| Log Number |
Description |
|
001 |
1671 PAR |
|
002 |
TII Operating Procedures
Draft
1
—26th
Apr 04,
2005 |
|
003 |
P1671 Requirements Document v1.01 26th April 2005 |
|
004 |
ATML-IEEE Status rev 4 28th April 2005 |
|
005 |
Standard
Automatic Test Markup Language (ATML) for Exchanging Automatic Test
Equipment and Test Information via XML
P1671-Draft A |
|
006 |
ATML Framework - An open
discussion V0.01 |
| 007 |
Scan of Letter from National Instruments 8 Sept
2005 |
|
008 |
Standard
Automatic Test Markup Language (ATML) for Exchanging Automatic Test
Equipment and Test Information via XML
P1671-Draft H |
|
009 |
ATML-IEEE Status rev 5(a) 28th Oct 2005 |
|
010 |
ATML-TII Common Terms (c) 28th Oct 2005 |
|
011 |
ATML-IEEE Status rev 6 Jan 2006 |
|
012 |
ATML-IEEE Status rev 9 Jan 2007 |
|
013 |
ATML Use cases & ATS Framework Support(F).ppt |
|
014 |
ATML Instrument Description Feedback from
Agilent.ppt |
|
|
|
|
|
|
|
|
|
|
