Reference to a pin of a connector. ID of the referenced connector. ID of the referenced pin. Reference to a pin of a component. ID if the referenced component. ID if the referenced pin. Enumeration of types for Electro Optical interfaces. Enumeration of severity levels for faults and failures. Warning: fault/failure may impact UUT functionality and has no long term impact on UUT reliability. Error: fault/failure impacts UUT functionality and impacts UUT reliability (i.e., life is shortened). Fatal: UUT is unusable. Enumeration of failure types. Detectable: The Failure can be detected by a functional test. NonDetectable: The Failure cannot be detected by any functional test. NonFunctional: The Failure can be detected by a functional test, but no repair action is required because the failure will not affect any higher assembly in any operating mode under specified service environmental conditions. Enumeration of fault types. DetectableInsertable: The Fault can be inserted into the UUT, and detected by functional tests at the channel, division or system level; performance of the functional tests will cause no adverse effect on the life-cycle of the UUT. DetectableDestructive: The Fault could be inserted into the UUT, and detected by functional tests; however execution of the functional tests may adversely affect the Life expectancy of the UUT or render the UUT unfit for use. NonDetectable: Fault identified by analysis that cannot be detected by functional test(s). Enumeration of signal types. Input: signal is received by the UUT. Output: signal is generated by the UUT. Bi-Directional: signal is both received and generated by the UUT. Load: signal describes a load applied to the UUT. Enumeration of signal roles. Source: signal is generated by an ATE resource. Sensor: signal is measured by an ATE resource. Monitor: signal is monitored by an ATE resourced. Load: an ATE resource applies a load to the UUT. Enumeration of signal characteristic roles. Control: the characteristic is controlled by an ATE resource. Limit: the characteristic is limited by an ATE resource. Measurement: the characteristic is measured by an ATE resource. Capability: the characteristic is related to the capacity of an ATE resource to satisfy a requirement, but is not required to be controlled, limited or measured. Enumeration of signal monitoring conditions. GT: Greater Than. LT: Less Than. Enumeration of possible values for Outcomes. Enumeration of possible values for comparison results. Enumeration of test types. PowerStimuliShort: verifies power or stimulus inputs to be not shorted prior to any stimulus application to the UUT. Performance: verifies proper operation of the UUT. Diagnostic: isolates faults within the UUT. Enumeration of decision locations for operation of type OperationRepeat. PreBody: decision is made before executing the body of the operation. PostBody: decision is made after executing the body of the operation. Information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT. Identifies the TSF Libraries referenced in the current instance document. These TSF Libraries describe the interface and behavior of IEEE 1641 signals used in the instance document. Refer to clause 6 of IEEE 1641 for information on describing TSF Libraries. Identifies one TSF Library by referencing the external XML documents that describe the interface and behavior of signals from the TSF Library. The XML Schema document defines the interface of the TSF Library. For each TSF Library, the file referenced by this element shall be identical to the file referenced by the xsi:schemaLocation attribute of the root element. Note: The previous constraint is not enforced by this XML schema. Consumer applications should verify the constraint programmatically. References the XML instance document that describes the interface and behavior of signals from the TSF Library. Descriptive name for the TSF library. Unique identifier, enables referencing of the TSF Library. UUT description by name and nomenclature. The presence of this element indicates that UUT Description data are provided in an external XML instance document compliant with the ATML UUT Description schema, referenced by the current instance document. The reference shall be specified in the child element DescriptionDocumentReference. The presence of this element indicates that UUT Description data are provided in the current instance document. The data shall be specified in the descendant elements of this element. Describes the UUT category, e.g., analog, digital, etc. Describes the physical characteristics of the UUT. Specifies one physical characteristic of the UUT. References to all documents, drawings, diagrams, parts lists associated with the UUT and its sub-assemblies (used to verify UUT operation). All of the general data that may be of use in developing test requirements and test programs. The characteristics of equipment and circuitry required to test the UUT, excluding the test equipment (e.g., UUT connector information). Specification of all UUT signal requirements for testing the UUT. This includes power requirements, stimulus requirements and sensor requirements. Detailed description of the performance characteristics of the UUT. All of the sufficient data for each UUT test to completely describe all input conditions and measurements required. UUT fault data, including faults and failures. Identifies the Automatic Test Program Generation (ATPG) tools used to generate the test program. Version of the instance document. UUT documentation (documents, schematics, drawings, etc.). Documents defined in this section can be referenced from other schema elements. In the case of elements of type c:NonBlankString, references shall be provided through XPath strings that specify the names of the referenced documents. See B.2.3 for an example. UUT Theory of Operation. Engineering data needed to acquire an understanding of the operation of the UUT in its intended environment. References the external document describing the Theory of Operation. Detailed operating instructions for the UUT. Applicable to UUTs whose performance is dependant upon operator interaction. Contains references to one or more external documents that contain operating instructions for the UUT. References one external document that contains operating instructions for the UUT. UUT Test Strategy Report. Describes the approach taken to combine factors (constraints, costs, execution times, etc.) that are to be applied to the testing of the UUT. References the external document that contains the Test Strategy Report for the UUT. UUT Failure Modes, Effects and Criticality Analysis (FMECA) report. References the external document that contains the FMECA report for the UUT. UUT configuration information (outline drawings). Contains references to one or more external documents that contain configuration information for the UUT. References one external document that contains configuration information for the UUT. UUT installation drawings (main drawings). Contains references to one or more external documents that contain installation drawings for the UUT. References one external document that contains installation drawings for the UUT. UUT assembly drawings (detail and subassembly) Contains references to one or more external documents that contain assembly drawings for the UUT. References one external document that contains assembly drawings for the UUT. UUT subassembly schematics, showing the circuitry contained within each module and subassembly. Include amplitude and frequency of each input and output, reference designators of each part and test points. Contains references to one or more external documents that contain module subassembly schematics for the UUT. References one external document that contains module subassembly schematics for the UUT. UUT specification control drawings for all nonstandard parts. Contains references to one or more external documents that contain specification control drawings for the UUT. References one external document that contains specification control drawings for the UUT. UUT wiring diagrams, showing the actual physical wiring arrangement. Wire Run Lists or tables supplement the diagram. Will include Printed Circuit layouts (location of components, junctions, terminals). Contains references to one or more external documents that contain wiring diagrams for the UUT. References one external document that contains wiring diagrams for the UUT. Detailed UUT logic diagrams. Contains references to one or more external documents that contain logic diagrams for the UUT. References one external document that contains logic diagrams for the UUT. UUT functional block diagrams, identifying parameters and associated signal tolerances at the external and internal interfaces. Contains references to one or more external documents that contain block diagrams for the UUT. References one external document that contains block diagrams for the UUT. UUT parts lists, specifying the component parts of each assembly or subassembly. Components will be listed by reference designator and manufacturers part number Contains references to one or more external documents that contain parts lists for the UUT. References one external document that contains parts lists for the UUT. UUT family tree, identifying each functional module and subassembly. Utilized to enable proper part number and configuration accountability of all UUT subassemblies and modules for which test requirements are defined. References the external document that describes the family tree for the UUT. Document describing UUT test requirements. References the external document describing test requirements for the UUT. Other documentation applicable to the UUT. Contains references to one or more external documents applicable to the UUT. References one external document applicable to the UUT. Provided to permit schema extensibility. General requirements information needed to support the tests described in the current instance document. All UUT AC and DC power source requirements for testing the UUT. Note that UUT power requirements can be described using this element, as well as the SignalRequirements element described in 4.6.274. If the instance document contains power requirements specified using both elements, these descriptions shall be consistent. DC power requirements for testing the UUT. Requirements for one DC power source. Requirement for voltage value, polarity and tolerance. The sign of the floating-point values defines their polarity. Maximum current requirement. Maximum ripple amplitude, including periodic and random variations. Connection of power supply terminals to UUT pins. Free-form descriptive information. AC power requirements for testing the UUT. Requirements for one AC power source. Requirement for voltage value and tolerance. Requirement for frequency value and tolerance. Maximum current requirement. Requirement for phase of AC voltage source. Phase reference. Connection of power supply terminals to UUT pins. Free-form descriptive information. Free-form descriptive information. Specification of any precautions or instructions necessary for personnel and equipment protection. Will include specification of any special handling (e.g., ESD) required by the UUT, or the specification of any general procedures and precautions associated with