ATML Standards Published Baseline – 27 Sept 2011
All the
ATML schemas are now published on the IEEE download site http://standards.ieee.org/downloads/
Each standard is published with its own support files
adhering to the version of common schemas available at the time of the ballot.
and states something along the lines of “The Common.xsd and
HardwareCommon.xsd schemas located in this folder are to be utilized with the
xxxDescription.xsd and xxxInstance.xsd schemas for the duration of the
trial-use period of the IEEE 1671x-200x standard.”
|
Description |
Download Site |
Schema |
Namespace |
Version |
prefix |
|
ATML Common Schemas |
urn:IEEE-1671:2010:Capabilities |
1.10 |
ca: |
||
|
urn:IEEE-1671:2010:Common |
3.17 |
c: |
|||
|
urn:IEEE-1671:2010:HardwareCommon |
3.12 |
hc: |
|||
|
urn:IEEE-1671:2010:TestEquipment |
1.12 |
te: |
|||
|
urn:IEEE-1671:2010:WireLists |
1.11 |
w: |
|||
|
ATML Test
Description |
urn:IEEE-1671.1:2009:TestDescription |
1.01 |
td: |
||
|
urn:IEEE-1671:2009.02:Common |
3.02 |
c: |
|||
|
urn:IEEE-1671:2009.02:HardwareCommon |
3.02 |
hc: |
|||
|
ATML Instrument
Description |
urn:P-IEEE-1671.2:2008.02:InstrumentDescription |
0.29 |
inst: |
||
|
urn:P-IEEE-1671.2:2008.01:InstrumentInstance |
0.06 |
insti: |
|||
|
urn:IEEE-1671:2008.01:Common |
2.02 |
c: |
|||
|
urn:IEEE-1671:2008.01:HardwareCommon |
2.04 |
hc: |
|||
|
ATML UUT
Description |
urn:IEEE-1671.3:2008.01:UUTDescription |
1.04 |
uut: |
||
|
urn:IEEE-1671.3:2008.01:UUTInstance |
1.02 |
uuti: |
|||
|
urn:IEEE-1671:2008.01:Common |
2.02 |
c: |
|||
|
urn:IEEE-1671:2008.01:HardwareCommon |
2.04 |
hc: |
|||
|
ATML Test
Configuration |
urn:IEEE-1671.4:2008.01:TestConfiguration |
1.02 |
tc: |
||
|
urn:IEEE-1671:2008.01:Common |
2.02 |
c: |
|||
|
urn:IEEE-1671:2008.01:HardwareCommon |
2.04 |
hc: |
|||
|
ATML Test Adaptor
Description |
urn:P-IEEE-1671.5:2008.03:TestAdapterDescription |
0.15 |
ta: |
||
|
urn:P-IEEE-1671.5:2008.03:TestAdapterInstance |
0.12 |
tai: |
|||
|
urn:IEEE-1671:2008.01:Common |
2.03 |
c: |
|||
|
urn:IEEE-1671:2008.01:HardwareCommon |
2.04 |
hc: |
|||
|
urn:P-IEEE-1671:2008.03:TestEquipment |
0.23 |
te: |
|||
|
ATML Test Station
Description |
urn:P-IEEE-1671.6:2008.03:TestStationDescription |
0.15 |
ts: |
||
|
urn:P-IEEE-1671.6:2008.03:TestStationInstance |
0.12 |
tsi: |
|||
|
urn:IEEE-1671:2008.01:Common |
2.03 |
c: |
|||
|
urn:IEEE-1671:2008.01:HardwareCommon |
2.04 |
hc: |
|||
|
urn:P-IEEE-1671:2008.03:TestEquipment |
0.23 |
te: |
|||
|
|
|||||
|
IEEE 1641Signal
& Test Definition |
urn:IEEE-1641:2010:STDBSC |
2.01 |
[std:] |
||
|
urn:IEEE-1641:2010:STDTSFLib |
2.01 |
[tsf716:] |
|||
|
urn:IEEE-1641:2010:STDTSF |
2.01 |
[tsf:] |
|||
|
SIMICA Test Results |
http://www.ieee.org/ATML/2007/TestResults |
2.02 |
tr: |
||
|
http://www.ieee.org/ATML/2006/Common |
1.06 |
c: |
|||
|
SIMICA Maintenance
Action Information |
urn:P-IEEE-1636.2:2010.01:MaintenanceActionInformation |
1.1 |
mai: |
||
|
|
|
urn:IEEE-P1636-2010.01:SimicaCommon |
1.02 |
sc: |
|
|
|
|
urn:IEEE-1671:2009.03:Common |
3.11 |
c: |
|
Guidance on the use of the
ATML and its related family of standards can be best seen and understood by reading
the various ATML demonstration reports and descriptions. These Demonstrations
provide insight into the use of the standards and provide various examples and
use cases that the user may find useful
·
2008 Phase 1 – Working Together
·
2009 Phase II – Read For Use
·
2010 Phase III – Operational Systems
ATML Development Baseline – 27 Sept 2011
Access to the latest
development schemas is provided below.
