Parametric Testing of Passive Components Using Power Supply Current Monitoring - Experiments with a P1149.4 Test Chip

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Table of Contents

Parametric Testing of Passive Components Using Power Supply Current Monitoring - Experiments with a P1149.4 Test Chip 

Outline: 

Parametric Measurement of Passive Components 

Parametric Measurement of Passive Components 

Parametric Measurement of Passive Components 

Parametric Measurement of Passive Components 

The Power Supply Based Method 

The Power Supply Based Method 

Comparison of the three methods 

Comparison of the three methods 

Experimental Results 

Experimental Results 

Experiments with the Matsushita Analogue Boundary Test Chip (MNABST-1) 

Performance degradation 

Performance degradation 

Performance degradation 

Performance degradation 

Measurement of R1+R2 

Measurement of C1 

Measurement of C2,R2 

Conclusions

Author: Jose Machado da Silva