1 // XLATION NOTE: Methods and parameters accepted at face value
  2 TestProgram production {
  3   // ================================================================
  4   // **** BINNING ****
  5   // NOTE: presumes implicit STIL defined SoftBin NoBin
  6   PassBins {
  7     // Implicit anonymous Axis
  8     SoftBin Good { Descriptor = "Good Device"; }
  9   
 10     HandlerMap default {
 11         HardBin 1 [Good];
 12     }
 13   }
 14   // NOTE: reason for separating pass and fail maps:
 15   // PassBins {
 16   //   Axis freq {
 17   //       SoftBin Indeterminate { Descriptor = "Good Device";        }
 18   //       SoftBin 50Mhz         { Descriptor = "Good  50Mhz Device"; }
 19   //       SoftBin 100MHz        { Descriptor = "Good 100MHz Device"; }
 20   //   }
 21   //   Axis pwr {
 22   //       SoftBin  5% { Descriptor = "Good Device +-  5%"; }
 23   //       SoftBin 10% { Descriptor = "Good Device +- 105"; }
 24   //   }
 25   //   HandlerMap default {
 26   //       HardBin 1 [100MHz,  10%];
 27   //       HardBin 2 [100MHz,  5%];
 28   //       HardBin 3 [50Mhz, 5%|10%];
 29   //       HardBin 4 [Indeterminate, *];
 30   //   }
 31   // }
 32   FailBins {
 33     // Implicit anonymous Axis
 34     SoftBin Fail_Opens {}
 35     SoftBin Fail_Shorts {}
 36     SoftBin Fail_Icc { Descriptor = "Failed static Icc"; }
 37     SoftBin Fail_InputLeakage {}
 38     SoftBin Fail_dcStuckCore {}
 39     SoftBin Fail_acPathCore {}
 40     SoftBin Fail_Functional {}
 41     SoftBin Fail_PLL {}
 42     SoftBin Fail_Iddq {}
 43   
 44     HandlerMap default {
 45       // NOTE: logic presumes bit-wise behavior
 46       HardBin 7 [  Fail_Opens | Fail_Shorts ];
 47       HardBin 8 [!(Fail_Opens | Fail_Shorts)]; // Any FailBin other than these
 48     }
 49   }
 50   // ================================================================
 51   // **** TEST METHOD DECLARATIONS ****
 52 
 53   // NOTE: STIL.4 defined default. It's presence here is neither
 54   // necessary nor harmful.
 55   Method Test {
 56     // STIL.4 defined parameters can not be replaced, only added to
 57     InOut const SoftBin DefaultFailBin = NoBin; // Default
 58 
 59     Out Bool     Failed;  // Fail flag
 60     Out Integer  Status;  // For integer or bit-wise arithmetic
 61     Out NrwUnits Result;  // Scalar
 62     // 1 to N dimensioned array not covered
 63 
 64     // STIL.4 defined actions can be replaced
 65     PreActions {}
 66     PostActions {}
 67     Fail OnCondition <anytest>.Fail {
 68       BinAndStop;     // Uses DefaultFailBin, set by derived Method (NoBin = no action)
 69     }
 70     Pass {}           // No Condition (necessary|permitted)
 71     }
 72 
 73   Method Contact {
 74     In    SignalRefExpr pins;
 75     In    Amperes       Current;
 76     In    Volts         ShortsLimit = '200mV';               // Default
 77     In    Volts         OpensLimit  = '1V';                  // Default
 78     In    Seconds       Delay       = '0s';                  // Default
 79     InOut const String  Title       = "Opens / Shorts Test"; // Default
 80     // ? Diodes = VssDiode;
 81 
 82     Private const Integer FailOpens  = 1;
 83     Private const Integer FailShorts = 2;
 84 
 85     Execute Object<STIL or user defined method(s)>;
 86 
 87     ExitPort Fail {                            // Method "Test" override (inherits condition)
 88       if      (<thistest>.Status | FailOpens)  // Bit comparison
 89         BinAndStop(Fail_Opens);
 90       else if (<thistest>.Status | FailShorts) // Bit comparison
 91         BinAndStop(Fail_Shorts);
 92       else
 93         Exception("Unexpected Contact Status: " + String(<thistest>.Status) + ".");
 94     }
 95   }
 96 
 97   // Placeholders
 98   Method Connect       { <Assume to be STIL.5 declared> }
 99   Method Current       { <Assume to be STIL.5 declared> }
100   Method Delay         { <Assume to be STIL.5 declared> }
101   Method Frequency     { <Assume to be STIL.5 declared> }
102   Method IDDQ_PMU      { <Assume to be STIL.5 declared> }
103   Method NullOperation { <Assume to be STIL.5 declared> }
104   Method Pattern       { <Assume to be STIL.5 declared> }
105   Method PinMode       { <Assume to be STIL.5 declared> }
106   Method Search        { <Assume to be STIL.5 declared> }
107   Method Setup         { <Assume to be STIL.5 declared> }
108   Method SpecContext   { <Assume to be STIL.5 declared> }
109   Method Voltage       { <Assume to be STIL.5 declared> }
110   // ================================================================
111   // **** DEFAULTS ****
112   // Defaults for the harness of FlowNode and/or any Method.  Defaults
113   // are applied during object initialization.