operating the UUT. All conditions required for proper and safe operation. Includes cooling air, hydraulic pressure, and pneumatic sources. Adjustment and alignment requirements. Special precautions and instructions regarding personnel and equipment protection in the presence of hazards such as high voltage, RF radiation, or Lasers. Special handling and maintenance requirements. Provided to permit schema extensibility. Identification of all special electrical components required to test the UUT. Identification of one special electrical component required to test the UUT. Identification of all special tools (e.g., card extenders) required to test the UUT. Identification of one special tool required to test the UUT. Provided to permit schema extensibility. All UUT signal requirements for testing the UUT. Note that UUT power requirements can be described using this element, as well as the PowerRequirements element described in 4.6.126. If the instance document contains power requirements specified using both elements, these descriptions shall be consistent. Describes one UUT signal requirement. Identifies the TSF class for the signal. Describes requirements for one attribute of the signal. Specifies the role of the signal characteristic, e.g., control, limit, measurement, capability. Signal role, e.g., source, sensor, monitor, load. Characteristics of equipment and circuitry required to test the UUT (excluding the test equipment). Description of electrical connectors and of their pins. Description of one connector and of its pins. Attribute Identification@designator shall be used to specify the reference designator of the connector (e.g., "J1"). Description of connector pins. Description of one connector pin. Describes the function of the pin, including pin designation, signal name, signal definition and signal description. Note: This element shall not appear for pins of type "Not Connected". Information for the wire that must be connected to the UUT. Describes the wire, including wire type (e.g., coaxial), wire size, etc. Describes wire dependencies (e.g., twisted with, shielded with). Describes one wire dependency. Description of the relationship (e.g. twisted with, shielded with). Note: The other wire that is part of the relationship is defined as descendant of the connector and pin referenced by the attributes of the current element. Used to describe "virtual pins", representing firmware variables that may be read during testing (similar to measurements performed on physical pins). Contains the command used to retrieve data from the firmware variable. Provided to permit schema extensibility. Unique identifier, enables referencing the connector pin. Pin number. May be numeric (e.g., "11") or alphanumeric (e.g., "A1b"), as applicable. Indicates if the pin is used for test purposes only (i.e., not used during normal UUT operation). Unique identifier, enables referencing the connector. Describes the type of the connector (e.g., analog, digital, power, optical). Describes the location of the connector on the UUT (e.g. front, back). Identifies the mating connector through free-form text (e.g., by part number) Indicates if the connector is used for test purposes only (i.e., not used during normal UUT operation). If a connector has @usedForTest = "true", all its pins are used for test purposes only. If a connector has usedForTest = "false", some of its pins (but not all) may be used for test purposes. Description of electrical test points. Description of a test point. May reference a test point provided on the circuit board, or a component pin accessible for manual probing. Describes the function of the test point, including pin designation, signal name, signal definition and signal description. Reference designator. Description of Electro-Optical interfaces to the UUT. Describes one Electro-Optical interface. Free-form description. Provided to permit schema extensibility. Interface type. Shall be one of: Laser, Infrared, Light, Other. Indicates if the interface is used for test purposes only (i.e., not used during normal UUT operation). Description of any fixtures required to verify operation of the UUT. This includes UUT mounting, holding and support fixtures, cooling carts, pneumatic function generators, hydraulic fixtures, etc. Describes one fixture. Fixture type (e.g., holding, pneumatic, hydraulic, cooling, etc.). Indicates if the fixture is used for test purposes only (i.e., not used during normal UUT operation). Description of signal conditioning requirements. Provided to permit schema extensibility. Describe the "performance" envelope of the UUT. The description shall contain sufficient detail that any "black box" with the characteristics described could be inserted in the system without degrading the system performance. Used to assure consistency at all levels of maintenance as well as compatibility between maintenance and Quality Assurance test results. All UUT inputs (e.g., electrical, optical, mechanical, etc.), defined along with their range and tolerances. Describes one input. Range and tolerance characteristics for the UUT input. Nominal value for the input physical characteristic. Range of values acceptable for the input physical characteristic. Lower range limit. Indicates that the lower range limit must be enforced by the ATE hardware. Upper range limit. Indicates that the upper range limit must be enforced by the ATE hardware. For example, the current limit for a DC Voltage source. Free-form note or description of range (e.g., "TTL"). Tolerance for the input physical characteristic. Absolute tolerance limits. Positive limit of absolute tolerance. Negative limit of absolute tolerance. Relative tolerance limits, expressed as ratio to the nominal value. Positive limit of relative tolerance, in percent. Negative limit of relative tolerance, in percent. Free-form note or description of tolerance. All UUT outputs, defined in terms of their range, accuracy, and relationship to the input conditions Describes one output. Range and accuracy characteristics of the output. Nominal value for the output physical quantity. Range of values expected for the output physical quantity. Lower range limit Upper range limit Free-form note or description of range (e.g., "TTL"). Accuracy for the output physical quantity. Absolute accuracy limits. Positive limit of absolute accuracy. Negative limit of absolute accuracy. Relative accuracy limits. Positive limit of relative accuracy, in percent. Negative limit of relative accuracy, in percent. Free-form note or description of accuracy. Identifies input-output relationships, for the current output. Describes the relationship between one UUT input and the current output. Free-form description of the relationship. ID of the related input. Identifies control-output relationships, for the current output. Describes the relationship between one UUT control and the current output. Free-form description of the relationship. ID of the related control. Controls and ranges of control for the UUT. Describes one control. Range characteristic of the control. Range of values acceptable for the value. Lower range limit. Upper range limit. Provided to permit schema extensibility. Initialization, performance, and diagnostic test information Identifies the test groups or tests that can be used as entry points for testing the UUT. For each entry point, test conditions are completely stated and are not dependent on previous tests or setups. Identifies one "test group" entry point. Unique identifier, enables the referencing of the entry point. ID of the test group specified as entry point. Identifies one "action" entry point. This can be a test or a session action. ID of the action specified as entry point. Identifies one of the entry points described through TestGroupEntryPoint child elements as the "primary" entry point of the program. The "primary" entry point is used in the absence of an entry point selection (e.g., by the operator). List of actions (tests and session actions) described by the instance document. Describes one action (test or session action). List of test groups described by the instance document. Describes one test group. List of state variables. Used to specify conditions for the execution of tests. Refer to B.3 for an example on using state variables to specify conditions. Describes one state variable. Free-form description for the state variable. Identifies the value assumed by the state variable when execution starts. ID of the element containing the initial value specified for the state variable. Lists the value that can be assumed by the state variable. All the values shall have identical data type, unit and qualifier. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Describes one value that can be assumed by the state variable. Unique identifier, enables referencing the value. Unique identifier, enables referencing the state variable. Name of the state variable. Identifies global signals, shared by multiple tests. Global signals will be created by and referenced from operations. Refer to B.4 for an example on using global signals. Describes one global signal, which may be a source signal or a connection. Describes a global source signal. Can be referenced from operations with type OperationSetup, OperationChange, OperationReset, OperationConnect, and OperationDisconnect. Unique identifier, enables referencing the global source signal. Name of the global signal. May be used for documentation purposes. Provided to permit schema extensibility. UUT fault data, includes failures and faults defined for the UUT. List of failures defined for the UUT. A failure is a change in operating characteristics of the UUT resulting in degradation of its performance. The Failures defined for the UUT typically correspond to the prime failure modes of all inputs and outputs to each next lower assembly of the UUT. Describes one Failure. Connector and pin where the failure occurs. Note: The connector and pin referenced here are defined under the InterfaceRequirements child element of the root element. Describes the failure mode (e.g., Open, Stuck at 0, Stuck at 1). Type of the failure or fault. Shall be one of: Detectable, Non-Detectable, Non-Functional. Describes the faults defined for the UUT. A fault is a condition that causes a component of the UUT to fail to perform in a required manner (e.g., broken wire, short circuit, value out of tolerance, etc.). Refer to B.2 for an example on describing faults. List of UUT components for which faults are defined. One UUT component for which faults are defined. Note: Use attribute Identification@designator to specify the reference designator of the component (e.g., "R1"). Use the element Identification/ModelName to specify the type of the component (e.g., "Resistor"). List of pins defined for the UUT component. Described one UUT component pin. Pin number. May be numeric (e.g., "11") or alphanumeric (e.g., "A1b"). Provided to allow schema extensibility. Unique identifier, enables referencing the pin. List of all faults defined for the current UUT component. Describes one fault defined for the current UUT component. Fault location, specifies the UUT component pins where the fault occurs. Specifies one UUT component pin. ID of the pin where the fault occurs. References a pin defined under the Component ancestor. Failure mode (e.g., Open, Short, Stuck at 0, Stuck at 1, Out of Tolerance). Failure rate. Type of the fault. Shall be one of: DetectableInsertable, DetectableDestructive, NonDetectable. ID of the pin where the fault occurs. References a pin defined under the Component ancestor. Provided to permit schema extensibility. Definition of Automatic Test Program Generator (ATPG) tools that may be used to generate the test program or parts of the test program. Includes UUT simulators, fault simulators, test pattern generators, translators, post-processors, etc. List of ATPG tools. Describes one ATPG tool. Describes the format of data processed by the ATPG tool (e.g., DTIF). Free-form description of the format. References a compliance document applicable to the format (for example: IEEE 1445 DTIF). Name of the format. Provided to permit schema extensibility. Unique identifier, enables referencing the ATPG tool. Tool type, ex. pattern generator Optional tool name User-defined ATPG data Abstract base type for Test and SessionAction. Note: This is an abstract type, used as base type for other type definitions. Where this type is assigned in the schema, elements with derived types shall be provided. The xsi:type attribute shall be used to indicate the type of these elements. Free-form description for the action. Describes the parameters of the action and their values. Describes one parameter of the action. Free-form description of the parameter. Specifies the value of the parameter. The attributes of this element shall specify the unit (when applicable) and may specify a qualifier. A type derived from c:DatumType shall be assigned to the Datum child element. The type Connection shall be assigned to the Datum child element to specify a connection as the parameter value. The type StdSignalStimulus shall be assigned to the Datum child element to specify an IEEE 1641 stimulus signal as the parameter value. The type StdSignalConnection shall be assigned to the Datum child element to specify an IEEE 1641 connection as the parameter value. The type ValueFromTestGroupParameter shall be assigned to the Datum child element to indicate a parameter value that comes from a Parameter of the containing Test Group. The type ValueFromActionResults shall be assigned to the Datum child element to indicate a parameter value that comes from one or more Test Results of Tests or Session Data of Session Actions from the same Test Group. When present, indicates that the value will be retrieved at run-time from an external document, instead of being encoded in the test program. References the external document. Range, resolution and accuracy requirements. Note: Shall be used only for test results with floating-point scalar or array data types. For array data types, the requirements apply to each element. Expected range. Lower range limit. Upper range limit. Required resolution. Required accuracy. Absolute accuracy limits. Positive limit of absolute accuracy. Negative limit of absolute accuracy. Relative accuracy limits. Positive limit of relative accuracy, in percent. Negative limit of relative accuracy, in percent. When present, indicates that the value of the current parameter shall be used for a parameter of the called test group. The element shall be present only when the current Parameter is assigned to a test and the behavior of the test is "TestGroupCall". The data type, unit and qualifier of the referenced test group parameter shall be identical to those of the current parameter. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. ID of the test group parameter. Provided to permit schema extensibility. Unique identifier, enables referencing the parameter. Name of the parameter. References a requirement ID from an external requirements document. That document is referenced by a Document element under Documentation/Requirements. Note that the format and location of requirement IDs in the external document are not enforced by this standard and can be application-specific. Describes the behavior of the action. The presence of this element indicates that behavior is specified using free-form text. The element contains the descriptive text. Refer to B.2 for an example that contains free-form description of test behavior. The presence of this element indicates that behavior is specified as a sequence of predefined operations. The operation described by the child elements shall be executed sequentially, in the order in which they appear in the instance document. Refer to B.4 for an example where test behavior is described through operations. The presence of this element indicates that the action consists in the execution of a test group. The element identifies the test group. If the test group has multiple entry points, execution starts at the primary entry point. Refer to B.4 for an example that contains test group calls. ID of the test group that is executed. The presence of this element indicates that the action will be generated automatically by an ATPG tool. The child elements identify the tool and the data files used for generation. Identifies all the data files processed or generated by the ATPG tool for the current test. Identifies one data file. ID of the element describing the ATPG tool that generates the test. Provided to permit schema extensibility. Through this element, test behavior may be specified using XML content that conforms to an external XML schema. Identifies local signals, shared by multiple operations specified for the current action. Local signals will be created by and referenced from operations. Refer to B.4.2 for an example on using local signals and to B.5 for an example. Describes one local signal, which may be a source signal, a measurement, or a connection. Describes a local source signal. Can be referenced from operations with type OperationSetup, OperationChange, OperationConnect, OperationChange, OperationDisconnect, and OperationReset located in the current action. Unique identifier, enables referencing the local source signal. Describes a local sensor signal. Can be referenced from operations with type OperationSetup, OperationChange, OperationConnect, OperationRead, OperationDisconnect, and OperationReset located in the current action. Unique identifier, enables referencing the local sensor signal. Describes a local monitor signal. Can be referenced from operations with type OperationSetup, OperationChange, OperationConnect, OperationEnable, OperationDisable, OperationDisconnect, and OperationReset located in the current action. Can also be referenced from Synchrnizarion child elements of any Operation element located in the current action. Unique identifier, enables referencing the local monitor signal. Name of the local signal. May be used for documentation purposes. Specifies preconditions for the action. Provided to permit schema extensibility. Unique identifier, enables referencing the action. Name of the Test. Security classification for the test Custom test type, used to indicate tests that belong to user-defined categories. The semantics attached to categories are user-specific. For example, tests from the same category may be implemented as a single function or procedure. When this attribute is used to provide a guideline for implementation, implementers may choose to follow or ignore the guideline. Cost of test execution, representing the duration of test execution, the financial cost associated with execution, or a value calculated by an objective function. May be used to optimize the order of test execution. References a requirement ID from an external requirements document. That document is referenced by a Document element under Documentation/Requirements. Note that the format and location of requirement IDs in the external document are not enforced by this standard and can be application-specific. Base type for describing a result of a test, test group or session action. Free-form description of the result. Describes the data type and the unit of the result. A type derived from DatumDescriptionType shall be assigned to the DatumDescription child element. The type StdSignalMeasurement shall be assigned to the DatumDescription child element to specify an IEEE 1641 measurement that produces the result. A single measured attribute shall be defined in StdSignalMeasurement. When present, this element indicates that the value of the current result is assigned to a test result of the containing test group. The data type, unit and qualifier of the referenced test group test result shall be identical to those of the current test results. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. ID of the test result the value of the current result is assigned to. Provided to permit schema extensibility. Range, resolution and accuracy requirements. For array data types, the requirements apply to each element. This element shall only be used for results with floating-point scalar or array data types. Note that this constraint is not enforced by the schema. Consumers should check uniqueness programmatically. Expected range. Lower range limit. Upper range limit. Required resolution. Required accuracy. Absolute accuracy limits. Positive limit of absolute accuracy. Negative limit of absolute accuracy. Relative accuracy limits. Positive limit of relative accuracy, in percent. Negative limit of relative accuracy, in percent. Unique identifier, enables referencing the result. Name of the test result. References a requirement ID from an external requirements document. That document is referenced by a Document element under Documentation/Requirements. Note that the format and location of requirement IDs in the external document are not enforced by this stndard and can be application-specific. Base type for describing the outome of outcome of a test, test group or session action. Free-form description of the outcome. Provided to permit schema extensibility. Unique identifier, enables referencing the outcome. Outcome qualifier (e.g., High, Low). When used, shall contain an adjective providing additional descriptive data for the ‘value’ attribute defined in derived types. When ‘value’ is “Aborted”, ‘qualifier’ shall provide essential descriptive or explanatory information regarding the reason for the test, settion action or test group not completing normally. Describes one test defined in the instance document. Describes the possible outcomes returned by the test. Note: The value-qualifier combinations shall be unique for all the outcomes of a test. This constraint is not enforced by the schema. Consumers should check uniqueness programmatically. Describes one outcome of the test. Describes the test results of the test and the limits these results are compared against, for determining the outcome. Describes one test result. When applicable, describes through free-form text the transformation used to convert instrument data into the test result. Limits the test result is compared against. The result of the comparison shall determine the outcome of the test, i.e., the test passes if the result of the comparison is “true”, and fails if the result is “false”. If a test has multiple test results that contain test limits, multiple comparisons shall be performed (one for each test result). The results of these comparisons shall be combined through the logical operator “AND”, unless specified otherwise in the descendants of