Plan for dealing with new documents at the PatCom meeting
I believe there has been some confusion about expectations for next week's PatCom meeting. Let me clarify.
First, because of the short time between availability of the documents and the meeting, PatCom will not be requiring all comments about the documents to have been entered into the comment database. That said, I would strongly urge each person at the meeting to organize their thoughts consistent with the database:
- what's wrong with the current text and why is it wrong
- suggested changes to address the problem
but people will be allowed to speak even if they have not entered their comments. I strongly suggest that you plan to focus your discussion on ISSUES rather than on SPECIFIC LANGUAGE changes. A 50 person, face-to-face, drafting session is usually not the most productive.
Second, after this meeting, we will require the use of the database. This serves three purposes
- No comments are lost
- Rationale and justification are available to base a decision upon
- PatCom will be able to demonstrate due diligence in its decision making process
I strongly urge you to review all the comments that were provided on the documents developed by the ad hoc drafting committee and the responses to those comments. This document is available from:
http://grouper.ieee.org/groups/pp-dialog/drafting-committee/PatCom_comments_V5p0.pdf
Third, as I did at the March meeting, I will be limiting the number of opportunities for guests to speak and the discussion time allotted to each person. This is to insure we have time to move through the agenda.
I look forward to seeing everyone in beautiful Piscataway, NJ!!
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Don Wright don@lexmark.com
f.wright@ieee.org / f.wright@computer.org
Director of Standards
Lexmark International INCITS Executive Board Vice-Chair
C14/082-3 IEEE SA Standards Board Past Chair
740 New Circle Rd IEEE SASB Patent Committee Chair
Lexington, Ky 40550 Member: IEEE SA Board of Governors
859-825-4808 (phone) Member: IEEE CS SAB & W3C AC
603-963-8352 (fax) Director, IEEE-ISTO
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