IEEE TTSG
(Test Technology Standards Group/Committee)


Team Members
Rohit Kapur ( Chair )

( TTSC Official Policies and Procedures )

Standards Working Groups

E-Mail List
TTSG Team
subscribe/unsubscribe stds-ttsg


Active Standards
Updated Status
Test Standards Overview Presentation
STIL test vector language (revision)
Tester Rules
Test Flows
Analog STIL
Memory CTL
P1718: Open Compression Interface
Standard test data format
Analog Boundary Scan
Reduced Pin Boundary Scan
SCIT (1581)
iJTAG-1687 (Debug)
sJTAG
Fault Models
Private Information

TTSG
Calender of Events
(Meetings are at VTS and ITC)
Date Location Purpose/Agenda Docs
ITC 2008
Oct 27 (Mon), 2:30pm-3:30pm 		VTS 08, Call-in TTSG working meeting, Agenda Docs for Meeting



TTSG Documents
Presentations Working Documents Minutes


IEEE TTSG Page is Maintained by
 Rohit Kapur, Synopsys Inc. (650-584-1487) (rkapur@synopsys.com)
Last modified: May 22, 2008