the Test / Behavior element. Describes one limit. The type ValueFromTestGroupParameter shall be assigned to a Datum descendant to indicate an expected value, limit or mask that comes from a Parameter of the containing Test Group. The type ValueFromActionResults shall be assigned to a Datum descendant to indicate an expected value, limit or mask that comes from one or more Test Results of Tests or Session Data of Session Actions from the same Test Group. Test type: power/stimuli short, performance, or diagnostic. Describes one session action defined in the instance document. Session actions describe operations performed on the UUU for purposes other than testing (e.g., loading firmware). Describes the possible outcomes returned by the session action. Note: The value-qualifier combinations shall be unique for all the outcomes of a session action. This constraint is not enforced by the schema. Consumers should check uniqueness programmatically. Describes one outcome of the session action. Describes the results returned by the session action. Describes one result returned by the session action. Describes an outcome of a test or test group. Extends base type ActionOutcomeType. Outcome value. Shall be one of: Passed, Failed, Aborted. Describes an outcome of a session action. Extends base type ActionOutcomeType. Outcome value. Shall be one of: Done, Aborted. Describes a precondition or postcondition. Describes the precondition or postcondition in terms of state variable values. ID of the state variable value. Describes the precondition or postcondition through free-form text. Name of the precondition or postcondition. Describes of preconditions and postconditions for a test, a session action, or a test group. Refer to B.3 for an example where conditions are used. Refer to B.3.2 for usage information regarding conditions. Describes all preconditions for the test, session action, or test group. The specification of preconditions aims to ensure that tests, session actions or test groups are executed only if the proper conditions exist. For example: power is applied to the UUT, the appropriate firmware is loaded in the UUT, the UUT temperature is within specified limits, etc. Describes one precondition. Describes all postconditions for the test, session action, or test group. Preconditions can be fulfilled by executing tests, session actions, or test groups with the appropriate postconditions. For example a session action can apply power, download firmware, or change the temperature of a thermal chamber; a test can verify the signature of the UUT, etc. Describes one postcondition. Abstract base type, describes a group of tests without specifying an order of execution. Contains information common to all test group types. Derived types define a specific order of execution. Note that this is an abstract type, used as base type for other type definitions. Where this type is assigned in the schema, elements with derived types shall be provided. The xsi:type attribute shall be used to indicate the type of these elements. Note that the grouping of tests in test groups does not ompose a constraint for the modularity and structure of generated test programs. For example, the tests that are part of a test group may be implemented in the same code module or subroutine, or in seperate code modules or subroutines. Free-form description of the test group. Describes the possible outcomes of the test group. When applicable, references the UUT faults or failures these outcomes indicate. The value-qualifier combinations for the outcomes of a test group shall be unique. Note that this constraint is not enforced by the schema. Consumers should verify uniqueness programmatically. Describes one outcome. Identifies the faults and failures detected or isolated when the parent Outcome is obtained. Failure and fault data referenced by this element are defined in the FailureFaultData child of the root element. Describes the parameters of the test group. Does not specify values for these parameters. Describes one parameter. Describes the values supported by the parameter. Typically specifies the data type and the unit. A type derived from DatumDescriptionType shall be assigned to the DatumDescription child element. The type ConnectionDescription shall be assigned to the DatumDescription child element to indicate that the parameter contains connection data. The type StdSignalStimulusDescription shall be assigned to the DatumDescription child element to indicate that the parameter contains an IEEE 1641 stimulus signal. Provided to permit schema extensibility. Unique identifier, enables referencing the parameter. Name of the parameter. Describes the results of the test group. Describes one result of the test group. Describes the values supported by the test result. Typically specifies the data type and the unit. A type derived from DatumDescriptionType shall be assigned to the DatumDescription child element. The type StdSignalMeasurementDescription shall be assigned to the DatumDescription child element to specify that the test result contains the result of an IEEE 1641 measurement Provided to permit schema extensibility. Unique identifier, enables referencing the test result. Name of the test result. Specifies conditions for the test group. Describes the initialization conditions for the test group. The implementation of the test program will ensure that these conditions are satisfied before the first test from the test group is executed. Describes the termination conditions for the test group. The implementation of the test program will ensure that these conditions are satisfied after the last test from the test group is executed. Provided to permit schema extensibility. Unique identifier, enables referencing the test group. Name of the test group. Security classification for the test group. Test group type. Shall be one of: Power Stimuli Short, Performance, Diagnostic. Cost of test group execution, representing the duration of test execution, the financial cost associated with execution, or a value calculated by an objective function. May be used to optimize the order of test execution. References a requirement ID from an external requirements document. That document is referenced by a Document element under Documentation/Requirements. Note that the format and location of requirement IDs in the external document are not enforced by this stndard and can be application-specific. Describes a test group where actions are executed sequentially. The order of execution depends on the outcomes returned by the tests. Each step in the sequence represents of the execution of a test or a test group. The next step to be executed is specified in the instance document, for each possible outcome of the executed item, through NextStep elements. This mode of representation for test sequencing is commonly known as a “fault tree”. Refer to Annex B for examples. Describes all the steps of the current sequence. Each step represents the execution of a test or test group. The order of Step elements in the XML instance document is not relevant for the order of execution. The order of execution is determined exclusively by the contents of NextStep descendants. Describes one step. Free-form description of the step. The presence of this element indicates that the step represents the execution of an action (i.e., test or session action). Note that the behavior of that action may in turn describe a test group call. This approach shall be used to specify parameter values for the called test group, which are different from the nominal values. ID of the action to be executed for the current step. The presence of this element indicates that the step represents the the execution of a test group. If the test group has parameters, their nominal values will be used. ID of the test group to be executed for the current step. Describes the operations to be performed when specific results are obtained for the current step (i.e., specific outcomes are returned by the test, session action, or test group referenced by the step). These operations can be: execute another test; adjust components; finish sequence execution and identify components to replace, etc. Describes the operations to be performed for one result of the current step. One Result element shall exist for each outcome of the test, session action, or test group. Note that this constraint is not enforced by the XML schema. Clients should verify the constraint programmatically. This element shall be present if the ancestor Step element represents the execution of an action (test or session action). References the action outcome the current result corresponds to. ID of the referenced action outcome. This element shall be present if the ancestor Step element represents the execution of a test group. References the test group outcome the current result corresponds to. ID of the referenced test group outcome. The presence of this element indicates the that another step will be executed when the current result is obtained. Identifies the faults and failures detected or isolated when the current Step Result is obtained. Failure and fault data referenced by this element are defined in the FailureFaultData child of the root element. ID of the step to be executed. The presence of this element indicates the that the execution of the sequence will be terminated when the current result is obtained. The element specifies the sequence outcome to be returned. In turn, this outcome may indicate the failures or faults that were detected or isolated. ID of the the sequence outcome to be returned. The presence of this element indicates the one or more components will be adjusted when the current result is obtained. The element specifies the components to be adjusted. Free-form description of the overall adjustment operation. Identifies all the components to adjust. Identifies one component to adjust. Free-form description of the adjustment operation for the current component. ID of the component to adjust. Describes the operation to be executed after the adjustment is performed. The presence of this element indicates that sequence execution will be terminated. The element specifies the sequence outcome to be returned. It is assumed that adjustment solves the problem and re-test is not necessary. ID of the sequence outcome to be returned. The presence of this element indicates that the last executed step will be repeated. The presence of this element indicates that a different step will be executed. The element identifies the step to be executed. ID of the step to be executed. Describes the operations to be performed if adjustment is impossible (e.g., due to insufficient range). Indicates the sequence execution will be terminated if adjustment is impossible. ID of the sequence outcome to be returned if adjustment is impossible. The presence of this element indicates that a different step will be executed. The element identifies the step to be executed. ID of the step to be executed. Unique identifier, enables the referencing of the step. Optional step name. Identifies the entry points of the current sequence. Each entry point references a step that can be executed as the first step in the sequence. Unique identifier, enables the referencing of the entry point. ID of the step designated as entry point. Identifies the primary entry