Users should be aware that
these may changes and that tools and applications may not support these
versions
|
urn:IEEE-1671:2010:Capabilities |
1.10 |
ca: |
|
|
urn:IEEE-1671:2010:Common |
3.17 |
c: |
|
|
urn:IEEE-1671:2010:HardwareCommon |
3.12 |
hc: |
|
|
urn:IEEE-1671:2010:TestEquipment |
1.12 |
te: |
|
|
urn:IEEE-1671:2010:WireLists |
1.11 |
w: |
|
|
|
|
|
|
|
urn:IEEE-1671.1:2009:TestDescription |
1.03 |
td: |
|
|
|
|
|
|
|
urn:IEEE-1671.2:2009.03:InstrumentDescription |
1.09 |
inst: |
|
|
urn:IEEE-1671.3:2009.03:UUTDescription |
1.10 |
uut: |
|
|
urn:IEEE-1671.4:2009.03:TestConfiguration |
1.09 |
tc: |
|
|
urn:IEEE-1671.5:2009.03:TestAdapterDescription |
1.06 |
ta: |
|
|
urn:IEEE-1671.6:2009.03:TestStationDescription |
1.06 |
ts: |
|
|
|
|
|
|
|
urn:IEEE-1636.1:2011:01:TestResults |
4.00 |
tr: |
|
|
urn:IEEE-1636.2:2010:MaintenanceActionInformation |
2.00 |
mai: |
|
|
urn:IEEE-P1636.99:01:SimicaCommon |
2.00 |
sc: |
|
|
|
|
|
|
|
urn:IEEE-1641:2010:STDBSC |
2.01 |
[std:] |
|
|
urn:IEEE-1641:2010:STDTSFLib |
2.01 |
[tsf716:] |
|
|
urn:IEEE-1641:2010:STDTSF |
2.01 |
[tsf:] |
Instance & emerging Schemas
|
urn:IEEE-1671.2:2009.03:InstrumentInstance |
1.09 |
insti: |
|
|
urn:IEEE-1671.3:2009.03:UUTInstance |
1.08 |
uuti: |
|
|
urn:IEEE-1671.5:2009.03:TestAdapterInstance |
1.06 |
tai: |
|
|
urn:IEEE-1671.6:2009.03:TestStationInstance |
1.06 |
tsi: |
|
|
|
|
|
|
|
urn:IEEE-1641:2010:STDTSFLib |
2.01 |
|
Notes
The ATML
schemas at this location represent the ATML Development baseline. These schemas
may differ from those in the ‘Standard’ download location as they incorporate
current developments and improvements expected to be incorporated in the full
revisions to the Standard schemas.
The key
differences are that we’ve elected to use the release namespace for the 1641,
1671 base, and 1671.1 schemas and have updated the other schemas and examples
accordingly.
These Schemas have
been updated inline with the namespace prefex standard names being adopted
All
schemas not released as part of a Standards document have a unique XML
namespace that includes their candidate number and version. This naming
convention avoids invalidation of any XML instance documents. The format of
these namespaces is: "urn:<Std Name>:<Year
>[.<Candidate Number>]:<Schema Name>"