IEEE TTSG
(Test Technology Standards Group/Committee)

Team Members
Rohit Kapur ( Chair )

( TTSC Official Policies and Procedures )

---

Standards Working Groups

---

E-Mail List

TTSG Team
subscribe/unsubscribe stds-ttsg

---

Active Standards
Updated Status
Test Standards Overview Presentation

---

STIL test vector language (revision)
Tester Rules
Test Flows
Analog STIL
Memory CTL
P1718: Open Compression Interface
Standard test data format
Analog Boundary Scan
Reduced Pin Boundary Scan
SCIT (1581)
iJTAG-1687 (Debug)
sJTAG
Fault Models

---

Private Information

---

TTSG Calender of Events (Meetings are at VTS and ITC)
Date	Location	Purpose/Agenda	Docs
VTS 2009 Apr xx (Mon), 2:30pm-3:30pm	VTS 08, Call-in	TTSG working meeting, Agenda	Docs for Meeting

TTSG Documents
Presentations	Working Documents	Minutes

---

IEEE TTSG Page is Maintained by
Rohit Kapur, Synopsys Inc. (650-584-1487) (rkapur@synopsys.com)
Last modified: Nov 2, 2008