point of the sequence. This entry point is used in the absence of an entry point selection (e.g., by the operator). Describes a test group where actions (tests and session actions) can be executed in parallel (i.e., simultaneously), depending on resource availability. The execution of the test group finishes after the all actions finish. Identifies the actions to be executed in parallel. References one action. ID of the referenced action. Describes a test group where the order of execution is determined by a diagnostic reasoner in accordance to a diagnostic model (e.g., a diagnostic model conformant with IEEE Std. 1232). References an external document that contains the diagnostic model. Identifies the actions (tests and session actions) to be executed in the order determined by the diagnostic reasoner. References one action. ID of the referenced action. References to the document that contains the diagnostic model. This may be an XML instance document or another type of document. Describes a test group where execution is serial and the order of execution is determined through an unspecified method. Identifies the actions (tests and session actions) to be executed in the order determined by an unspecified method. References one action. ID of the referenced action. Describes the initialization conditions for a test group. The presence of this element indicates that initialization is described through free-form text. Describes through free-form text the power sequence required to initialize the UUT. Describes through free-form text the warmup required for the UUT. Describes through free-form text the conditioning required for the UUT. Describes through free-form text the alignment and adjustment operations required to initialize the UUT. Describes through free-form text other operations required before the execution of the test group starts. Provided to permit schema extensibility. The presence of this element indicates that initialization is performed by executing a single action, which may be a test or a session action. The element references that action. An "Aborted" outcome returned by the referenced action means that initialization has failed. A "Failed" outcome returned by the referenced action (of type test) means that initialization has failed. When initialization fails, the execution of the current test group should not continue. ID of the referenced action. The presence of this element indicates that initialization is performed by executing a test group. The element references that test group. A "Failed" or "Aborted" outcome returned by the referenced test group means that initialization has failed. When initialization fails, the execution of the current test group should not continue. ID of the referenced test group. Describes the termination conditions for a test group. The presence of this element indicates that termination is described through free-form text. The presence of this element indicates that termination is described through free-form text. Describes through free-form text the operations required after the execution of the test group is finished. Provided to permit schema extensibility. The presence of this element indicates that termination is performed by executing a single action, which may be a test or a session action. The element references that action. An "Aborted" outcome returned by the referenced action means that initialization has failed. A "Failed" outcome returned by the referenced action (of type test) means that initialization has failed. When termination of a test group fails, the execution of the test program (with other test groups) should not continue. The presence of this element indicates that termination is performed by executing a test. The element references that test. Note that the Behavior child element of the test may in turn reference a test group performing termination operations. A "Failed" outcome returned by the referenced test means that termination has failed. When this situation occurs the behavior of the test program may be application specific. For example, the test program may reset the ATE instrumentation, to bring it in a known state. ID of the referenced action. The presence of this element indicates that termination is performed by executing a test group. The element references that test group. A "Failed" or "Aborted" outcome returned by the referenced test group means that termination has failed. When termination of a test group fails, the execution of the test program (with other test groups) should not continue. The presence of this element indicates that termination is performed by executing a test group. The element references that test group. A "Failed" outcome returned by the referenced test group means that termination has failed. When this situation occurs the behavior of the test program may be application specific. For example, the test program may reset the ATE instrumentation, to bring it in a known state. Describes a sequence of operations. The operations will be executed in the order in which they appear in the sequence. Refer to B.4 for an example containing operations. Describes one operation. Abstract base type for all operations. Note that this is an abstract type, used as base type for other type definitions. Where this type is assigned in the schema, elements with derived types shall be provided. The xsi:type attribute shall be used to indicate the type of these elements. Free-form description of the operation. operation name. Create and setup a Signal. The presence of this element indicates a source signal. Source signals are used to describe stimulus operations. This element contains information specific to the source signal. Identifies a local source signal to setup. ID of the local source signal. Identifies a global source signal to setup. ID of the global source signal. Describes the source signal. The type StdSignalStimulus shall be assigned to the Datum child element to embed a signal definition in the instance document. If a signal connection must be described, the definition shall be embedded in the StdSignalStimulus element. Refer to B.4 for an example. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate a signal definition that originates from a parameter of the containing action (test or session action). Refer to B.4 for an example. The presence of this element indicates a sensor signal. Sensor signals are used to describe measurement operations. This element contains information specific to the sensor signal. Identifies a local sensor signal to setup. ID of the local sensor signal. Describes the sensor signal. The type StdSignalMeasurement shall be assigned to the Datum child element to embed a signal definition in the instance document. Exactly one measured attribute shall be defined in StdSignalMeasurement. Refer to B.4 for an example. The presence of this element indicates a monitor signal. Monitor signals are used to generate events when a specific condition occurs. Events are typically used to synchronize the operation of other signals. This element contains information specific to the monitor signal. Identifies a local monitor signal to setup. ID of the local monitor signal. The presence of this element indicates a signal-based monitor signal. Signal-based monitor signals generate events when a specific change occurs in an attribute of a monitored signal. Describes the monitor signal. The type StdSignalMonitor shall be assigned to the Datum child element to embed a signal definition in the instance document. Exactly one monitored attribute shall be defined in StdSignalMeasurement. The connection of the monitored signal shall be described by embedding its definition the definition in the StdSignalMonitor element. The presence of this element indicates a time-based monitor signal. Time-based monitor signals generate events at specific time intervals. Period of event repetition. Time of the initial event, measured from the moment the monitor signal is enabled. Duration of the event generation interval. Number of events to be generated. The presence of this element indicates an event-based monitor signal. Event-based monitor signals generate events based on the occurrence of other events. Specifically, the generated event is active from the time a "from" event occurs to the time a "to" event occurs. Identifies the "from" event. ID of the "from" event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Identifies the "from" event. ID of the "to" event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. The presence of this element indicates a monitor signal that generates events based on a user-specified condition. Free-form description of the event condition. Specifies synchronization conditions for the setup operation. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Change an existing signal. Identifies a local signal to change. ID of the local signal. The local signal will be set up by an operation of type OperationSetup defined in the current test. The operation that sets up the signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Identifies a global signal to change. Applicable to source signals only. ID of the global signal. The global signal will be set up by an operation of type OperationSetup defined in a different test. The operation that sets up the signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Producers can ensure that the constraint is satisfied through proper sequencing of tests (for test groups of type TestGroupSequence), or through conditions (for other types of test groups). Describes the characteristics of the source signal after the change operation. A type derived from DatumType shall be assigned to the Datum child element of Value. The type StdSignalStimulus shall be assigned to the Datum child element to embed a signal definition in the instance document. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate a signal value that originates from a parameter of the containing action (test or session action). Specifies synchronization conditions for the signal operation. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Reset an existing signal. Identifies a local signal to reset. ID of the local signal. Identifies a global signal to reset. Applicable to source signals only. ID of the global signal. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Measure an attribute of an existing sensor signal and create a measurement entity that holds the value read from the measurement. Describes the measurement entity created by the operation. Attributes standardUnit and nonStandardUnit shall be alternative. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Unique identifier, enables referencing the measurement operation. Name of the measurement created by the operation. May be used for documentation purposes. Specifies a unit for the measured value. Identifies the local sensor signal to measure. ID of the local sensor signal. The local signal will be set up by an operation of type OpeationSetup defined in the current test. The operation that sets up the signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Number of samples to be read. The absence of the element indicates one sample. Specifies synchronization conditions for the signal operation. