Thread Links Date Links
Thread Prev Thread Next Thread Index Date Prev Date Next Date Index

New Documents for PatCom consideration




One hundred five (105) comments were received from the Extended Drafting Committee on the document resulting from the June PatCom meeting  The Core Drafting Committee has considered all these comments in over 15 hours of conference calls and the PP-Dialog website has been updated with these new documents. (Note that the contents of the former "Definitions" document have now been embedded within the Bylaws document for clarity.)  The redline versions of these documents are against the documents reviewed by the Extended Drafting Committee also available on the PP-Dialog web site.  Please go to http://grouper.ieee.org/groups/pp-dialog/drafting-committee/index.html for the documents.

All comments concerning the above referenced drafts must be entered using the PatCom Commenting Tool and must include document names, section numbers, page numbers and line numbers from the REDLINE versions of the above documents.  These documents will be reviewed at the September PatCom Meeting.  Only those comments duly recorded in the PatCom Commenting Tool and submitted as described below will be discussed there.  (This applies to both PatCom members and non-members.)  The deadline for submission of comments is 5PM EDT September 1, 2006.  Your output from the commenting tool shall be e-mailed to David Law (David_Law@3com.com).

***************************************************************************
Don Wright                     don@lexmark.com
                               f.wright@ieee.org / f.wright@computer.org
Director of Standards
Lexmark International          INCITS Executive Board Vice-Chair
C14/082-3                      IEEE SA Standards Board Past Chair
740 New Circle Rd              IEEE SASB Patent Committee Chair  
Lexington, Ky 40550            Member: IEEE SA Board of Governors
859-825-4808 (phone)           Member: IEEE CS SAB & W3C AC
603-963-8352 (fax)             Director, IEEE-ISTO
***************************************************************************