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RE: [SCC20TDS] SCC20 TII/TAD October Working Group Meeting Announcement



Following on from the TII/TAD Notice for the October Working Group Meeting notice from Chris:

        More information about the meeting rooms at National Instruments Facility:
Location - Meet in the lobby of Building C in the Mopac Campus. (see Campus map below).
Address - 11500 N. Mopac Expwy. Austin, TX  78759 (
see - http://www.ni.com/contact/map2hq.htm)
Hotel -  They have a few rooms left - Aloft @ Domain - 11601 Domain Drive, Austin,  Texas 78758 - Phone: (512) 491-0777 - Ask for the National Instruments rate - $99
 
If you are planning to attend please send the following information to Anand Jain (National Instruments) (anand.jain@xxxxxx)
Name
Company affiliation

       
Regards
Anand Jain
National Instruments





From:        <Chris.Gorringe@xxxxxxxxxxx>
To:        <STDS-SCC20-TD@xxxxxxxxxxxxxxxxx>, <stds-scc20-atml@xxxxxxxxxxxxxxxxx>
Cc:        <anand.jain@xxxxxx>
Date:        09/27/2011 09:58 AM
Subject:        RE: [SCC20TDS] SCC20 TII/TAD October Working Group Meeting Announcement
Sent by:        owner-stds-scc20-atml@xxxxxxxx





 
Further to the meeting announcement
The meetings rooms will be
Location - Meet in the lobby of Building C in the Mopac Campus.
Address - 11500 N. Mopac Expwy. Austin, TX  78759

 
If you are planning to attend please send the following information to Anand Jain (National Instruments) (see CC line above)
Name
Company affiliation
 
Regards
chris

 



 


Notice!
 
The SCC-20 TII/TAD Working Group Meeting
October 19th – 21st 2011

National Instrument Conference Rooms

Austin

Texas


The purpose is to advance the draft full use standards ready for submission as full standards for ballot inline with their current working candidate schemas.
 
Some breaking changes are being proposed for the following
·        Test Configuration (1671.4)
·        UUT Description (1671.3)
·        Test Description (1671.1)
 
Additional non-breaking changes are being incorporated for
Test Adaptor (1671.5)
Test Station (1671.6)
Instrument Description (1671.2)
 
In addition Instrument Description is removing the Synthetic Instrument Annexes (although the XML templates will remain as examples). These Synthetic Instruments are being grouped into there own new standard P1871.1 “Recommended Practice for Using IEEE 1671.2 Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments Such as Waveform Generators, Digitizers, External Oscillators, and Up & Down Converters”

Agenda

Wed 19th (start – pm 14:00)
ATML/Word Annotation Tool
UUT Description (1671.3)
Test Description (1671.1)
Thurs 20th
Test Description cont… (1671.1)
Test Configuration (1671.4)
Instrument Description (1671.2)
Test Station/Adaptor Description (1671.5/6)
Could we do this as amendment rather than full use?
Friday 21st (am)
User Guide (1671.0) & Web site
TII/TAD Management
TII Operations Manual
Active Members List
14:00 fin
 
 
Regards
Chris Gorringe
IEEE SCC20 TII Co-chair
 
 
Chris Gorringe BSc(Hons); MSc; MIEEE
Lead Technical Consultant
 
CASSIDIAN Test Engineering Services UK
23-25 Cobham Road, Ferndown Industrial Estate
Wimborne, Dorset, UK, BH21 7PE
Direct Line: +44 (0) 1202 868585
Mobile:       +44 (0) 7931 102453
USA DD:     (904) 685 1612
Email: chris.gorringe@xxxxxxxxxxx
www.cassidian.com
www.eads-tes.com
www.newWaveX.com
 
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Attachment: Campus Map.pdf
Description: Campus Map.pdf