Conditions under which the specifications are measured. These conditions apply to all specifications. Each individual specification can add additional conditions, or override/replace the any of these conditions. Specifies traceability information for all specs A grouping of specifications that share a set of conditions. Conditions under which the grouped specifications are measured. Each individual specification can add additional conditions, or override/replace any of these conditions. A short (one or two sentence) textual description of the specification A rigorous (mathematical) description of how the specification is defined and measured Conditions under which this specification is measured. The limits for the specification. Supplies graphical data for specifications that vary with other parameters. Some specs are only available in graphical format. Supplying a bitmap of the graph is one way to satisfy this requirement; the other is to ask the vendor to include all the data, but that would lose important annotations from the graph itself. Any additional information that is necessary to clarify the specification. This includes information that is contained in footnotes of the datasheet Instrument options that are required for this spec to be valid Instrument options that make this spec invalid TestEquipment Item Instance Type List of location and address of instruments. Where the component is located physically (reference designator). The address used to communicate with the component. The Station or Test Adapters controller. Installed operating systems. List of available video capabilities. List of available audio capabilities. Processor information. x86, PPC, SPARC, etc. Pentium M, Power PC, etc. Clock speed. List of available system peripherals. List of installed software, A list of software associated with this test station or test adapter, in addition to controller software (i.e. Self-Test, Cal) Signal paths through test station or test adapter. The path could consist of wiring and switching. Begin and end nodes. Could be nodes associated with one section of wire or the begin and end nodes of a path composed of multiple wires and/or switches. XPath path identifying the node. ID of the document in which the node is defined. If not speciifed, the node is defined in the same document. The signal losses associated with this path. Signal loss through this path at specified frequency. Frequency range associated with this loss. Delay time of signal through this path (electrical length) Voltage Standing Wave Ratio (VSWR) associated with this path. VSWR for path. Frequency range associated with this VSWR. S-parameters associated with this path. Self test last run ETE on Test Station or Test Adapter. Date self test last run ETE on Test Station or Test Adapter. Subsystem calibrated (used if separte calibration is done on subsystems) Subsystem calibrated Date subsystem last calibrated Frequency which calibration is required to be run. Current station configuration. (i.e RF, Digital, EO) Current health of Test Station or Test Adapter.