This schema is specified in IEEE Std 1671.6-2008, "IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML:Exchanging Test Station Descriptions." This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATML Test Station component defined in IEEE Std 1671.6-2008,"IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML:Exchanging Test Station Descriptions." The purpose of this schema is to allow the creation of IEEE Std 1671.6-2008 Test Station Description instance documents. This schema uses the W3C XML Schema definition language as the encoding. This allows for interoperability and the exchange of ATML component instances between various systems. This schema shall not be modified but may be included in derivative works. Copyright (c) 2009 Institute of Electrical and Electronics Engineers, Inc. USE AT YOUR OWN RISK This schema defines the information associated with a Test Station. This element is a list of all instruments in the test station. Where the instrument is located physically (reference designator). The address used to communicate with the instrument. ID for the instrument