This schema defines the information associated with a Test Station or a Test Adapter. List of non power facilities requirements Cooling requirements. Non-power interfaces. A reference to the documents which describe facility requirments for the Test Station or Test Adapter. List of location and address of instruments. Where the component is located physically (reference designator). The address used to communicate with the component. The Station or Test Adapters controller. Installed operating systems. List of available video capabilities. List of available audio capabilities. Processor information. x86, PPC, SPARC, etc. Pentium M, Power PC, etc. Clock speed. List of available system peripherals. List of installed software, A list of software associated with this test station or test adapter, in addition to controller software (i.e. Self-Test, Cal) Signal paths through test station or test adapter. The path could consist of wiring and switching. Begin and end nodes. Could be nodes associated with one section of wire or the begin and end nodes of a path composed of multiple wires and/or switches. XPath path identifying the node. ID of the document in which the node is defined. If not speciifed, the node is defined in the same document. The signal losses associated with this path. Signal loss through this path at specified frequency. Frequency range associated with this loss. Delay time of signal through this path (electrical length) Voltage Standing Wave Ratio (VSWR) associated with this path. VSWR for path. Frequency range associated with this VSWR. S-parameters associated with this path.