The
Ø
TAD Operations
Manual
Ø
Current PARs
(All) of
o IEEE-P1636.2 Maintenance Action Information
o
IEEE-P1671.1
Test Descriptions
o
IEEE-P1671.2
Instrument Descriptions
o
IEEE-P1671.3
Exchanging UUT Description Information
o
IEEE-P1671-4
Exchanging Test Configuration Data
o
IEEE-P1671-5
Exchanging Test Adapter Information
o
IEEE-P1671-6
Exchanging Test Station Information
Ø
Requirements
Documents
o
IEEE-P1232
AI-ESTATE Revision
Ø Current SCC-20
Annual Report
Ø
Ø
Current
This page was last modified on 1 August 2008 by Dave Droste
