Four instructors will take you through the standard from its introduction through real implementations and measurement techniques. The four participated in the development of the IEEE 1149.4 standard since its beginning and have always been members of the Tiger Team.

Adam CRON

Adam received his Bachelor of Science in Computer Engineering from Syracuse University in 1984. While working for Texas Instruments, Adam designed the first SCOPE Octals that were shown along with ASSET at the 1988 International Test Conference. After 8 years with TI, Mr. Cron went to work for Motorola, where he created boundary-scan supported test systems for the Envoy Personal Digital Assistant, and Functional test systems for Modem and LAN PC Cards.

Adam now works for Synopsys as a Staff Test Methodology Consultant and Manager working with customers on complex DFT issues for digital ICs. Mr. Cron chaired the IEEE 1149.4 Working Group from 1995 until its release, and now edits the Standard.

Adam chairs the Test Technology Technical Council's Test Technology Standards Group which oversees the development of test standards.

John McDERMID

John graduated from the University of Idaho in 1967 with a Bachelors degree in in Electrical Engineering (BSEE) and from the University of Alberta at Calgary in 1969 with a masters degree in Electrical Engineering (MSEE). He joined Hewlett Packard in 1969 as an analog design engineer in four and five digit voltmeter products. During his career with HP (now become Agilent), John has managed the development of voltmeters, analog in-circuit instrumentation, and in-circuit test systems.

With more than 30 years of experience in test and measurement, he has published several papers and articles in trade journals and received the 1994 ITC Best Paper Award. He is also an author of a chapter in "The 1149.4 Mixed-Signal Test Bus", edited by A.Osseiran (Kluwer, 1999). In 1996 he was part of a team that adapted analog in-circuit test instrumentation to make the first measurements of analog components using the Matsushita 1149.4 test chip.

More recently John has been involved in the development of practical algorithms to diagnose faulty components within a network using node voltage measurements. These algorithms, along with the automated program generation necessary to make their application straight forward, adapt well to the 1149.4 test bus and have been successfully deployed in commercial test systems.

Mani SOMA

Mani received the B.S.E.E. degree from California State University Fresno in 1975, the M.S. and Ph.D. degrees from Stanford University in 1977 and 1980 respectively. From 1980 to 1982, he was at the General Electric Research and Development Center (Schenectady, New York), working on design and test methodologies for VLSI integrated circuits and systems. He then joined the Department of Electrical Engineering at the University of Washington and has been a Professor since 1988. He was the Associate Director of the NSF Center for Design of Analog-Digital ICs from 1989 to 1994.

He founded and chaired the IEEE Mixed-Signal Test Bus Standard Working Group (1149.4) from 1991 to 1995, and remains active in standard development. He was Technical Program Chair for ISCAS 1995 and helped found the Pacific Northwest Test Workshop, which has become the annual IEEE International Mixed-Signal Testing Workshop. For these works, he received the IEEE Computer Society Meritorious Service Award (1995) and the IEEE Computer Society Golden Core Award (1997).

He is a Fellow of the IEEE for "contributions to mixed analog-digital system design-for-test." He has published papers in electronic design, test, and reliability; and has more recently focused on research in mixed analog-digital system design and test. He cooks, gardens, and teaches folk dancing in addition to electrical engineering.

Stephen SUNTER

Steve graduated from the University of Waterloo, with a Bachelor of Applied Science (BASc) in Electrical Engineering. He was a mixed-signal IC designer/manager for 12 years, at BNR/Nortel (1978-1990), and then a digital ASIC designer/manager for 2 years at GPT Australia (1990-1992). He returned to Nortel to be manager of mixed-signal testing for 3 years (1992-1995), and has been Director of mixed-signal and parametric test at LogicVision since 1996.

He has presented and/or published papers on over a dozen topics in mixed-signal IC design, standard cell library design, and DFT, as well as several multi-page articles in trade magazines. He is author of chapters in three books, including the chapter on 1149.4 in "Analog and Mixed-Signal Test", (Prentice Hall, 1998), the mixed-signal BIST chapter in "Design for At-speed Test, Diagnosis & Measurement", (Kluwer, 1999), and a chapter in "The 1149.4 Mixed-Signal Test Bus", (Kluwer, 1999).

He has been vice-chair of the P1149.4 Working Group since 1994, and recently designed and tested the world's first commercially available, general purpose, 1149.4-compliant IC.