ATML Status

ATML Status

Goal

To have all the IEEE 1671 'dot' standard balloted called by Q2-2008.

ATML Candidate Schemas are available at http://grouper.ieee.org/groups/scc20/ATML/

Test Results

	Instrument Description
	Test Description
	UUT Description

	Test Equipment (formally Test Adaptor & Test Station)
	Test Configuration

TII ATML Standards

IEEE 1671 ATML Overview & Architecture Trial-Use Standard:

•

	IEEE Std. 1671-2006^tm Published December 2006
	ATML Common and Hardware Common Schemas (version 1.01) and posted towards IEEE download site http//standards/ieee.org/downloads/1671 Errata describing differences between 1.01 and 1.07

P1671.3 (UUT Description) Trial-Use Standard:

–written, reviewed and to start the formal ballot process by Feb 2007

–to submit as a trial-use standard by Q4 2007

–

•P1671.4 (Test Configuration) Trial-Use Standard:

	–written, reviewed and to start the formal ballot process by Feb 2007
	–to submit as a trial-use standard by Q4 2007

–

•P1671.2 (Instrument Description) Trial-Use Standard:

	–written, reviewed and to start the formal ballot process by Apr 2007
	–Incorporate Synthetic Working Group (SIWG) material by Jul 2007
	–to submit as a trial-use standard by Q2 2008

–

•P1671.5 (Test Adapter) Trial-Use Standard:

	–written, reviewed and to start the formal ballot process by Jul 2007
	–to submit as a trial-use standard by Q3 2008

–

•P1671.6 (Test Station) Trial-Use Standard:

	–written, reviewed and to start the formal ballot process by Jul 2007
	–to submit as a trial-use standard by Q3 2008

P1671.1 (Test Description) Trial-Use Standard:

	–written, reviewed and to start the formal ballot process by Aug 2007
	–to submit as a trial-use standard by Q4 2008

P1636.1 (Test Results) Trial-Use Standard:

	–currently in ballot process
	–to submit as a trial-use standard by Sept 2007

TII Sub-committee

Operating Instructions (April 2005) √

ATML Framework 1671 (Chris Gorringe/Mike Seavey) √

	IEEE Par Approved (Nov 2004) √
	ATML Framework Draft (Review April 2005) √
	ATML Framework Requirements (Review April 2005) √
	ATML Framework Draft Document (H) (Oct 2005) √
	ATML Framework IEEE Editorial & Rev 2 (Jan 06)√
	ATML Framework Ballot (May 2006) √
	ATML Framework Ballot resolution & recirculation (July 2006) √
	ATML Framework 1671 Submitted to RevCon (Aug 2006) √
	IEEE Published as Trial-Use Standard (Dec 2006) √

ATML 'Capabilities XML Schema (Dan Pleasant)

	Requirements (Sept 2005) √
	Draft Schema Snippet - Component (May 2006) √
	Finalize inputs to other groups (June 2006) √
	Capabilities Schema (Aug 2006) √
	Draft Capabilities Annex (Dec 2006)√

UUT Description P1671.3 (John Ralph)

	Requirements (April 2005) √
	Draft Schema (Review June 2005) √
	Draft 2 Schema review (October 2005) √
	Candidate Schemas (Mar 2006) √
	Draft 3 of the P1671.3 Standards (Jan 2007) √
	Initiate Ballot Process (~Apr 2007)
	Ballot Date (2007)

Test Configuration P1671.4 (Tim Davis)

	Start (April 2005) √
	Requirements (July 2005) √
	Draft Schema (Review Oct 2006) √
	Candidate Schemas (July 2006) √
	Draft 3 of the P1671.4 Standard (Jan 2007) √
	Initiate Ballot Process (~Apr 2007)
	Ballot date (2008)

Test Station & Test Adapter

	Start (April 2005) √
	Requirements (July 2005) √
	Draft Schema (Jan 2006) √
	Final Draft Schama (May 2006)
	Candidate Schema (Jul 2006)
	Draft Standard (Jan 2007)
	Ballot date (2008)

TAD

Test Description P1671.1

Draft Schema review (Oct 2005) √

	The spec is developed by Mike Seavey and Ion
	They handle separate sections that we will merge when creating the Draft version.

Final Draft Schema (Jan 2006) √

Candidate Schema (May 2006) √

PAR (Oct 2005) √

Draft Standard (Nov 2006)

Ballot Date (Jan 2007)

Instrument Description P1671.2

	Draft Schema review (July 2005)√
	Final Draft Schema (Jan 2006)√
	Candidate Schema (May 2006) √
	PAR (Oct 2005) √
	Draft Standard (Apr 2007)
	Ballot Date (May 2007)

Project Authorisation Request (PAR) need to be approved by the IEEE NESCOM prior to any SCC-20 working group being established.

	ATML Framework PAR 1671 - Approved
	Diagnostics PAR 1232 - Existing & Updated for ATML
	SIMICA PAR 1636 - Expires 12/07
	Test Results PAR 1636.1 - Approved
	MAI PAR 1636.2 - PAR Approved
	Test Description PAR 1641.1 - Approved
	Instrument Description PAR 1641.2 - Approved
	UUT Description – PAR Review - Approved
	Test Configuration - PAR - Approved
	Test Station &Test Adapter - Approved

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Last updated: 03/26/07.