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  Working Groups
       - Automatic Test Mark-up Language          (ATML)
       - Diagnostic Maintenance and Control          (DMC)
       - Hardware Interfaces (HI)
       - Test and ATS Description (TD)
       - Test Information Integration (TII)

  Active Projects
       - IEEE P1445
       - IEEE P1514
       - IEEE P1636.2
       - IEEE P1641.1a
       - IEEE P1671.1
       - IEEE P1671.3
       - IEEE P1871.2
       - IEEE P1505.1
       - IEEE P1636

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IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems
Established 1966

Meeting Information

The next SCC20 17-2 meeting will be 9-10 September, 2017 at The Renaissance Hotel, Schaumburg, IL


  Please see the proposed agendas:



  Previous meeting minutes     




Chair
Mike Seavey
Northrop Grumman

Vice-Chair
Chris Gorringe
Spherea Technology

Secretary
Teresa Lopes
Teradyne