SCC20 Home Page

  IEEE SCC20
       - Policies and Procedures
       - SCC20 2015 Organization Chart
       - Member List
       - Meeting Information
       - Contact Us

  Working Groups
       - Automatic Test Mark-up Language          (ATML)
       - Diagnostic Maintenance and Control          (DMC)
       - Hardware Interfaces (HI)
       - Test and ATS Description (TD)
       - Test Information Integration (TII)

  Active Projects
       - IEEE P1445
       - IEEE P1514
       - IEEE P1636.2
       - IEEE P1641.1a
       - IEEE P1671.1
       - IEEE P1671.3
       - IEEE P1871.2
       - IEEE P1505.1
       - IEEE P1636

  Active Standards Status

  

  Document Repository (members only)

 

 

 

IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems
Established 1966

  Member List

  • Malcom Brown
  • Chris Gorringe
  • Anand Jain
  • Teresa Lopes
  • Steve Mann
  • Ion Neag
  • Leslie Orlidge
  • Mike Seavey
  • John Sheppard
  • Robert Spinner
  • Joseph Stanco
  • Bill Ross



Chair
Mike Seavey
Northrop Grumman

Vice-Chair
Chris Gorringe
Spherea Technology

Secretary
Teresa Lopes
Teradyne