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. The presence of this element indicates that the measured value is assigned to a test result of the containing test. This element may be used if the ancestor action of this operation is of type Test. It shall not be used if the ancestor action of this operation is of type Session Action. The data type and unit of the measured signal attribute (defined in the sensor signal referenced by the current Operation) shall be identical to, or convertible to the data type and unit of the referenced test result. If present, the qualifier of the referenced test result shall be compatible with the definition of the measured signal attribute. Note that the above constraints are not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the test result. The presence of this element indicates that the measured value is assigned to a session datum of the containing session action. This element may be used if the ancestor action of this operation is of type Session Action. It shall not be used if the ancestor action of this operation is of type Test. The data type and unit of the measured signal attribute (defined in the sensor signal referenced by the current Operation) shall be identical to, or convertible to the data type and unit of the referenced session datum. If present, the qualifier of the referenced session datum shall be compatible with the definition of the measured signal attribute. Note that the above constraints are not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the session datum. Compare a measurement result with limits and specifies the test outcomes to be returned for each comparison result. Operations of this type shall only appear under actions of type test, as their functionality is specific to tests. Note that this constraint is not enforced by the schema. Consumers should check the constraint programmatically. Identifies the measurement whose result is compared. ID of the measurement. References a measurement described in an operation of type OperationRead defined in the current test. The operation of type OperationRead shall be executed before the current operation. Note that this constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Describes the limits the measurement result is compared against. Describes one limit. Identifies the action outcomes to be returned for specific results of the comparison. Identifies the action outcome to be returned for one result of the comparison. One element shall be specified for each possible result of the comparison, as described in the following: "Equal" and "NotEqual" elements shall be specified when comparing with an expected value; "FailHigh" and "FailLow" elements shall be used when comparing with a single limit; "InTolerance", "FailHigh" and "FailLow" shall be specified when comparing with a limit pair. NoteTote that the previous constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Describes the comparison result. Identifies action (i.e., test) outcome to be returned for the specified comparison result. Connect an existing signal or a set of UUT pins and create a connection entity. The presence of this element indicates that the operation connects a signal to UUT pins. Identifies a local signal to connect. ID of the local signal. The local signal will be set up by an operation of type OpeationSetup defined in the current test. The operation that sets up the signal can be executed before or after the current operation. Identifies a global signal to connect. Applicable to source signals only. ID of the global signal. The global signal will be set up by an operation of type OperationSetup defined in a different test. The operation that sets up the signal can be executed before or after the current operation. Describes the signal connection. A type derived from DatumType shall be assigned to the Datum child element. The type StdSignalConnection shall be assigned to the Datum child element to embed a connection definition in the instance document. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate a signal connection that originates from a parameter of the containing action (test.or session action). The presence of this element indicates that the operation interconnects UUT pins. Describes a signal path from a UUT pin to another UUT pin. Name of the UUT pin where the connection originates. Where applicable, shall include the reference designator of the connector (e.g., "J1-2"). The connector and pin referenced by this element shall be defined in the InterfaceRequirements child element of the root element. Note that this constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Name of the UUT pin where the connection terminates. Where applicable, shall include the reference designator of the connector (e.g., "J1-2"). Note: The connector and pin referenced by this element shall be defined in the InterfaceRequirements child element of the root element. This constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Specifies synchronization conditions for the signal operation. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Disconnect an existing connection. Identifies a local signal to discconnect. ID of the local signal. The local signal will be connected by an operation of type OperationConnect defined in the current test. Identifies a global signal to discconnect. Applicable to source signals only. ID of the global signal. The global signal will be connected by an operation of type OperationConnect defined in a different test. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Enable event generation for an existing monitor signal. Identifies the local monitor signal to enable. ID of the local monitor signal. The local signal will be set up by an operation of type OpeationSetup defined in the current test. The operation that sets up the signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Specifies synchronization conditions for the signal operation. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Specifies the connection of the monitored signal to the pins of the UUT. Applicable to signal-based event monitors only. Note that a connection can also be specified in the OperationSetup operation that creates the monitor signal. Disable event generation for an existing monitor signal. Identifies the local monitor signal to disable. ID of the local monitor signal. The local signal will be enabled by an operation of type OperationEnable defined in the current test. Defines a timeout for the signal operation. If the operation cannot be completed before the timeout expires the containing test shall return an error condition. Pause execution for the specified time. Time value. The child elements shall contain a scalar floating-point value (e.g., double) and a unit of time (e.g., sec). Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Read the value of a state variable and assign it to a test result of the containing test, or to a session datum of the containing session action. The presence of this element indicates that the state variable value is assigned to a test result of the containing test. This element may be used if the ancestor action of this operation is of type Test. It shall not be used if the ancestor action of this operation is of type Session Action. The data type, unit and qualifier of the state variable values shall be identical to, or convertible to the data type, unit and qualifier of the referenced test result. Note that the above constraint is not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the test result. The presence of this element indicates that the state variable value is assigned to a session datum of the containing session action. This element may be used if the ancestor action of this operation is of type Session Action. It shall not be used if the ancestor action of this operation is of type Test. The data type, unit and qualifier of the state variable values shall be identical to, or convertible to the data type, unit and qualifier of the referenced session datum. Note that the above constraint is not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the session datum. ID of the state variable. Set the value of a state variable. ID of the state variable. ID of the state variable value. The referenced value shall be a child element of the state variable referenced by attribute stateVariableID. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Display a message to the operator. Specifies the message to be displayed (e.g., string, numeric value, boolean value, etc.). One of the DatumType-derived types from the Common schema shall be assigned to the Datum child element. Indicates that the message to be displayed is specified in an external document (e.g., a text document, a bitmap image, a web page, etc.). The element contains a reference to that document. Get a value from the operator. Input message. Represents the value provided by the operator. Describes the value expected from the operator (e.g., string, numeric value, boolean value, etc.). One of the DatumDescriptionType-derived types shall be assigned to the DatumDescription child element. Unique identifier, enables referencing the input message. The presence of this element indicates that the value provided by the operator is assigned to a test result of the containing test. This element may be used if the ancestor action of this operation is of type Test. It shall not be used if the ancestor action of this operation is of type Session Action. The data type, unit and qualifier of the input message (described through the MessageIn/ValueDescription element) shall be identical to, or convertible to the data type, unit and qualifier of the referenced test result. Note that the above constraint is not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the test result. The presence of this element indicates that the value provided by the operator is assigned to a session datum of the containing session action. This element may be used if the ancestor action of this operation is of type Session Action. It shall not be used if the ancestor action of this operation is of type Test. The data type, unit and qualifier of the input message (described through the MessageIn/ValueDescription element) shall be identical to, or convertible to the data type, unit and qualifier of the referenced session datum. Note that the above constraint is not enforced by the XML schema. Consumers should verify the constraints programmatically. ID of the session datum. Specified repeated execution for a set of operations. Refer to B.5 for an example on using this type. Operations used for setup purposes. These operations are executed once, before the other operations. Operations to be repeated. Decision. Represents a condition that is evaluated before or after each execution of Body operations, to decide if a new repetition is necessary. The operations will be repeated if the result of the evaluation is "true". The presence of this element indicates that the decision is based on the value of an iterator. Note that the current iterator value may be referenced in the Body operations by using the type ValueFromIterator or the signal ParameterTransferSignal defined in ATMLTSFLib.xsd. The presence of this element indicates iteration through a discrete set of values. ll the values shall have identical data type, unit and qualifier. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Describes one value assumed by the iterator. The presence of this element indicates that iteration is controlled by an iterator whose value is incremented after each execution. Describes the value of the iterator. The presence of this element indicates that the value of the iterator is defined in the instance document. Initial value of the iterator, assumed before executing the Repeat operations. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate an initial value that originates from a Parameter of the containing Test. Increment for the iterator, to be applied after executing the Repeat operations. A linear increment is used. The element indicates the value of the increment. The data type, unit and qualifier of theincremet shall be identical to those of the initial value. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate an increment value that originates from a parameter of the containing test. A logarithmic increment is used. The element indicates the number of steps between the Initial Value and the Limit. An integer data type shall be used to specify the number of steps in the instance document. The type ValueFromActionParameter shall be assigned to the Datum child element to indicate an initial value that originates from a parameter of the containing test. Other type of increment, specified through free-form text The presence of this element indicates that the value of the iterator is obtained at run-time from a measurement. ID of the measurement. References a measurement created by an operation of type OperationRead. The presence of this element indicates that the value of the iterator is obtained at run-time from the operator. ID of the input message. References an input message created by an operation of type OperationMessageIn. Describes the limits the iterator is compared against. A limit, limit pair, or an expected value plus a comparison operator. The type ValueFromActionParameter may be assigned to Datum descendants of this element to indicate a value that originates from a parameter of the containing test. Unique identifier, enables referencing of the iterator. Name of the iterator. The presence of this element indicates that the decision is described through free-form text. Specifies a set of operations to be performed when a condition is satisfied, and a different set of operations to be performed when the condition is not satisfied. Decision evaluated before the execution of any operations, to decide which set of operations will be executed. The presence of this element indicates that the decision is made by comparing a value against a set of limits. The value to be compared. The presence of this element indicates that the value to be compared is obtained at run-time from a parameter of the containing action (test or session action). The presence of this element indicates that the value to be compared is obtained at run-time from a measurement. ID of the measurement. References a measurement defined by an operation of type OperationRead. The presence of this element indicates that the value to be compared is obtained at run-time from the operator. ID of the input message. References an input message created by an operation of type OperationMessageIn. Describes the limits the value is compared against. A limit, limit pair, or an expected value plus a comparison operator. The type ValueFromActionParameter may be assigned to Datum descendants of this element to indicate a value that originates from a parameter of the containing test. The presence of this element indicates a decision described through free-form text. Operations to be performed when the result of the evaluation is 'true'. Operations to be performed when the result of the evaluation is 'false'. Operation with custom behavior. The presence of this element indicates that behavior is described through free-form text, embedded in the instance document. The presence of this element indicates that behavior is described in an external document. The element references the external document. Describes the synchronization condition for the signal operation defined by an operation. Indicates that the signal operation is synchronized to an event (i.e., the operation is performed when the event occurs). ID of the monitor signal that generates the event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Indicates that the signal operation is gated by events. The presence of this element indicates that the signal operation is gated by one event (i.e., the operation is performed for the duration of the event) . ID of the monitor signal that generates the event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. The presence of this element indicates that the signal operation is gated by two events (i.e., the operation is performed from the moment the "from" event occurs until the moment the "to" event occurs). Describes the "from" event. ID of the monitor signal that generates the "from" event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Describes the "to" event. ID of the monitor signal that generates the "to" event. References a local monitor signal. The monitor signal will be set up by an operation of type OpeationSetup defined in the current test and enabled by an operation of type OpeationEnable defined in the current test. The operations that sets up and enable the monitor signal shall be executed before the current operation. Note that the constraint is not enforced by the XML schema. Consumers shall verify the constraint programmatically. Requirements for a signal attribute. Used to describe UUT power requirements. Free-form description of the requirement. The nominal value required. The maximum tolerance allowed. The minimum value required. The maximum value required. Conditions under which the current requirement is defined. Describes one condition through free-form text. Any additional information necessary to clarify the requirement. Describes the signal present at a UUT pin. Signal name. Signal type. Shall be one of: Input, Output, Bi-Directional, Load. Signal definition, provided as free-form text. Describes the function of a UUT pin. Includes the description of the signal and other descriptive data. Description of the signal at the UUT pin. Other descriptive data relevant for the function of the UUT pin. May include wire size, wire length, wire type, grounding, etc. Provided to permit schema extensibility. Abstract base type, describes a port of a connection. Contains information common to all port types. Derived types describe specific types of ports (e.g., connector pin, component pin, etc.). Note: This is an abstract type, used as base type for other type definitions. Where this type is assigned in the schema, elements with derived types shall be provided. The xsi:type attribute shall be used to indicate the type of these elements. Port name (e.g., "HI", "LO", "A", "B", "C", "N"). Describes a port that consists of one pin of a UUT connector. References the pin and the connector that contains it. Describes a port that consists of multiple UUT connector pins (i.e., a pin group). List of all pins. Describes one pin of the group. Function of the pin within the port (e.g., D0, D1, Parity). This attribute shall not appear if the function is specified in the description of the referenced pin. References the pin and the connector that contains it. Describes a port that consists of one pin of a UUT component. References the pin and the component that contains it. Base type for describing faults and failures. Contains information common to faults and failures. Note that this is an abstract type, used as base type for other type definitions. Free-form comment regarding detection (or non-detection) and isolation of the fault or failure. Information on repairing the UUT when the fault or failure is detected. The presence of this element indicates that the repair actions necessary to remediate the current fault or failure are described in the instance document. Describes one repair action. Free-form description. Provided to permit schema extensibility. Name of the repair action. The presence of this element indicates that the repair actions necessary to remediate the current fault or failure are described in an external document. References an external document that contains repair instructions for the UUT. User-specific codes allowing the identification in the repair instructions document of the repair actions necessary to remediate the current fault or failure. One operation code. Provided to permit schema extensibility. Provided to permit schema extensibility. Unique identifier, enables referencing the fault or failure. Indicates if the fault or failure is insertable. Describes the severity of the fault or failure. Shall be one of: Warning, Error, Fatal. Describes the source of the fault or failure. Identifies the faults and failures detected or isolated . Failure and fault data referenced by this type are defined in the FailureFaultData child of the root element. Identifies the faults detected or isolated. Identifies one fault. ID of the fault. Identifies the failures detected or isolated. Identifies one failure. ID of the failure. Base type for describing the performance characteristics of UUT inputs, outputs and controls. Contains information common to inputs, outputs and controls. Free-form description. Identifies the port where the input, output or control is located. A type derived from TdPortType shall be assigned to this element. Unique identifier, enables referencing the performance characteristic. Functional name for the the performance characteristic. Type of the input, output or control (e.g., electrical, electro-optical, mechanical, hydraulic, pneumatic). Defines a stimulus signal conformant to IEEE Std. 1641 or to a user-defined library that is conformant to IEEE Std. 1641. Where applicable, can be assigned to elements of type DatumType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. BSC signal definition conforming to the STDBSC.xsd schema of IEEE Std. 1641. This shall be a valid stimulus definition, including Source, Conditioning, Event and Connection BSCs, as applicable. TSF signal definition conforming to the TSF Library of IEEE Std. 1641. This shall be a valid stimulus definition. ATML-specific signal definition conforming to the TSF Library defined in this standard. TSF signal definition conforming to a user-defined TSF Library. The TSF Library shall be defined in accordance with IEEE Std. 1641. The TSF Library shall be described in an XML Schema referenced from the current instance document. This shall be a valid stimulus definition. Describes a stimulus signal, without providing a definition for the signal. Where applicable, can be assigned to elements of type DatumDescriptionType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. Nominal value. BSC signal definition conforming to the STDBSC.xsd schema of IEEE Std. 1641. This shall be a valid stimulus definition, including Source, Conditioning, Event and Connection BSCs, as applicable. TSF signal definition conforming to the TSF Library of IEEE Std. 1641. This shall be a valid stimulus definition. ATML-specific signal definition conforming to the TSF Library defined in this standard. TSF signal definition conforming to a user-defined TSF Library. The TSF Library shall be defined in accordance with IEEE Std. 1641. The TSF Library shall be described