114   Defaults {
115     // NOTE: STIL.4 defined default. It's presence here is neither
116     // necessary nor harmful.
117     FlowNode {
118       PreActions {}
119       PostActions {}
120       ExitPort Fail OnCondition test.Fail {
121           Goto end;     // End of parent Flow
122       }
123       ExitPort Pass {
124           Goto next;    // Next node in nodelist
125       }
126     }
127   
128     // Add a parameter to STIL defined Method Test
129     Method Test {
130       InOut const String Title = "";
131     }
132   }
133   // ================================================================
134   // **** TEST OBJECT DEFINITIONS/INSTANTIATIONS ****
135   // NOTE: named define-before-use instantiations only: anonymous
136   // instantiations may occur inline.
137   TestObject Flow Device_1 {
138     Title  = "Stuck Fail";
139     Execute Method Setup  {DCLevels = "NomLevels";}
140     Execute Method Delay  {Delay = '50ms';}
141     Execute Method Connect{SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
142     Execute Method PinMode{SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
143     Execute Method Delay  {Delay = '2ms';}
144     Execute Method PinMode{SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
145     Execute Method Delay  {Delay = '2ms';}
146     Execute Method Pattern{SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_stuck";BurstMode = True;}
147     Execute Method Connect{SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
148   }
149   // ----------------------------------------------------------------
150   TestObject Flow Device_2 {
151     Title  = "Good Device";
152 
153     // XLATION NOTE: need more detail about scope of behavior of "ExecutionMode IgnoreAllFails"
154 
155     Execute Method Setup   {DCLevels = "NomLevels";}
156     Execute Method Delay   {Delay = '50ms';}
157     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
158     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
159     Execute Method Delay   {Delay = '2ms';}
160     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
161     Execute Method Delay   {Delay = '2ms';}
162     Execute Method Voltage {SignalRefExpr = '"FPGA_OK"';Force Current = '10uA';Min V = '2V';Delay = '2ms';}
163     Execute Method Delay   {Delay = '2ms';}
164     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_GoodConfig";BurstMode = True;}
165     Execute Method Delay   {Delay = '2ms';}
166     Execute Method Voltage {SignalRefExpr = '"FPGA_OK"';Force Current = '10uA';Min V = '-1V';Max V = '1V';Delay = '2ms';}
167     Execute Method Delay   {Delay = '2ms';}
168     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
169   }
170   // ----------------------------------------------------------------
171   TestObject Flow Device_3 {
172     Title = "ac Fault";
173     Execute Method Connect {SignalRefExpr = 'DELAYENABLE';Resource = PE;Action = Apply;Delay = '0s';}
174     Execute Method PinMode {SignalRefExpr = 'DELAYENABLE';DriverMode = High;Compar­atorMode = NoChange;}
175     Execute Method Setup   {DCLevels = "NomLevels";}
176     Execute Method Delay   {Delay = '50ms';}
177     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
178     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
179     Execute Method Delay   {Delay = '2ms';}
180     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
181     Execute Method Delay   {Delay = '2ms';}
182     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_GoodConfig";BurstMode = True;}
183     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
184   }
185   // ----------------------------------------------------------------
186   TestObject Flow Device_4 {
187     Title = "Chain Race";
188     Execute Method Setup   {DCLevels = "NomLevels";}
189     Execute Method Delay   {Delay = '50ms';}
190     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
191     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
192     Execute Method Delay   {Delay = '2ms';}
193     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
194     Execute Method Delay   {Delay = '2ms';}
195     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_scrace";BurstMode = True;}
196     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
197   }
198   // ----------------------------------------------------------------
199   TestObject Flow Device_5 {
