test and ATS Description (TD)

  Active Projects
       - IEEE P1445
       - IEEE P1514
       - IEEE P1636.2
       - IEEE P1641.1a
       - IEEE P1671.1
       - IEEE P1671.3
       - IEEE P1871.2
       - IEEE P1505.1
       - IEEE P1636

  Active Standards Status


  Document Repository (members only)



IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems
Established 1966

Sponsored by
IEEE Aerospace Electronic Systems Society
IEEE Comupter Society
IEEE Instrumentation and Measurement Society

Scope: Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and offboard) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintencance information, and major hardware subsystem interfaces between and within Automatic Test Systems.

Mike Seavey
Northrop Grumman

Chris Gorringe
Spherea Technology

Teresa Lopes