in an XML Schema referenced from the current instance document. This shall be a valid stimulus definition. Defines a monitor signal conformant to IEEE Std. 1641. Where applicable, can be assigned to elements of type DatumDescriptionType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. BSC signal definition conforming to the STDBSC.xsd schema of IEEE Std. 1641. This shall be a valid signal-based event definition. Defines a signal measurement conformant to IEEE Std. 1641. Where applicable, can be assigned to elements of type DatumDescriptionType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. BSC signal definition conforming to the STDBSC.xsd schema defined by IEEE 1641. This shall be a valid measurement definition (intrinsic or generic), including Connection, Conditioning and Sensor BSCs, as applicable. TSF signal definition conforming to the TSF Library of IEEE Std. 1641. This shall be a valid measurement definition. TSF signal definition conforming to a user-defined TSF Library. The TSF Library shall be defined in accordance with IEEE Std. 1641. The TSF Library shall be described in an XML Schema referenced from the current instance document. This shall be a valid measurement definition. Describes a signal measurement, without providing a definition for the signal. Where applicable, can be assigned to elements of type DatumDescriptionType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. Nominal value. BSC signal definition conforming to the STDBSC.xsd schema of IEEE Std. 1641. This shall be a valid stimulus definition, including Source, Conditioning, Event and Connection BSCs, as applicable. TSF signal definition conforming to the TSF Library of IEEE Std. 1641. This shall be a valid stimulus definition. ATML-specific signal definition conforming to the TSF Library defined in this standard. TSF signal definition conforming to a user-defined TSF Library. The TSF Library shall be defined in accordance with IEEE Std. 1641. The TSF Library shall be described in an XML Schema referenced from the current instance document. This shall be a valid stimulus definition. Defines a signal connection conformant to IEEE Std. 1641. Where applicable, can be assigned to elements of type DatumType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. BSC connection definition conforming to the STDBSC.xsd schema defined by IEEE Std. 1641. This shall be a valid connection definition. The UUT connectors and pins referenced in the connection shall be defined under the InterfaceRequirements child of the root element. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. Due to a requirement of the STDBSC.xsd schema, the @name attribute of Connection elements shall be provided and shall be unique within the instance document. This condition must be satisfied for proper validation, although the @name attribute is not referenced from the current instance document. Identifies a TSF class in a TSF Library. ID of the TSF Library. The TSF Library is defined under the TsfLibraries child of the root element. Name identifying the TSF class within the TSF Library. Shall match the name of a TSF class defined in the TSF Library. Note that this constraint is not enforced by the XML schema. Consumers should check this constraint programmatically. Describes an attribute of a TSF class. Name identifying the TSF class attribute. If a TSF class is specified for the signal, the value of this element shall match the name of an attribute of that TSF class. If a TSF class is not specified, shall be one of the attributes defined in H.7.1.3.1 of IEEE Std. 1641. Note that the previous constraints are not enforced by the XML schema. Consumers should check these constraints programmatically. Value of the signal the attribute. For control attributes, this is the required value. For measured attributes, it is the expected value. The complex types ValueFromTestGroupParameter, ValueFromActionParameter and ValueFromOperationMeasurement may be assigned to the Datum child element, as applicable. The data type of the Value shall match the data type of the TSF class attribute. Note that this constraint is not enforced by the XML schema. Consumers should check this constraint programmatically. Range and accuracy requirements. Required range. Lower range limit. Upper range limit. Required resolution. Required accuracy. Absolute accuracy limits. Positive limit of absolute accuracy. Negative limit of absolute accuracy. Relative accuracy limits. Positive limit of relative accuracy, in percent. Negative limit of relative accuracy, in percent. Describes the name of an attribute of a TSF class. The name provided using this type shall match the name of an attribute of the TSF class specified for the current signal. Note that this constraint is not enforced by the XML schema. Consumers should check this constraint programmatically. Defines a multi-port signal connection. Where applicable, can be assigned to elements of type DatumType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. List of connected ports. Describes one port. A type derived from TdPortType shall be assigned to this element. Describes a multi-port signal connection, without defining the actual ports. Where applicable, can be assigned to elements of type DatumDescriptionType. The @unit and @qualifier attributes of the base type are not applicable and shall not be used. Indicates the number of ports. This element shall be used if the described connection contains a fixed number of ports. Indicates that a value originates from a parameter of a test group. Where applicable, can be assigned to elements of type DatumType. If present, the unit and qualifier shall be identical to those of the referenced parameter. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. ID of the test group parameter. Indicates that a value originates from one test result of a test, or from one session datum of a session action, or from multiple such child elements of different actions. Where applicable, can be assigned to elements of type DatumType. The TestResult and SessionDatum child elements shall not reference more than one test tesult or session datum from the same action. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. If present, the unit and qualifier shall be identical to those of the referenced test results and session data. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. Identifies one test result the value originates from. ID of the test result. Identifies one session datum the value originates from. ID of the session datum. Indicates that a value originates from a parameter of an action (test or session action). Where applicable, can be assigned to elements of type DatumType. If present, the unit and qualifier shall be identical to those of the referenced parameter. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. ID of the test parameter. Indicates that a value originates from a measurement defined through an operation of type OperationRead. Where applicable, can be assigned to elements of type DatumType. If present, the unit and qualifier shall be identical to those of the referenced measurement. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. ID of the measurement. Indicates that a value originates from an iterator defined through an operation of type OperationRepeat. Where applicable, can be assigned to elements of type DatumType. If present, the unit and qualifier shall be identical to those of the referenced iterator. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. ID of the iterator. Describes a value, providing an optional default. This type is similar to Value, but does not specify the actual value. It is typically used to describe values that will be obtained at run-time through measurement, from the operator, etc. The value consists of one data item. The value consists of a set of heterogeneous data items. Each item may have a different data type and unit. The value consists of an array of homogenous data items. All elements have the same data type and unit. Describes a value that consists of one data item (e.g., numeric, boolean, string, date-time), with an optional unit. This is an abstract type, used as base type for other type definitions. Where this type is assigned in the schema, elements with derived types shall be provided. The xsi:type attribute shall be used to indicate the type of the elements. Attributes and standardUnit are nonStandardUnit shall be alternative. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Unit of the data item. Describes a value that consists of a set of heterogeneous data items. Attributes and standardUnit are nonStandardUnit shall be alternative. Note that this constraint is not enforced by the XML schema. Consumers should verify the constraint programmatically. Describes one data item. Name of the data item. Default unit, applies to data items for which a unit is not explicitly defined. Describes a value that consists of an array of homogenous data items. The array shall be zero-based. The elements of the array may be individual data items or collections. All elements of the array shall have the same data type. Note that this constraint is not enforced by the XML schema. Consumers should check the constraint programmatically. Common unit, applies to all array elements. Specifies the array bounds for each dimension. Implicitly specifies the number of dimensions. Describes a binary value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of binary values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a boolean value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of boolean values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a complex numeric value (i.e., a value that has real and imaginary components). Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of complex numeric values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a date-time value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes a date-time value. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a hex-encoded binary value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of hex-encoded binary values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a numeric value that corresponds to the IEEE double precision 64-bit floating point type. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of floating-point numeric values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a 32-bit signed integer value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of 32-bit signed integer values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes an octal-encoded binary value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of octal-encoded binary values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a string value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of string values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element. Describes a 32-bit unsigned integer value. Where applicable, can be assigned to elements of type DatumDescriptionType. Nominal value. Describes an array of 32-bit unsigned integer values. Where applicable, can be assigned to elements of type IndexedArrayDescriptionType. Default value, applies to all array elements whose value is not explicitly defined through NominalElementValue child elements. The value of an array element, for the nominal array value. Index of the element.