SCC20 Home Page

  IEEE SCC20

  Working Groups

  Active Projects
       - IEEE P1445
       - IEEE P1514
       - IEEE P1636.2
       - IEEE P1641.1a
       - IEEE P1671.1
       - IEEE P1671.3
       - IEEE P1871.2
       - IEEE P1505.1
       - IEEE P1636
  

  Active Standards Status

 

  Document Repository (members only)

 

 

 

 

IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems
Established 1966

Active Standards

PAR # Title Type Process Expiration Date WG Chair
P1445 Standard for Digital Test Interchange Format (DTIF) Revision Individual
12/31/2019
John Sheppard
P1514 Recommended Practice for the Design and Integration of Fixtures Applied to Generic Test Interfaces of Automatic Test Systems New Individual
12/31/2018
Stephen Mann
P1636.2 Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML) Revision Individual
12/31/2017
John Sheppard
P1641.1a Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
Amendment to add Guidelines for producing reusable Test Signal Frameworks (TSFs) for use on platforms utilizing Automatic Test Markup Language (ATML)
Amendment Individual
12/31/2019
Ion Neag
P1671.1 Standard for Automatic Test Markup Language (ATML) Test Description Revision Individual
12/31/2016
Ion Neag
P1671.3 Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description Revision Individual
12/31/2016
Ion Neag
P1871.2 Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adaptors and Test Equipment New Individual
12/31/2017
Mike Seavey
P1505.1 Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 Revision Individual
12/31/2019
Robert Spinner
P1636 Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA) Revision Individual
12/31/2019
Mike Seavey





Chair
Mike Seavey
Northrop Grumman

Vice-Chair
Chris Gorringe
Spherea Technology

Secretary
Teresa Lopes
Teradyne