200     Title = "Stuck Chain";
201     Execute Method Setup   {DCLevels = "NomLevels";}
202     Execute Method Delay   {Delay = '50ms';}
203     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
204     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
205     Execute Method Delay   {Delay = '2ms';}
206     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
207     Execute Method Delay   {Delay = '2ms';}
208     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_scstuck";BurstMode = True;}
209     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
210   }
211   // ----------------------------------------------------------------
212   TestObject Flow Device_6 {
213     Title = "Stuck & Broke";
214     Execute Method Setup   {DCLevels = "NomLevels";}
215     Execute Method Delay   {Delay = '50ms';}
216     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
217     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;Comparator­Mode = NoChange;}
218     Execute Method Delay   {Delay = '2ms';}
219     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;Comparator­Mode = NoChange;}
220     Execute Method Delay   {Delay = '2ms';}
221     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = "Exec_stuck_broke";BurstMode = True;}
222     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
223   }
224   // ----------------------------------------------------------------
225   TestObject Flow DeviceConfig {
226     Title = "Device Programming";
227     // XLATION NOTE: don't know the meaning of "Action  { ''; Exit=1; }"
228     // XLATION NOTE: don't know what "Type UNCONDITIONAL" is
229     Execute Object Device_1;
230     Execute Object Device_2;
231     Execute Object Device_3;
232     Execute Object Device_4;
233     Execute Object Device_5;
234     Execute Object Device_6;
235   }
236   // ----------------------------------------------------------------
237   TestObject Flow LeakageTests {
238     Title = "Leakage Tests";
239     DefaultFailBin = Fail_InputLeakage;
240     Execute Method Current {SignalRefExpr = '"_in"';Force Voltage = '0V';Min I = '-10uA';Max I = '10uA';Delay = '800us';Measurement Sequence = MBB;Measurement Mode = Static;Max Expected Current = '100uA';}
241     Execute Method Current {SignalRefExpr = '"_in"';Force Voltage = '3V';Min I = '-10uA';Max I = '10uA';Delay = '400us';Measurement Sequence = MBB;Measurement Mode = Static;Max Expected Current = '100uA';}
242   }
243   // ----------------------------------------------------------------
244   TestObject Flow dcStuckTest {
245     Title = "DC Stuck At Tests";
246     DefaultFailBin = Fail_dcStuckCore;
247     Execute Method Pattern {SignalRefExpr = '"_so"';PatternExec = "dcStuckAtExec";}
248   }
249   // ----------------------------------------------------------------
250   TestObject Flow acPathTests {
251     Title "Path Delay Tests";
252     DefaultFailBin = Fail_acPathCore;
253     Execute Method SpecContext {CategorySelectorExpression = Engineer­ing+SpeedGrade;}
254     Execute Method Search      {SignalRefExpr = '_po_-"SO[7]"-"SO[10]"';PatternExec = "acPathExec";ResourceSignals = '"CLK"';Search Start = '1/30MHz';Search Stop = '1/130MHz';Upper Limit = '1/InternalFreq';SearchExpression = "acPathDe­lay";ResultVariable = #;}
255   }
256   // ----------------------------------------------------------------
257   TestObject Flow FunctionalTests {
258     Title = "Functional Tests";
259     DefaultFailBin = Fail_Functional;
260     Execute Method SpecContext {CategorySelectorExpression = Engineer­ing+SpeedGrade;}
261     Execute Method Pattern     {SignalRefExpr = 'fpins';PatternExec = "Exec_functional";}
262   }
263   // ----------------------------------------------------------------
264   TestObject Flow PllTests {
265     Title = "Phase Lock Loop Tests";
266     DefaultFailBin = Fail_PLL;
267     Execute Method SpecContext {CategorySelectorExpression = Engineer­ing+SpeedGrade;}
268     Execute Method Frequency   {SignalRefExpr = '"ClkOut"';Minimum Freq = '100MHz*(1-0.0002)';Maximum Freq = '100MHz*(1+0.0002)';Measure Mode = Continuous;Pat­ternExec = "Exec_pll";Output Mode = Average;ResultVariable = #;}
269   }
270   // ----------------------------------------------------------------
271   TestObject Flow IddqTest {
272     Title = "Iddq Tests";
273     DefaultFailBin = Fail_Iddq;
