To define, document, and promote the use of a standard mixed-signal test bus that can be used at the device, sub-assembly, and system levels to improve the controllability and observability of mixed-signal designs and to support mixed-signal built-in test structures in order to reduce test development time and costs, and improve test quality.

Meeting Minutes
 

Browsable	Text Only	ZIP File
October 1995	October 1995	October 1995
February 1996	February 1996	February 1996
May 1996	May 1996	May 1996
October 1996	October 1996	October 1996
March 1997	March 1997	March 1997
June 1997	June 1997	June 1997
November 1997	November 1997	November 1997
August 1998	August 1998	August 1998
October 1998	October 1998	October 1998
October 1999	October 1999	October 1999
May 2000	May 2000	May 2000
October 2000	October 2000	October 2000
November 2001	November 2001	November 2001
October 2003	October 2003
October 2004
January 18, 2005
April 5, 2005
February 22, 2005
May 23, 2005
October 20, 2005
November 7, 2005
February 22, 2006
March 22, 2006
April 19, 2006
May 15, 2006
June 14, 2006
July 19, 2006
September 25, 2006
October 26, 2006
November 14, 2006
November 28, 2006
December 5, 2006
December 18, 2006
January 9, 2007
January 23, 2007
March 28, 2007
April 24, 2007
May 22, 2007
June 26, 2007
July 23, 2007
August 30, 2007
September 6, 2007
October 16, 2007
October 25, 2007
January 29, 2008
February 26, 2008
March 11, 2008
March 28, 2008
April 8, 2008
April 16, 2008

ABSDL Effort

• ABSDL Standard Draft
• ABSDL Standard Draft with no markup notations
• ITC05 Bambang presentation slides
• ABSDL Symantic Checks
• Updates to Proposed ABSDL Syntax
• Proposed ABSDL Syntax
• Smaller ABSDL example
• Kitchen Sink ABSDL example
• Straw-dog example
• STA400 example
• Supporting package file

PAR

• PAR Draft
• PAR Draft Update
• PAR Draft Update with mark-ups

Debate Detail

• Basic Power Point Presentation
• Comments from Draft D25
• Daniela De Venuto paper "Dynamic Testing for Radiation Induced Failures in a Standard CMOS Submicron Technology Pixel Front-end"
• Ken Parker's Fax (12/18/96)
• Kozo Nuriya's Slides concerning path resistance (2/20/98)

• Steve Sunter's ITC Tutorial Slides
• IEEE (IMP) Demo Chip Documentation
• Matsushita Demo Chip Documentation
• Artemis (MAZeT) Chip Documentation

• Philips Evaluation Report
• INESC, Universidade do Porto Evaluation Report
• Industrial Institute of Electronics, Warsaw, Poland Evaluation Report
• Technische Universitat Dresden, Germany Evaluation Report
• Jozef Stefan Institute, Ljubljana, Slovenia Evaluation Report

• 1149.4 private ftp area (password-protected)

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