Phone Conference P1450.1 Working Doc Subgroup
Thurs, Mar 4, 2004, 10:00 am PST
Attendees:
Tony Taylor (chair)
Greg Maston (scribe)
John Cosley
Dan Fan
Peter Wohl
Bruce Kaufman
Doug Sprague
Jose Santiago
Rohit Kapur (briefly)
Documents
http://grouper.ieee.org/groups/1450/private/P1450.1-D18.pdf
(ballot draft)
http://grouper.ieee.org/groups/1450/private/P1450.1-D19.pdf
(latest draft - with changes)
http://grouper.ieee.org/groups/1450/private/P1450.1-D19-ballot-resolution.pdf
(issues & resolutions)
http://grouper.ieee.org/groups/1450/private/P1450.1-votes.pdf
(ballot results)
Agenda
1. final ballot results
2. ballot resolution doc
- new comments from DB
- assignees listed in resolution field
- status code: TBD, REVIEW, DONE, REJECT
3. status and issues by person
- Tony (various)
- Greg/expression-sub-group
- Rohit (cell groups)
- Dan (parallel patterns)
- Peter (pattern fail reporting)
- Jose (Rohit's other issues)
4. planned activities for next week
Meeting discussion
IEEE meeting clearances
Nothing under discussion or presentation for this meeting was identified
as being proprietary or restricted.
1: Balloting
--------------
Ballot finally closed after being extended for 10 days due to
non-responders. Achieved all IEEE criteria for successful first ballot
pass but need to do negative ballot and comment resolution (process that
is starting now).
ABSTAIN | 2 |
YES | 33 |
NO | 6 |
RETURNS | 85.4% |
APPROVE | 84.6% |
2: Process question
-------------------
Bruce asked what is the process. Response is: we do review of all comments
now, to our knowledge there is not a time limit to this
process as long as we make progress. At the end of this process we need to
do a "recirculation ballot" to review any technical changes to
the draft, to the same balloting group, during which the balloting group
has the ability to change their original response (and submit
more comments). We again resolve negative ballots, but in the
recirculation process we are allowed to "agree to disagree" with
negative balloters if the issues are not resolvable (for instance,
disagreements about scope of the effort may be acceptable negative
issues). Depending on whether technical changes are made to the document
at this point, a recirculation may be necessary again
(changes for editorial comments do not require recirculation). The number
of re-circulations is unlimited but realistically too many
iterations indicate lack of a standard.
DS-1 : hex compaction of fail data
----
Review of pg 65,66 of D-19, line 1043 - string of H and L's. Peter made
the proposal to support the use of the hex compaction construct,
as defined in dot-zero. Use \h to change to hex, also support \r. \d
doesn't make sense in this context (there is not an explicit length
on this data), so don't recommend the use of \d.
The WG raised no objections to this proposal.
Subsequent discussion identified that the characters being used in this
context (H,L,T) are not truly WFCs, they are fail-events. Greg
identified that the wfc-list resolution process does not rely on the WFCs
being defined, as the process is two-step - the first part
expands a wfc_list into a set of characters, and the second step (for
patterns) resolves each character against a signal/WFT/waveform
context. The second step is not used in the PatternFailReport.
This identified that in order to use the dot-zero Base for a sigref in
this context, the Base must specify at least one and possibly all H,
L, and T "wfcs" (depending on how many of these states actually failed).
This has an *implication* that H, L, and T might be good WFCs
to use on the Pattern side of things as well, if the same sigref is used
in both the PatternFailReport and the Pattern. While this
perspective is true, a recommendation to use explicit mapping with \hHLT
(or whatever fail states are required), and \w to switch to
individual character constructs in the context of the PatternFailReport
was seen to be the best way to avoid any perspective
that the PatternFailReport constructs were impacting Pattern constructs.
DS-2 : identify/classify 'type' of fail in PatternFailReport
----
The request is to support some construct of defining addition information
that indicates more information about the context of the
failure.
Concern is that "classification" of failures is not uniformly defined in
the industry; different companies with different testing strategies
and analysis flows classify things differently. Defining a keyword without
semantic intent is useless.
Peter raised the following example of reporting failures from the same
pattern with different voltages and temperatures. The desire is to log
these conditions as part of the fail data. The problem is that we don't
know the entire set of conditions, or even the values to
apply... the set of conditions is too open-ended and dependent on each
application.
