This schema is specified in IEEE Std 1671-20XX, "IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML." This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATML Test Equipment component defined in IEEE Std 1671-20XX,"IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML." The purpose of this schema is to provide unique test equipment types and attributes for ATML schemas.This schema uses the W3C XML Schema definition language as the encoding. This allows for interoperability and the exchange of ATML component instances between various systems. This schema shall not be modified but may be included in derivative works. Copyright (c) 2009 Institute of Electrical and Electronics Engineers, Inc. USE AT YOUR OWN RISK This type defines the common information for a particular serial number of a Test Station or a Test Adapter. Ordered list of TestStation or TestAdapter controllers. The Station or Test Adapters controller. A list of software associated with this test station or test adapter, in addition to controller software (i.e. Self-Test, Cal) Signal paths through test station or test adapter. The path could consist of wiring and switching. Self test last run ETE on Test Station or Test Adapter. If this element is used, it shall contain data identifying the Instance document associated with this test run, such as a Test Results instance. Date and time self test last run ETE. Subsystem calibrated (used if separte calibration is done on subsystems) Subsystem calibrated Date subsystem last calibrated Frequency which calibration is required to be run. Current Test Station or Test Adapter configuration. (i.e RF, Digital, EO) This element can be used to extend the Test Equipment Instance. This type defines the common information associated with a Test Station and a Test Adapter. List of non power facilities requirements Ordered list of TestStation or TestAdapter controllers. The Station or Test Adapter controller. A list of software associated with this test station or test adapter, in addition to controller software (i.e. Self-Test, Cal) Signal paths through test station or test adapter. The path could consist of wiring and switching. List of terminal blocks inside adapter or test station. Begin and end nodes. Could be nodes associated with one section of wire or the begin and end nodes of a path composed of multiple wires and/or switches. Name for the node in the path. Used to reference the node when specifying path-loss data. Delay time of signal through this path (electrical length) Frequency range associated with this SignalDelay. Name of node the signal goes into. If the value applies to all nodes in the path, specify the first node in the path. Name of node the signal goes out of. If the value applies applies to all nodes in the path, specify the last node in the path. Voltage Standing Wave Ratio (VSWR) associated with this path. Frequency range associated with this VSWR. Name of node the signal goes into. If not specified, value applies to all nodes in the path. S-parameters associated with this path. Name of node the signal goes into. Name of the node the signal goes out of Installed operating systems. List of available video capabilities. List of available audio capabilities. Processor information. x86, PPC, SPARC, etc. Pentium M, Power PC, etc. Clock speed. List of available system peripherals. List of installed software,