274     Execute Method SpecContext {CategorySelectorExpression = Engineer­ing+SpeedGrade;}
275     Execute Method IDDQ_PMU    {Test Pins = 'fpins';Meas Pin = 'IddqPin';DPS Pin = 'VCCINT';User Bits = 'Kidd';PatternExec = "Exec_Iddq";Measurement Mode = Dynamic;Delay = '2ms';Max I = '80uA';}
276   }
277   // ----------------------------------------------------------------
278   TestObject Flow Main {
279     // XLATION NOTE: didn't know what to do with Diodes = VssDiode;
280     Execute Method Contact {SignalRefExpr = 'all_pins';Current = '300uA';ShortsLimit = '200mV';OpensLimit = '1V';Delay = '300us';}
281     Execute Object DeviceConfig;
282     Execute Object LeakageTests;
283     Execute Object dcStuckTest;
284     FlowNode {
285       Execute Object acPathTests;
286       ExitPort Pass { Goto 51; }   // Inherit condition, override actions
287     }
288     FlowNode 41 {
289       Execute Object FunctionalTests;
290       ExitPort Pass { Goto 15; }   // Inherit condition, override actions
291     }
292     FlowNode 51 {
293       Execute Object PllTests;
294       ExitPort Pass { Goto 41; }   // Inherit condition, override actions
295     }
296     FlowNode 15 {
297       Execute Object IddqTest;
298     }
299     // XLATION NOTE: xlated intent, i.e., setting SoftBin PassAll is
300     // associated with Flow Main, not IddqTest or FlowNode 15
301     Pass { BinAndStop(PassAll); }
302   }
303   // ----------------------------------------------------------------
304   // NOTE: there is no reference to this flow
305   TestObject Connect Start {Title = "ConnectResources";SignalRefExpr = 'all_pins';Resource = PE;Action = Apply;Delay = '0s';}
306   // ----------------------------------------------------------------
307   TestObject Flow Finish {
308     Title = "RemoveResources";
309     Execute Method Connect {SignalRefExpr = 'all_pins';Resource = PE;Action = Remove;Delay = '0s';}
310     Execute Method SpecContext {CategorySelectorExpression = Engineer­ing+SpeedGrade;}
311     Execute Method Setup {DCLevels = "Zero";}
312   }
313   // ----------------------------------------------------------------
314   TestObject SpecContext Load {Title = "Spec Selection";CategorySelectorExpression = Engineer­ing+SpeedGrade;}
315   // ----------------------------------------------------------------
316   // NOTE: there is no reference to this flow
317   TestObject Flow Unload {
318   }
319   // ----------------------------------------------------------------
320   // NOTE: there is no reference to this flow
321   TestObject Flow Load_dcFault1 {
322     Execute Method Setup   {DCLevels = "NomLevels";}
323     Execute Method Delay   {Delay = '50ms';}
324     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Apply;Delay = '1ms';}
325     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Low;}
326     Execute Method Delay   {Delay = '2ms';}
327     Execute Method PinMode {SignalRefExpr = 'PROGRAM';DriverMode = Off;}
328     Execute Method Delay   {Delay = '2ms';}
329     Execute Method Pattern {SignalRefExpr = 'JTAG_PINS-TDO';PatternExec = FPGA_dcFault;}
330     Execute Method Connect {SignalRefExpr = 'JTAG_PINS+PROGRAM';Resource = PE;Action = Remove;Delay = '0s';}
331   }
332   // ----------------------------------------------------------------
333   TestObject NullOperation NoOp;
334   // ================================================================
335   // **** ENTRY POINTS  ****
336 
337   EntryPoints {
338     // Using inline code instead of predefined SpecContext Load
339     OnLoad             Execute Method SpecContext {Title = "Spec Selection";CategorySelectorExpression = Engineer­ing+SpeedGrade;};
340     OnPatternLoad      Execute Object NoOp;
341     OnStart            Execute Object Main;
342     OnReset            Execute Object NoOp;
343     OnPowerDown        Execute Object NoOp;
344     OnFinish           Execute Object Finish;
345     OnLotStart         Execute Object NoOp;
346     OnLotEnd           Execute Object NoOp;
347     OnWaferStart       Execute Object NoOp;
348     OnWaferEnd         Execute Object NoOp;
349     OnSiteStart        Execute Object NoOp;
350     OnSiteEnd          Execute Object NoOp;
351     OnMultiSiteEnable  Execute Object NoOp;
352     OnMultiSiteDisable Execute Object NoOp;
353   }
354   // ================================================================
355 }