The proposal from the WG is to recommend the use of UserKeywords or
Annotations to address this functionality. Doug, as submitted of this
issue, accepted this, but this issue was raised another time as well
(below).
It was also pointed out that the X statement itself is a label that can
have meaning to a consumer of pattern fail data. The X label is in every
fail record and a user/tool convention could be used to interpret fails
according to this label. An example given was for memory fails.
DM-9 : parallel pat - delay start of a pattern (to allow patterns to end
together)
----
The response of the WG is: it is valid to delay the start, but there are
no special constructs to support a mechanism to delay a pattern
application. The recommendation of the WG is that if a user wants to delay
the start of a pattern, they define and insert a
padding/synchronization pattern to define that delay.
Subsequent discussion in the WG identified that for all applications that
the WG was familiar with, synchronizing to the START of an
operation was key functionality; no applications where synchronizing from
the END of an operation is known.
DM-10 : question about Wait
------
Dan presented on the use of Wait in Figure 1, and raised the question
about whether each of the blocks (patlist,parallelpatlist, patset)
*should* start executing before another one of the blocks completed.
Several WG members identified the perspective that each of these blocks
operate as an independent container of operation, and that *if*
things are meant to operate in parallel then they need to be identified by
common containers (using hierarchical patternbursts as
necessary with ParallelPatLists as necessary).
This perspective eliminates the need for Wait, for by definition, each
container does a Wait for the last pattern to complete.
This led to a discussion about Fixed. As currently defined, Fixed is
placed on a Pattern but is defined to affect signals outside of the
Pattern (in fact, not used by any of the Patterns of this block). This
functionality can be totally addressed by defining a 1-line Pattern
that contains a Fix statement for this signals, and referencing this
Pattern in the block. This is seen to be more direct and less
ambiguous solution without requiring additional syntax constructs.
Proposal from Dan is to remove the Wait and Fixed constructs in the
PatternBurst. The WG accepted this conclusion. Tony and Dan to review
implementing this.
DB-4
----
This issue is the same as DS-2; closed as above, but need acceptance by
this reviewer.
GM-5
----
Simple issue, need to change * to + in the ActiveScanChain syntax
description.
DM-11 : what happens w/no extend in the PatternBurst?
-----
The WG started a discussion about what does happen. This led to the
conclusion that the text on pg. 37, under 'Extend' needs to be
elaborated. The paragraph on Extend needs to either elaborate on
definition of 'tile' or use different terminology. Also need to
clarify the behavior between extend, breakpoint application, and pattern
aligning. For instance: what happens for two parallel patterns
that both have Extend *and* a BreakPoint with Vectors, but don't align on
vector boundaries, and each has a large different prime number for
the period? does the test run until the first time both periods coincide
at the multiple of these two prime numbers?
DB-1 : what does a tester have to do to be compliant w/.1
----
Tony identified a new proposed annex O. Greg identified that there is good
information here, but that any use of the term "subset" will
raise major red flags and scope issues at the IEEE level, and must be
avoided at all costs.
Greg provided the following response for review:
To be compliant with a standard, you have to apply all parts of that
standard that make sense in your application. There are *always* parts
of a standard that do not make sense for a specific application, for
instance a hardware circuit description may not use part of the
defined circuitry because the functionality supported by that part of the
circuitry is not part of the current design.
Likewise, not all parts of dot-one will be used or usable in all
applications. The identification of unusable parts is the
responsibility of the application.
DM-14 : scanlength optional
-----
Some members reviewed and accepted this proposal, but other members of the
WG raised concerns. This was tabled for additional review.
DM-22 : use of term 'namespace'
-----
This issue was discussed; the WG was comfortable with the current
terminology and "something better" was not identified. The submitters
proposal of "object" is seen to carry an implementation context with it.
Resolution of the WG is don't change this.
DM-22
-----
Tony asked the WG to review the first paragraph in subclause 6.4, meant to
address this issue.
Next Actions
------------
The Expression Review Subgroup organized a meeting for Wed Mar 10, 9am
PST, same access code, to discuss expressions.
Meeting adjourned at 11:39 pm PST.
Next meeting
Thursday, March 11, 2004, 10:00 to 11:30AM, PST
AIs
[AI1] Tony - Post raw data files to the web (passwd protected)